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1. 发明授权

US08650939B2 Surface texture measuring machine and a surface texture measuring method 有权
标题翻译：表面纹理测量机和表面纹理测量方法
公开(公告)号：US08650939B2
公开(公告)日：2014-02-18
申请号：US12900867
申请日：2010-10-08
申请人： Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
发明人： Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
IPC分类号： G01B5/20 , G01B11/24 , G01B21/04
CPC分类号： G01B11/005 , G01B5/008 , G01B11/245 , G01B21/047
摘要： A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.
摘要翻译：表面纹理测量机包括：台，具有触针的触点型检测器，图像探针，相对移动机构和控制器。控制器包括：中心位置计算单元，当图像探测器进入圆形凹部或物体的圆形凸部的圆形轮廓上的至少三个点的位置数据时，将输入的位置数据近似为圆形获得圆的中心位置; 以及触笔设置单元，其在计算中心位置之后，操作相对移动机构以将接触型检测器的触针定位在中心位置。

2. 发明授权

US08654351B2 Offset amount calibrating method and surface profile measuring machine 有权
标题翻译：偏移量校准方法和表面轮廓测量机
公开(公告)号：US08654351B2
公开(公告)日：2014-02-18
申请号：US12900788
申请日：2010-10-08
申请人： Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura , Sadaharu Arita , Kotaro Hirano
发明人： Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura , Sadaharu Arita , Kotaro Hirano
IPC分类号： G01B11/30
CPC分类号： G01B5/008 , G01B11/005 , G01B21/042
摘要： An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.
摘要翻译：提供了获得表面轮廓测量机的接触型检测器和图像探针之间的偏移量的偏移量校准方法。该方法包括：在舞台上设置具有具有水平差的格子图案的表面的校准夹具; 通过接触型检测器测量校准夹具的格子图案，以获得格子图案的第一参考位置; 通过图像探测器捕获校准夹具的格子图案的图像，以获得格子图案的第二参考位置; 以及从所述第一和第二参考位置之间的差获得所述偏移量。

3. 发明授权

US08578284B2 Hardness testing device with a user interface for setting test locations 有权
标题翻译：具有用于设置测试位置的用户界面的硬度测试设备
公开(公告)号：US08578284B2
公开(公告)日：2013-11-05
申请号：US13238022
申请日：2011-09-21
申请人： Fumihiro Takemura , Kozo Ariga
发明人： Fumihiro Takemura , Kozo Ariga
IPC分类号： G01N3/48 , G06F3/048 , G01N3/42 , G06F9/44
CPC分类号： G01N3/42 , G01N2203/0206 , G01N2203/0286 , G06F9/451
摘要： A hardness tester includes a monitor capable of displaying a main screen and an assistant screen; a first test location setter setting an indentation formation location on a test specimen for an initial test; and a second test location setter setting an indentation formation location on the test specimen for a retest. The second test location setter judges whether a new indentation formation location is suitable for a test based on a surface image of the test specimen and a setting condition obtained during the initial test, and, in a case where it is judged that the new indentation formation location is unsuitable for a test, sets again a coordinate point different from the coordinate point of the new indentation formation location as another new indentation formation location.
摘要翻译：硬度计包括能够显示主屏幕和辅助屏幕的监视器; 第一测试位置设定器，在初始测试的试样上设置压痕形成位置; 以及第二测试位置设定器，在测试样本上设置压痕形成位置以进行重新测试。第二测试位置设定器基于测试样本的表面图像和初始测试期间获得的设置条件来判断新的压痕形成位置是否适合于测试，并且在判断新的压痕形成位置不适合于测试，再次将与新压痕形成位置的坐标点不同的坐标点设置为另一个新的压痕形成位置。

4. 发明授权

US08566735B2 Hardness tester with a user interface for setting test locations 有权
标题翻译：具有用于设置测试位置的用户界面的硬度计
公开(公告)号：US08566735B2
公开(公告)日：2013-10-22
申请号：US13238014
申请日：2011-09-21
申请人： Fumihiro Takemura , Kozo Ariga
发明人： Fumihiro Takemura , Kozo Ariga
IPC分类号： G01N3/48 , G06F3/048 , G01N3/42 , G06F9/44
CPC分类号： G01N3/42 , G01N2203/0078 , G01N2203/0286 , G06F9/451
摘要： A hardness tester includes a monitor capable of displaying a main screen and assistant screen. A first test location setter sets a coordinate point of an indentation formation location, and stores a setting condition of the set coordinate point and the surface image of a first test specimen. A second test location setter displays the surface image of the first test specimen in the assistant screen when a surface image of a second test specimen is displayed on the main screen, and, when a reference coordinate is set on the surface image of the second test specimen, determines a coordinate point of an indentation formation location based on the set reference coordinate and the setting condition of the coordinate point stored by the first test location setter.
摘要翻译：硬度计包括能够显示主屏幕和辅助屏幕的监视器。第一测试位置设定器设置压痕形成位置的坐标点，并存储第一测试样本的设定坐标点和表面图像的设置条件。第二测试位置设定器在主屏幕上显示第二测试样本的表面图像时，在辅助屏幕中显示第一测试样本的表面图像，并且当在第二测试的表面图像上设置参考坐标时试样根据设定的基准坐标和由第一测试位置设定器存储的坐标点的设定条件，确定压痕形成位置的坐标点。

