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    • 6. 发明申请
    • Golf club for exercise
    • 高尔夫俱乐部锻炼
    • US20060160634A1
    • 2006-07-20
    • US11176554
    • 2005-07-06
    • Seung-Hun Lee
    • Seung-Hun Lee
    • A63B69/36
    • A63B69/3617A63B53/04A63B53/08A63B69/3685A63B2053/0416A63B2071/0625A63B2071/0627A63B2071/0633
    • The present invention relates to a golf club for exercise, with the help of which a golfer can confirm the site on a club head impacted on a ball easily through the sense during swinging practice so as to correct or improve the swinging posture and the impact exactness. Thus, a golf club (G) comprising a grip (10), a shaft (20) and a head (30) for hitting balls, wherein the golf club further includes a due hitting part (31) providing an ideal hitting spot, the due hitting part protruding from and integrally with the face of the head in accordance with the sweet spot; and a cushion member (40) provided with a fitting opening (41) for receiving the due hitting part (31), the cushion member being attached to the face of the head, is provided by the invention (FIG. 2).
    • 本发明涉及一种用于运动的高尔夫球杆,借助于此,高尔夫球手可以通过该摆动练习中的感觉容易地确认球杆头上撞击球的位置,从而校正或改善摆动姿势和冲击精度 。 因此,高尔夫球杆(G)包括用于击球的把手(10),轴(20)和头(30),其中高尔夫球杆还包括提供理想击球点的适当击打部分(31), 根据甜点,使头部的表面突出并与其整体一致; 以及缓冲构件(40),其设置有用于接收所述击打部分(31)的装配开口(41),所述缓冲构件附接到所述头部的所述面部,由本发明(图2)提供。
    • 7. 发明授权
    • Semiconductor memory device enabling direct current voltage test in package status
    • 半导体存储器件,可实现封装状态下的直流电压测试
    • US06298001B1
    • 2001-10-02
    • US08636428
    • 1996-04-23
    • Seung-hun LeeTae-jin Kim
    • Seung-hun LeeTae-jin Kim
    • G11C1700
    • G11C29/48G11C29/50G11C2029/5004Y10T307/615
    • A semiconductor memory device for a package-state voltage test has a plurality of bonding pads that are electrically connected to an external device in a package state, at least one internal DC voltage generator, at least one switch connected between one of the bonding pads and the internal DC voltage generator. The switch is on during a test mode and is off during a normal mode. The switch controller is connected between at least two of the plurality of bonding pads and serves to control the switch in response to an external switching signal in the test mode. Because of this design, a number of DC voltage tests can be performed without increasing chip size since a general control pad also serves as a DC voltage test pad.
    • 一种用于封装状态电压测试的半导体存储器件,具有与封装状态的外部器件电连接的多个接合焊盘,至少一个内部直流电压发生器,至少一个开关,其连接在一个焊盘和 内部直流电压发生器。 开关在测试模式下打开,并在正常模式下关闭。 开关控制器连接在多个接合焊盘中的至少两个接合焊盘之间,用于响应于测试模式中的外部开关信号来控制开关。 由于这种设计,可以在不增加芯片尺寸的情况下执行多个直流电压测试,因为通用控制板也用作直流电压测试板。