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1. 发明授权

US07869644B2 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US07869644B2
公开(公告)日：2011-01-11
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00 , G06K9/48 , G06K9/36 , H04N7/18 , B23P19/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

2. 发明申请

US20060018531A1 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US20060018531A1
公开(公告)日：2006-01-26
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

3. 发明授权

US07505149B2 Apparatus for surface inspection and method and apparatus for inspecting substrate 失效
标题翻译：表面检查装置及检查基板的方法和装置
公开(公告)号：US07505149B2
公开(公告)日：2009-03-17
申请号：US11056739
申请日：2005-02-11
申请人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N21/88
CPC分类号： G01R31/309 , G01N21/95684 , G06T7/0004 , G06T7/90 , G06T2207/10024 , G06T2207/30152
摘要： A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.
摘要翻译：目标物体通过在不同仰角的红色，绿色和蓝色光束照射时，从上方拍摄其图像，检查其表面状态。在图像上设置检查区域，并且根据光源的布置在颜色相位中出现改变的图像上提取方向，并将该提取方向与预先登记的标准方向进行比较，以判断表面状况从这个比较的结果。

4. 发明授权

US07394084B2 Method of generating image and illumination device for inspecting substrate 失效
标题翻译：生成用于检查基板的图像和照明装置的方法
公开(公告)号：US07394084B2
公开(公告)日：2008-07-01
申请号：US11157749
申请日：2005-06-20
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B11/24
CPC分类号： G01N21/95684 , G01N21/8806 , G01R31/309
摘要： For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.
摘要翻译：为了生成用于检查基板的图像，在该基板的上方设置有朝向下方的光轴的相机，并且将多个多色发光部件设置在相机的光轴周围，使其处于规定的角度相对于基板上的目标区域的范围。操作摄像机以产生目标区域的图像以进行检查，同时控制这些发光构件的开启状态，使得照亮该目标区域的光的颜色和角度根据指定的目的类型而变化这次检查。

5. 发明授权

US07310406B2 Inspection method and system for and method of producing component mounting substrate 失效
标题翻译：组件安装基板的检查方法和系统及其制造方法
公开(公告)号：US07310406B2
公开(公告)日：2007-12-18
申请号：US11168015
申请日：2005-06-27
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N23/04 , G01N21/88 , G01N21/956
CPC分类号： G01N23/04
摘要： On a production line for component mounting substrate, mutually communicating inspection apparatus are each provided to a different one of production processes that are carried out sequentially such as the solder printing, component mounting and soldering processes. Each inspection apparatus can generate an X-ray transmission image of the substrate. Each inspection apparatus on the downstream side inputs an image from another inspection apparatus on the upstream side and generates a differential image of the inputted image and an X-ray transmission image of the same substrate generated by itself after the production process associated with itself is carried out. The differential image thus generated is used for inspecting the substrate such that the effect of the associated production process can be more accurately inspected.
摘要翻译：在用于部件安装基板的生产线上，相互连通的检查装置分别设置在与焊接印刷，部件安装和焊接工序相关的不同的制造工序中。每个检查装置可以产生基板的X射线透射图像。下游侧的检查装置在上游侧输入来自另一检查装置的图像，并生成输入图像的差分图像，并且在与其自身相关联的制作处理之后自身产生的相同基板的X射线透射图像被携带出来由此生成的差分图像用于检查基板，从而可以更精确地检查相关生产过程的效果。

6. 发明申请

US20050209822A1 Inspection method and system and production method of mounted substrate 审中-公开
标题翻译：安装基板的检查方法和系统及生产方法
公开(公告)号：US20050209822A1
公开(公告)日：2005-09-22
申请号：US11061771
申请日：2005-02-17
申请人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B11/00 , G01N21/956 , H05K3/34 , H05K13/00 , H05K13/08 , G06F19/00
CPC分类号： H05K13/083 , H05K13/0817
摘要： Substrates with components mounted thereon are produced by a plurality of sequentially performed production steps. Inspection apparatus are provided, each associated with different one of these production steps including the last step. These inspection apparatus communicate among themselves and each use an image of a target substrate to be inspected taken after or data obtained in an earlier executed production step.
摘要翻译：具有安装在其上的部件的基板通过多个顺序执行的制造步骤来制造。提供检查装置，每个与包括最后步骤的这些生产步骤中的不同的一个相关联。这些检查装置彼此之间进行通信，并且各自使用要在之后拍摄的被检查对象基板的图像或在早期执行的制作步骤中获得的数据。

