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1. 发明专利

JP2009294115A Three-dimensional measurement display method 审中-公开
标题翻译：三维测量显示方法
公开(公告)号：JP2009294115A
公开(公告)日：2009-12-17
申请号：JP2008148665
申请日：2008-06-05
申请人： Shigeki Kobayashi , Teruhisa Yotsuya , 四ッ谷輝久 , 茂樹小林
发明人： YOTSUYA TERUHISA , KOBAYASHI SHIGEKI
IPC分类号： G01B11/24
CPC分类号： G01B11/0608
摘要： PROBLEM TO BE SOLVED: To achieve three-dimensional image measurement and three-dimensional image display of a solid body.
SOLUTION: Concerning an object illuminated by an illumination device equipped with a plurality of troidal light sources for emitting each original hue light, wherein a troidal center of each light source is placed on an optical axis elongation of a camera, and a troidal plane of each light source is arranged orthogonally to the elongation, a tilt angle of a surface patch (surface small domain) is calculated from an RGB pixel value of an object image imaged in the vertically looking-down state by a color camera and an incident tilt angle of each hue light, and each surface patch height calculated from the tilt angle of each surface patch aligned along a straight line crossing a stereoscopic domain from a boundary between a plane domain and a stereoscopic domain of the image is added successively, and then each surface patch height calculated from the tilt angle of each surface patch aligned along a straight line orthogonal to the same straight line is added successively. Hereby, an absolute height of a solid body each surface from the plane domain is calculated, and three-dimensional data of the whole object are generated from the measured absolute height of the solid body surface whole surface patch, and three-dimensional measurement and display of the solid body become possible.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：实现固体的三维图像测量和三维图像显示。解决方案：关于装备有用于发射每个原始色调光的多个激光光源的照明装置照明的物体，其中每个光源的细分中心被放置在照相机的光轴延伸上，并且具有Troidal 每个光源的平面垂直于伸长，通过彩色照相机和事件从垂直仰视状态成像的物体图像的RGB像素值计算出表面贴片（表面小区域）的倾斜角每个色调光的倾斜角度和从沿图像的平面域和立体域之间的边界穿过立体域的直线对齐的每个表面贴片的倾斜角度计算的每个表面贴片高度依次被添加，然后从与同一直线正交的直线排列的每个表面贴片的倾斜角计算出的每个表面贴片高度依次被添加。由此，计算从平面域各自表面的固体的绝对高度，并且从测量的实体表面整个表面贴片的绝对高度产生整个对象的三维数据，以及三维测量和显示的固体变得可能。版权所有（C）2010，JPO＆INPIT

2. 发明专利

JP2009168453A Inspection device 审中-公开
标题翻译：检查装置
公开(公告)号：JP2009168453A
公开(公告)日：2009-07-30
申请号：JP2008003359
申请日：2008-01-10
申请人： Shigeki Kobayashi , Teruhisa Yotsuya , 四ッ谷輝久 , 茂樹小林
发明人： KOBAYASHI SHIGEKI , YOTSUYA TERUHISA
IPC分类号： G01B11/24 , G01N21/956
摘要： PROBLEM TO BE SOLVED: To obtain three-dimensional image having no hidden surface (occlusion) in three-dimensional automatic inspection of solder paste printing.
SOLUTION: Automatic three-dimensional image inspection of solder paste printing quality having no hidden surface (occlusion) is performed by constituting three-dimensional imaging geometrical-optical arrangement of a binocular vision system wherein the first color image sensor camera and the second color image sensor camera are faced each other over a substrate surface, for imaging the same domain on the substrate by looking down with an oblique optical axis (viewing angle); a third hue light source for illuminating the substrate from a right upper direction; a first hue light source placed on a lower position than the first camera, for illuminating the substrate from the same direction as the first camera; and a second hue light source placed on a lower position than the second camera, for illuminating the substrate from the same direction as the second camera.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：在焊膏印刷的三维自动检查中获得没有隐藏表面（遮挡）的三维图像。解决方案：通过构建双目视觉系统的三维成像几何光学布置来执行没有隐藏表面（遮挡）的焊膏印刷质量的自动三维图像检查，其中第一彩色图像传感器相机和第二彩色图像传感器相机彩色图像传感器相机在基板表面上彼此面对，用于通过用倾斜光轴（视角）向下仰视来对基板上的相同畴进行成像; 用于从右上方照射基板的第三色调光源; 第一色调光源放置在比所述第一照相机更低的位置处，用于从与所述第一照相机相同的方向照射所述衬底; 以及放置在比第二相机低的位置的第二色调光源，用于从与第二相机相同的方向照射基板。版权所有（C）2009，JPO＆INPIT

3. 发明授权

US4953100A Apparatus for inspecting packaged electronic device 失效
标题翻译：用于检查包装电子装置的装置
公开(公告)号：US4953100A
公开(公告)日：1990-08-28
申请号：US104149
申请日：1987-10-05
申请人： Teruhisa Yotsuya
发明人： Teruhisa Yotsuya
IPC分类号： G01N21/88 , G01N21/956 , G06T7/00
CPC分类号： G06T7/004 , G01N21/95684 , G06T7/0002 , G06T2207/30148
摘要： A component-mounted printed circuit board inspecting apparatus comprises an imaging device for picking up images of printed circuit board. Land images are extracted from the image of a bare printed circuit board and that of a component-mounted printed circuit board. On the basis of the shapes of the land extracted from the bare printed circuit board and those of the component-mounted printed circuit board, the positional relationship between a comonent mounted on the printed circuit board and the land thereon is determined. This positional relationship is utilized to decide if the component is mounted properly on the printed circuit board.
摘要翻译：组件安装的印刷电路板检查装置包括用于拾取印刷电路板的图像的成像装置。从裸印刷电路板的图像和部件安装的印刷电路板的图像中提取土地图像。基于从裸机印刷电路板提取的地面和组件安装印刷电路板的形状的形状，确定安装在印刷电路板上的共振器与其上的焊盘之间的位置关系。该位置关系用于确定组件是否正确安装在印刷电路板上。