5. 发明授权

US06671973B2 Surface texture measuring instrument and a method of adjusting an attitude of a work for the same 失效
标题翻译：表面纹理测量仪器和调整工作态度的方法相同
公开(公告)号：US06671973B2
公开(公告)日：2004-01-06
申请号：US10142204
申请日：2002-05-10
申请人： Fumihiro Takemura , Minoru Katayama
发明人： Fumihiro Takemura , Minoru Katayama
IPC分类号： G01B314
CPC分类号： G01B7/28 , G01B7/34
摘要： A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.
摘要翻译：在用于测量具有特征区域的工件的表面纹理测量仪中调整工件的相对姿态的方法包括：将检测器定位在Y轴上之后沿着X轴方向进行特征区域的测量的测量步骤方向和X轴方向，确定步骤，重复在改变X轴方向上的位置时执行的测量，以及基于相对姿态校正量来调整作业姿态的步骤。因此，工件中的特征区域的方向被调整为与Y轴平行。

6. 发明授权

US07142313B2 Interaxis angle correction method 有权
公开(公告)号：US07142313B2
公开(公告)日：2006-11-28
申请号：US11370345
申请日：2006-03-08
申请人： Takao Ishitoya , Fumihiro Takemura
发明人： Takao Ishitoya , Fumihiro Takemura
IPC分类号： G01B11/14 , G01B5/00 , C01B21/00
CPC分类号： G01B21/045
摘要： An interaxis-angle correction method comprising: a reference sphere measurement step of scanning, with the sensor, a reference sphere located on the table, in the measurement-axis direction at a translation-axis-direction position on the reference sphere to acquire measurement-axis-direction contour information, and performing the scanning at a plurality of different translation-axis-direction positions on the same reference sphere, with the table being linearly translated; a peak detection step of detecting a peak point in the measurement-axis-direction contour information, and performing the detection for each set of measurement-axis-direction contour information; an error information acquisition step of obtaining information related to the inclination of an actual straight line based on each peak point with respect to an ideal straight line; a correction information acquisition step of obtaining correction information for correcting a measurement error related to the position in the measurement-axis direction, caused by the inclination of the actual straight line; and a correction step.

7. 发明申请

US20060209296A1 Interaxis angle correction method 有权
标题翻译： Interaxis角度校正方法
公开(公告)号：US20060209296A1
公开(公告)日：2006-09-21
申请号：US11370345
申请日：2006-03-08
申请人： Takao Ishitoya , Fumihiro Takemura
发明人： Takao Ishitoya , Fumihiro Takemura
IPC分类号： G01B11/26 , G01C1/00
CPC分类号： G01B21/045
摘要： An interaxis-angle correction method comprising: a reference sphere measurement step of scanning, with the sensor, a reference sphere located on the table, in the measurement-axis direction at a translation-axis-direction position on the reference sphere to acquire measurement-axis-direction contour information, and performing the scanning at a plurality of different translation-axis-direction positions on the same reference sphere, with the table being linearly translated; a peak detection step of detecting a peak point in the measurement-axis-direction contour information, and performing the detection for each set of measurement-axis-direction contour information; an error information acquisition step of obtaining information related to the inclination of an actual straight line based on each peak point with respect to an ideal straight line; a correction information acquisition step of obtaining correction information for correcting a measurement error related to the position in the measurement-axis direction, caused by the inclination of the actual straight line; and a correction step.
摘要翻译：一种间轴角校正方法，包括：基准球测量步骤，利用所述传感器，在所述参考球体上的平移轴方向位置处，在测量轴方向上扫描位于所述工作台上的参考球，轴方向轮廓信息，并且在同一基准球上的多个不同的平移轴方向位置上执行扫描，该表被线性平移; 峰值检测步骤，检测测量轴方向轮廓信息中的峰值点，并对每组测量轴方向轮廓信息进行检测; 误差信息获取步骤，基于相对于理想直线的每个峰值点获得与实际直线的倾斜有关的信息; 校正信息获取步骤，用于获得用于校正与实际直线的倾斜度相关的与测量轴方向上的位置相关的测量误差的校正信息; 和校正步骤。