7. 发明申请

US20050190361A1 Apparatus for surface inspection and method and apparatus for inspecting substrate 失效
标题翻译：表面检查装置及检查基板的方法和装置
公开(公告)号：US20050190361A1
公开(公告)日：2005-09-01
申请号：US11056739
申请日：2005-02-11
申请人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B11/24 , G01N21/00 , G01N21/88 , G01N21/956 , G01R31/309 , H05K3/34
CPC分类号： G01R31/309 , G01N21/95684 , G06T7/0004 , G06T7/90 , G06T2207/10024 , G06T2207/30152
摘要： A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.
摘要翻译：目标物体通过在不同仰角的红色，绿色和蓝色光束照射时，从上方拍摄其图像，检查其表面状态。在图像上设置检查区域，并且根据光源的布置在颜色相位中出现改变的图像上提取方向，并将该提取方向与预先登记的标准方向进行比较，以判断表面状况从这个比较的结果。

8. 发明申请

US20060002510A1 Inspection method and system for and method of producing component mounting substrate 失效
标题翻译：组件安装基板的检查方法和系统及其制造方法
公开(公告)号：US20060002510A1
公开(公告)日：2006-01-05
申请号：US11168015
申请日：2005-06-27
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B15/06 , G01N23/02
CPC分类号： G01N23/04
摘要： On a production line for component mounting substrate, mutually communicating inspection apparatus are each provided to a different one of production processes that are carried out sequentially such as the solder printing, component mounting and soldering processes. Each inspection apparatus can generate an X-ray transmission image of the substrate. Each inspection apparatus on the downstream side inputs an image from another inspection apparatus on the upstream side and generates a differential image of the inputted image and an X-ray transmission image of the same substrate generated by itself after the production process associated with itself is carried out. The differential image thus generated is used for inspecting the substrate such that the effect of the associated production process can be more accurately inspected.
摘要翻译：在用于部件安装基板的生产线上，相互连通的检查装置分别设置在与焊接印刷，部件安装和焊接工序相关的不同的制造工序中。每个检查装置可以产生基板的X射线透射图像。下游侧的检查装置在上游侧输入来自另一检查装置的图像，并生成输入图像的差分图像，并且在与其自身相关联的制作处理之后自身产生的相同基板的X射线透射图像被携带出来由此生成的差分图像用于检查基板，从而可以更精确地检查相关生产过程的效果。

9. 发明申请

US20060000989A1 Method of generating image and illumination device for inspecting substrate 失效
标题翻译：生成用于检查基板的图像和照明装置的方法
公开(公告)号：US20060000989A1
公开(公告)日：2006-01-05
申请号：US11157749
申请日：2005-06-20
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N21/86
CPC分类号： G01N21/95684 , G01N21/8806 , G01R31/309
摘要： For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.
摘要翻译：为了生成用于检查基板的图像，在该基板的上方设置有朝向下方的光轴的相机，并且将多个多色发光部件设置在相机的光轴周围，使其处于规定的角度相对于基板上的目标区域的范围。操作摄像机以产生目标区域的图像以进行检查，同时控制这些发光构件的开启状态，使得照亮该目标区域的光的颜色和角度根据指定的目的类型而变化这次检查。

10. 发明申请

US20070165254A1 Measuring method and apparatus using color images 审中-公开
标题翻译：使用彩色图像的测量方法和装置
公开(公告)号：US20070165254A1
公开(公告)日：2007-07-19
申请号：US11651953
申请日：2007-01-09
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami
IPC分类号： G03F3/08
CPC分类号： G01J3/50 , G01J3/524
摘要： A method for correcting a color captured by a detector using a light source includes determining target reference color values corresponding to a plurality of groups each of which includes at least three reference colors; determining detected reference color values corresponding to the plurality of groups by capturing the emitted reference colors using the detector; calculating a plurality of sets of correction factors; and correcting the detected color value or the target color value to generate a corrected color value based on one of the sets of the correction factors.
摘要翻译：用于校正使用光源的检测器捕获的颜色的方法包括确定与多个组对应的目标参考色值，每个组包括至少三个参考色; 通过使用所述检测器捕获所发射的参考颜色来确定与所述多个组对应的检测到的参考颜色值; 计算多组校正因子; 以及校正所检测的颜色值或目标色彩值以基于所述校正因子组中的一组生成校正的颜色值。

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