4. 发明授权

US07869644B2 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US07869644B2
公开(公告)日：2011-01-11
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00 , G06K9/48 , G06K9/36 , H04N7/18 , B23P19/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

5. 发明授权

US07680320B2 Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data 失效
标题翻译：图像处理方法，基板检查方法，基板检查装置以及生成基板检查数据的方法
公开(公告)号：US07680320B2
公开(公告)日：2010-03-16
申请号：US11317415
申请日：2005-12-22
申请人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30152
摘要： A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.
摘要翻译：通过从图像中提取目标对象并执行指定的图像处理来处理与多个n个不同色调相对应的颜色数据的组合的彩色图像。在没有目标对象的情况下获得参考图像。考虑对应于不同色调的指定小于n的颜色数据，并且所考虑的颜色数据的强度的程度与对应于包含目标对象的目标图像的每个像素之间的n个不同色调的颜色数据的组合的差异，以及提取参考图像上的对应像素。提取提取的差异大于指定阈值并且在指定方向上的像素。由提取的像素形成的图像区域被识别为目标对象。

6. 发明申请

US20060018531A1 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US20060018531A1
公开(公告)日：2006-01-26
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

7. 发明授权

US07512260B2 Substrate inspection method and apparatus 失效
标题翻译：基板检查方法和装置
公开(公告)号：US07512260B2
公开(公告)日：2009-03-31
申请号：US11218920
申请日：2005-09-02
申请人： Kiyoshi Murakami , Yasunori Asano , Takashi Kinoshita , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Yasunori Asano , Takashi Kinoshita , Teruhisa Yotsuya
IPC分类号： G06K9/00 , G01R31/26
CPC分类号： G06T7/0008 , G06T7/001 , G06T7/74 , G06T2207/30141
摘要： Preparation steps are taken before a substrate with components is inspected and a whole image of a standard substrate is prepared preliminarily and inspection areas are determined for target portions to be inspected on this whole image. At the time of the inspection, a camera is positioned corresponding to a target portion to obtain a target image and an area corresponding to the target image is extracted from the whole image and displacement values of this area are calculated relative to the target image. The setting position of the inspection area is corrected by the calculated displacement values and an inspection area is set on the target image based on the corrected coordinates.
摘要翻译：在检查具有部件的基板之前进行准备步骤，并且准备准备标准基板的整体图像，并且在该整个图像上确定要检查的目标部分的检查区域。在检查时，对应于目标部分的相机定位以获得目标图像，并且从整个图像中提取与目标图像相对应的区域，并且相对于目标图像计算该区域的位移值。通过计算的位移值来校正检查区域的设置位置，并且基于校正的坐标将目标图像设置检查区域。

8. 发明授权

US07505149B2 Apparatus for surface inspection and method and apparatus for inspecting substrate 失效
标题翻译：表面检查装置及检查基板的方法和装置
公开(公告)号：US07505149B2
公开(公告)日：2009-03-17
申请号：US11056739
申请日：2005-02-11
申请人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N21/88
CPC分类号： G01R31/309 , G01N21/95684 , G06T7/0004 , G06T7/90 , G06T2207/10024 , G06T2207/30152
摘要： A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.
摘要翻译：目标物体通过在不同仰角的红色，绿色和蓝色光束照射时，从上方拍摄其图像，检查其表面状态。在图像上设置检查区域，并且根据光源的布置在颜色相位中出现改变的图像上提取方向，并将该提取方向与预先登记的标准方向进行比较，以判断表面状况从这个比较的结果。

9. 发明授权

US07394084B2 Method of generating image and illumination device for inspecting substrate 失效
标题翻译：生成用于检查基板的图像和照明装置的方法
公开(公告)号：US07394084B2
公开(公告)日：2008-07-01
申请号：US11157749
申请日：2005-06-20
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B11/24
CPC分类号： G01N21/95684 , G01N21/8806 , G01R31/309
摘要： For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.
摘要翻译：为了生成用于检查基板的图像，在该基板的上方设置有朝向下方的光轴的相机，并且将多个多色发光部件设置在相机的光轴周围，使其处于规定的角度相对于基板上的目标区域的范围。操作摄像机以产生目标区域的图像以进行检查，同时控制这些发光构件的开启状态，使得照亮该目标区域的光的颜色和角度根据指定的目的类型而变化这次检查。

10. 发明申请

US20060140471A1 Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data 失效
标题翻译：图像处理方法，基板检查方法，基板检查装置以及生成基板检查数据的方法
公开(公告)号：US20060140471A1
公开(公告)日：2006-06-29
申请号：US11317415
申请日：2005-12-22
申请人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30152
摘要： A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.
摘要翻译：通过从图像中提取目标对象并执行指定的图像处理来处理与多个n个不同色调相对应的颜色数据的组合的彩色图像。在没有目标对象的情况下获得参考图像。考虑对应于不同色调的指定小于n的颜色数据，并且所考虑的颜色数据的强度的程度与对应于包含目标对象的目标图像的每个像素之间的n个不同色调的颜色数据的组合的差异，以及提取参考图像上的对应像素。提取提取的差异大于指定阈值并且在指定方向上的像素。由提取的像素形成的图像区域被识别为目标对象。

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