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    • 1. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20110208904A1
    • 2011-08-25
    • US13099720
    • 2011-05-03
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • G06F12/00
    • G11C7/04G11C16/0441G11C16/10G11C16/28
    • The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
    • 半导体器件包括非易失性存储器,具有包含1比特双胞格的存储器阵列,每个存储器阵列由电可重写的第一和第二存储器件组成,第一和第二存储器件根据其阈值电压的差异保持二进制数据,并且具有不同的 保留特性取决于其二进制数据的差异; 用于差分放大从被选择读取的双胞胎的第一和第二存储装置输出的互补数据的读取电路,以及判断存储在双胞胎中的信息; 和控制电路。 布置构成双胞胎的两个存储单元以保存不同的数据。 因此,即使一个存储单元的保持性能劣化,也能够维持由两个存储单元保持的数据之间的差异。 因此,这种差异的差分放大使得能够获得正确的存储信息。 因此,提高了电可重写非易失性存储单元的保持性能。
    • 3. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20080089146A1
    • 2008-04-17
    • US11869144
    • 2007-10-09
    • Masamichi FUJITOMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • Masamichi FUJITOMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • G11C7/00
    • G11C7/04G11C16/0441G11C16/10G11C16/28
    • The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
    • 半导体器件包括非易失性存储器,具有包含1比特双胞格的存储器阵列,每个存储器阵列由电可重写的第一和第二存储器件组成,第一和第二存储器件根据其阈值电压的差异保持二进制数据,并且具有不同的 保留特性取决于其二进制数据的差异; 用于差分放大从被选择读取的双胞胎的第一和第二存储装置输出的互补数据的读取电路,以及判断存储在双胞胎中的信息; 和控制电路。 布置构成双胞胎的两个存储单元以保存不同的数据。 因此,即使一个存储单元的保持性能劣化,也能够维持由两个存储单元保持的数据之间的差异。 因此,这种差异的差分放大使得能够获得正确的存储信息。 因此,提高了电可重写非易失性存储单元的保持性能。
    • 4. 发明授权
    • Bus control device altering drive capability according to condition
    • 总线控制装置根据条件改变驱动能力
    • US07080185B2
    • 2006-07-18
    • US10295916
    • 2002-11-18
    • Takashi Kurafuji
    • Takashi Kurafuji
    • G06F13/14H03F3/00H01L25/00H03K19/0175
    • G06F1/3203G06F1/3253Y02D10/151
    • An access destination determining section determines whether an access is directed to region 1 or region 2. A region 1 drive capability register and a region 2 drive capability register set drive capabilities of output buffers when accesses to region 1 and region 2 generate, respectively. For example, if “1” is set to region 1 drive capability register, when an access to region 1 generates, a Buf2 output enable signal is output at high level to enable outputs of Buf2s. Therefore, a drive capability of a bus can be altered according to a region to which an access is made by a CPU or the like, thereby enabling prevention of unnecessary power consumption and generation of noise.
