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    • 2. 发明授权
    • Capacitance-to-voltage interface circuit with shared capacitor bank for offsetting and analog-to-digital conversion
    • 具有共用电容器组的电容 - 电压接口电路用于偏移和模数转换
    • US07969167B2
    • 2011-06-28
    • US12360934
    • 2009-01-28
    • Ashish KhannaSung Jin Jo
    • Ashish KhannaSung Jin Jo
    • G01R27/26
    • G01P15/125G01D5/24
    • A capacitance-to-voltage interface circuit includes a capacitive sensing circuit, an amplification circuit adapted for selective coupling to the capacitive sensing circuit, a capacitor bank comprising a plurality of binary-weighted capacitors, and a switching architecture associated with the capacitive sensing circuit, the amplification circuit, and the capacitor bank. The switching architecture reconfigures the capacitance-to-voltage interface circuit for operation in a plurality of different phases, including an amplification phase and an analog-to-digital conversion phase. During the amplification phase, the capacitor bank is utilized for offsetting capacitance of the amplification circuit. During the analog-to-digital conversion phase, the capacitor bank is utilized in a successive approximation register.
    • 电容 - 电压接口电路包括电容感测电路,适于选择性地耦合到电容感测电路的放大电路,包括多个二进制加权电容器的电容器组以及与电容感测电路相关联的开关结构, 放大电路和电容器组。 开关架构重新配置了电容 - 电压接口电路,用于在多个不同的相位中工作,包括放大相位和模 - 数转换阶段。 在放大阶段期间,电容器组用于抵消放大电路的电容。 在模数转换阶段期间,电容器组用于逐次逼近寄存器。
    • 5. 发明授权
    • Microelectromechanical systems devices and methods for the fabrication thereof
    • 微机电系统装置及其制造方法
    • US09003886B2
    • 2015-04-14
    • US13458950
    • 2012-04-27
    • Yizhen LinSung Jin JoLisa Z. Zhang
    • Yizhen LinSung Jin JoLisa Z. Zhang
    • G01P15/125G01C19/56G01P15/08
    • G01P15/0802G01P15/125G01P2015/0814Y10T29/49002
    • Embodiments of compact micro-electro-mechanical systems (MEMS) devices are provided, as are embodiments of methods for fabricating MEMS devices. In one embodiment, the MEMS device includes a substrate, a movable structure resiliently coupled to the substrate, and an anchored structure fixedly coupled to the substrate. The movable structure includes a first plurality of movable fingers, and a second plurality of movable fingers electrically isolated from and interspersed with the first plurality of movable fingers. The anchored structure includes fixed fingers interspersed with first and second pluralities of movable fingers in a capacitor-forming relationship. First and second interconnects are electrically coupled to the first and second pluralities of movable fingers, respectively.
    • 提供紧凑型微机电系统(MEMS)装置的实施例,如制造MEMS器件的方法的实施例。 在一个实施例中,MEMS器件包括衬底,弹性地耦合到衬底的可移动结构以及固定地耦合到衬底的锚定结构。 可移动结构包括第一多个可动指状物,以及与第一多个活动指状物电隔离并与之分散的第二多个可移动指状物。 锚固结构包括以电容器形成关系散布有第一和第二多个可动指状物的固定指状物。 第一和第二互连分别电耦合到第一和第二多个可动指状物。
    • 6. 发明授权
    • Offset error automatic calibration integrated circuit
    • 偏移误差自动校准集成电路
    • US08689604B2
    • 2014-04-08
    • US13671951
    • 2012-11-08
    • Peter S. SchultzSung-Jin Jo
    • Peter S. SchultzSung-Jin Jo
    • G01D18/00
    • G01D18/008
    • An integrated circuit includes a transducer and transducer circuitry and additional elements useful in testing the transducer and transducer circuitry. A first power supply terminal and a second power supply terminal are for being directly connected to an external power supply terminal. A power bus is connected to the first power supply terminal. A logic function is for determining if the second power supply terminal is receiving power and if an automatic calibration test of the transducer and transducer circuitry has been run. An automatic calibration is for running an automatic calibration test on the transducer and transducer circuitry if the logic means determines that the second power supply terminal is receiving power and the automatic calibration test of the transducer and transducer circuitry has not been run.