8. 发明授权

US07096149B2 Method for determining coordinate system for device under measurement, and coordinate measuring apparatus 有权
标题翻译：用于确定测量装置坐标系的方法和坐标测量装置
公开(公告)号：US07096149B2
公开(公告)日：2006-08-22
申请号：US11037537
申请日：2005-01-18
申请人： Soichi Kadowaki , Fumihiro Takemura , Naoji Horiuchi
发明人： Soichi Kadowaki , Fumihiro Takemura , Naoji Horiuchi
IPC分类号： G01C9/00 , G01C17/00
CPC分类号： G01B21/042 , G01B5/008
摘要： Method for determining a coordinate system including a preliminary measurement step in which a detector of a coordinate measuring apparatus is used to scan first measurement areas of the device to obtain position coordinate information and the detector is used to scan a second measurement area that is not on a straight line connecting the first measurement areas to obtain position coordinate information; a feature-point detection step of obtaining the position of a feature point in each of the measurement areas according to a result of measurement; a reference-line determination step of obtaining a first reference line according to the position of each feature point in the first measurement areas, and obtaining a second reference line perpendicular to the first reference line and passing through a feature point located in the second measurement area; an origin-setting step; and an axis setting step.
摘要翻译：用于确定包括初步测量步骤的坐标系的方法，其中使用坐标测量装置的检测器来扫描装置的第一测量区域以获得位置坐标信息，并且所述检测器用于扫描不在的第二测量区域连接第一测量区域以获得位置坐标信息的直线; 特征点检测步骤，根据测量结果获得每个测量区域中的特征点的位置; 参考线确定步骤，根据第一测量区域中的每个特征点的位置获得第一参考线，并获得垂直于第一参考线并穿过位于第二测量区域中的特征点的第二参考线 ; 原点设定步骤; 和轴设定步骤。

9. 发明申请

US20050155242A1 Method for determining coordinate system for device under measurement, and coordinate measuring apparatus 有权
标题翻译：用于确定测量装置坐标系的方法和坐标测量装置
公开(公告)号：US20050155242A1
公开(公告)日：2005-07-21
申请号：US11037537
申请日：2005-01-18
申请人： Soichi Kadowaki , Fumihiro Takemura , Naoji Horiuchi
发明人： Soichi Kadowaki , Fumihiro Takemura , Naoji Horiuchi
IPC分类号： G01B21/00 , G01B5/008 , G01B21/04 , G01B5/004
CPC分类号： G01B21/042 , G01B5/008
摘要： A method for determining a coordinate system for a device under measurement comprises: a preliminary measurement step in which a detector of a coordinate measuring apparatus is used to scan first measurement areas which include two or more feature portions of the device under measurement to obtain position coordinate information and the detector is used to scan a second measurement area which includes one or more feature portions that are not on a straight line connecting the first measurement areas to obtain position coordinate information; a feature-point detection step of obtaining the position of a feature point in each of the measurement areas according to a result of measurement; a reference-line determination step of obtaining a first reference line according to the position of each feature point in the first measurement areas, and of obtaining a second reference line perpendicular to the first reference line and passing through a feature point located in the second measurement area; an origin-setting step of positioning the origin of the coordinate system for the device under measurement according to the position of the intersection of the first reference line and the second reference line; and an axis setting step of determining the directions of axes of the coordinate system for the device under measurement according to the directions of the reference lines.
摘要翻译：一种用于确定测量装置的坐标系的方法，包括：初步测量步骤，其中使用坐标测量装置的检测器扫描包括被测设备的两个或多个特征部分的第一测量区域以获得位置坐标信息和检测器用于扫描包括不在连接第一测量区域的直线上的一个或多个特征部分以获得位置坐标信息的第二测量区域; 特征点检测步骤，根据测量结果获得每个测量区域中的特征点的位置; 参考线确定步骤，根据第一测量区域中的每个特征点的位置获得第一参考线，以及获得垂直于第一参考线并穿过位于第二测量中的特征点的第二参考线区; 原点设置步骤，根据第一参考线和第二参考线的交点的位置来定位待测设备的坐标系的原点; 以及轴设定步骤，根据参考线的方向确定被测设备的坐标系的轴方向。

10. 发明授权

US07277818B2 Method and program for leveling aspherical workpieces 失效
标题翻译：调整非球面工件的方法和程序
公开(公告)号：US07277818B2
公开(公告)日：2007-10-02
申请号：US11368753
申请日：2006-03-06
申请人： Yukihiro Sakata , Fumihiro Takemura
发明人： Yukihiro Sakata , Fumihiro Takemura
IPC分类号： G01C9/00 , G01B5/00
CPC分类号： G01B5/20 , G01M11/025
摘要： The invention provides an aspherical workpiece leveling method for leveling an aspherical workpiece mounted on a tilt correction table. The method includes three-dimensionally measuring a surface of the aspherical workpiece containing an extreme value; deriving a secondary curved surface from the obtained three-dimensionally measured values to obtain an extreme value of the secondary curved surface as a temporary extreme value; obtaining three-dimensionally measured values at three or more points from the surround about the obtained temporary extreme value; obtaining a plane defined by the obtained three-dimensionally measured values at three or more points; and adjusting the tilt correction table for leveling the obtained plane.
摘要翻译：本发明提供了一种用于使安装在倾斜校正台上的非球面工件调平的非球面工件调平方法。该方法包括三维地测量包含极值的非球面工件的表面; 从获得的三维测量值导出次曲面以获得次曲面的极值作为临时极值; 从围绕所获得的临时极值的围绕三个或更多个点获得三维测量值; 在三点或更多点获得由所获得的三维测量值定义的平面; 并且调整倾斜校正表以使获得的平面平整。

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