    • 访问目的地确定部分确定访问是指向区域1还是区域2。 区域1驱动能力寄存器和区域2驱动能力寄存器分别设置对区域1和区域2的访问时输出缓冲器的驱动能力。 例如,如果将“1”设置为区域1驱动能力寄存器,当访问区域1产生时,Buf 2输出使能信号以高电平输出以使能Buf 2s的输出。 因此,可以根据由CPU等进行访问的区域来改变总线的驱动能力,从而能够防止不必要的电力消耗和噪声的产生。
    • 5. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08144518B2
    • 2012-03-27
    • US13099720
    • 2011-05-03
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • G11C16/00
    • G11C7/04G11C16/0441G11C16/10G11C16/28
    • The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
    • 半导体器件包括非易失性存储器,具有包含1比特双胞胞的存储器阵列,每个存储器阵列由电可重写的第一和第二存储器件组成,第一和第二存储器件根据其阈值电压的差异保持二进制数据,并具有不同的 保留特性取决于其二进制数据的差异; 用于差分放大从被选择读取的双胞胎的第一和第二存储装置输出的互补数据的读取电路,以及判断存储在双胞胎中的信息; 和控制电路。 布置构成双胞胎的两个存储单元以保存不同的数据。 因此,即使一个存储单元的保持性能劣化,也能够维持由两个存储单元保持的数据之间的差异。 因此,这种差异的差分放大使得能够获得正确的存储信息。 因此,提高了电可重写非易失性存储单元的保持性能。
    • 6. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07646642B2
    • 2010-01-12
    • US11869144
    • 2007-10-09
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • G11C16/00
    • G11C7/04G11C16/0441G11C16/10G11C16/28
    • The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
    • 半导体器件包括非易失性存储器,具有包含1比特双胞胞的存储器阵列,每个存储器阵列由电可重写的第一和第二存储器件组成,第一和第二存储器件根据其阈值电压的差异保持二进制数据,并具有不同的 保留特性取决于其二进制数据的差异; 用于差分放大从被选择读取的双胞胎的第一和第二存储装置输出的互补数据的读取电路,以及判断存储在双胞胎中的信息; 和控制电路。 布置构成双胞胎的两个存储单元以保存不同的数据。 因此,即使一个存储单元的保持性能劣化,也能够维持由两个存储单元保持的数据之间的差异。 因此,这种差异的差分放大使得能够获得正确的存储信息。 因此,提高了电可重写非易失性存储单元的保持性能。
    • 7. 发明授权
    • Microprocessor internally provided with test circuit
    • 微处理器内部提供测试电路
    • US06816983B2
    • 2004-11-09
    • US09785466
    • 2001-02-20
    • Takashi Kurafuji
    • Takashi Kurafuji
    • G06F1100
    • G06F11/2236
    • A microprocessor includes: a memory storing a program and various data; a processor core executing the program stored in the memory; an external bus interface serving as an interface portion of an external bus connected to an external device; a test circuit receiving a program counter value of an instruction to be executed by the processor core for outputting a test event signal for testing the microprocessor in synchronization with an operation timing of the processor core; a test event signal output terminal for outputting the test event signal to an external portion of the microprocessor, and an external event request signal input terminal provided for applying the processor core an external event request signal used by the external device to notify an event request with respect to the processor core.
    • 微处理器包括:存储程序和各种数据的存储器; 执行存储在存储器中的程序的处理器核心; 外部总线接口,用作连接到外部设备的外部总线的接口部分; 接收由处理器核心执行的指令的程序计数器值的测试电路,用于与处理器核心的操作定时同步地输出用于测试微处理器的测试事件信号; 测试事件信号输出端,用于将测试事件信号输出到微处理器的外部;以及外部事件请求信号输入端,用于将处理器核应用于由外部设备使用的外部事件请求信号以通知事件请求 尊重处理器核心。
    • 8. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07957195B2
    • 2011-06-07
    • US12630295
    • 2009-12-03
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • Masamichi FujitoMakoto MizunoTakahiro YokoyamaKenji KawadaTakashi IwaseYasunobu AokiTakashi KurafujiTomohiro UchiyamaShuichi SatoYuji Uji
    • G11C16/00
    • G11C7/04G11C16/0441G11C16/10G11C16/28
    • The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
    • 半导体器件包括非易失性存储器,具有包含1比特双胞胞的存储器阵列,每个存储器阵列由电可重写的第一和第二存储器件组成,第一和第二存储器件根据其阈值电压的差异保持二进制数据,并具有不同的 保留特性取决于其二进制数据的差异; 用于差分放大从被选择读取的双胞胎的第一和第二存储装置输出的互补数据的读取电路,以及判断存储在双胞胎中的信息; 和控制电路。 布置构成双胞胎的两个存储单元以保存不同的数据。 因此,即使一个存储单元的保持性能劣化,也能够维持由两个存储单元保持的数据之间的差异。 因此,这种差异的差分放大使得能够获得正确的存储信息。 因此,提高了电可重写非易失性存储单元的保持性能。