    • 集成电路包括换能器和换能器电路以及用于测试换能器和换能器电路的附加元件。 第一电源端子和第二电源端子用于直接连接到外部电源端子。 电源总线连接到第一电源端子。 逻辑功能用于确定第二电源端子是否正在接收电力,以及是否已经运行了换能器和换能器电路的自动校准测试。 如果逻辑手段确定第二个电源端子正在接收电力,并且换能器和换能器电路的自动校准测试尚未运行,则自动校准用于对换能器和换能器电路进行自动校准测试。
    • 8. 发明申请
    • OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT
    • 偏移自动校准集成电路
    • US20130061649A1
    • 2013-03-14
    • US13671951
    • 2012-11-08
    • PETER S. SCHULTZSUNG-JIN JO
    • PETER S. SCHULTZSUNG-JIN JO
    • G01D18/00
    • G01D18/008
    • An integrated circuit includes a transducer and transducer circuitry and additional elements useful in testing the transducer and transducer circuitry. A first power supply terminal and a second power supply terminal are for being directly connected to an external power supply terminal. A power bus is connected to the first power supply terminal. A logic function is for determining if the second power supply terminal is receiving power and if an automatic calibration test of the transducer and transducer circuitry has been run. An automatic calibration is for running an automatic calibration test on the transducer and transducer circuitry if the logic means determines that the second power supply terminal is receiving power and the automatic calibration test of the transducer and transducer circuitry has not been run.
    • 集成电路包括换能器和换能器电路以及用于测试换能器和换能器电路的附加元件。 第一电源端子和第二电源端子用于直接连接到外部电源端子。 电源总线连接到第一电源端子。 逻辑功能用于确定第二电源端子是否正在接收电力,以及是否已经运行了换能器和换能器电路的自动校准测试。 如果逻辑手段确定第二个电源端子正在接收电力,并且换能器和换能器电路的自动校准测试尚未运行,则自动校准用于对换能器和换能器电路进行自动校准测试。
    • 9. 发明授权
    • Offset error automatic calibration integrated circuit
    • 偏移误差自动校准集成电路
    • US08321170B2
    • 2012-11-27
    • US12709063
    • 2010-02-19
    • Peter S. SchultzSung-Jin Jo
    • Peter S. SchultzSung-Jin Jo
    • G01D18/00G06F19/00
    • G01D18/008
    • An integrated circuit includes a transducer and transducer circuitry and additional elements useful in testing the transducer and transducer circuitry. A first power supply terminal and a second power supply terminal are for being directly connected to an external power supply terminal. A power bus is connected to the first power supply terminal. A logic function is for determining if the second power supply terminal is receiving power and if an automatic calibration test of the transducer and transducer circuitry has been run. An automatic calibration is for running an automatic calibration test on the transducer and transducer circuitry if the logic means determines that the second power supply terminal is receiving power and the automatic calibration test of the transducer and transducer circuitry has not been run.
    • 集成电路包括换能器和换能器电路以及用于测试换能器和换能器电路的附加元件。 第一电源端子和第二电源端子用于直接连接到外部电源端子。 电源总线连接到第一电源端子。 逻辑功能用于确定第二电源端子是否正在接收电力,以及是否已经运行了换能器和换能器电路的自动校准测试。 如果逻辑手段确定第二个电源端子正在接收电力,并且换能器和换能器电路的自动校准测试尚未运行,则自动校准用于对换能器和换能器电路进行自动校准测试。
    • 10. 发明申请
    • Recombinant coryneform bacterium and method for producing diodegradable polyester
    • 重组棒状杆菌型细菌和二聚降解聚酯的生产方法
    • US20070269872A1
    • 2007-11-22
    • US11471986
    • 2006-06-21
    • Seiichi TaguchiSung-Jin Jo
    • Seiichi TaguchiSung-Jin Jo
    • C12P7/62C12P7/40C12N1/21
    • C12P7/625
    • A recombinant coryneform bacterium obtained by providing a coryneform bacterium, which is known as a safe substance originally having no hazardous endotoxin, includes membrane structures different from E. coli and can be cultured in high density, with a biodegradable polyester producing ability, and a method for efficiently producing a biodegradable polyester to be contacted with a living organism for use in the medical and food industries formulated thereby. Specifically, the recombinant coryneform bacterium is obtained by modifying the coryneform bacterium so as to have the biodegradable polyester producing ability by introducing a biodegradable polyester synthetic enzyme gene group and a cell surface protein gene promoter from the coryneform bacterium into the coryneform bacterium.
    • 通过提供已知作为本来没有危害性内毒素的安全物质的棒状细菌获得的重组棒状杆菌型细菌包括不同于大肠杆菌的膜结构,并且可以以可生物降解的聚酯生产能力高密度培养, 用于有效地生产与生物体接触的可生物降解聚酯,用于由其配制的医疗和食品工业中。 具体而言,通过将棒状细菌通过将棒状细菌的生物降解性聚酯合成酶基因组和细胞表面蛋白质基因启动子引入棒状杆菌型细菌来修饰棒状细菌以具有生物可降解聚酯生产能力而获得重组棒状细菌。