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    • 1. 发明申请
    • Memory Device With Improved Performance And Method Of Manufacturing Such A Memory Device
    • 具有改进性能的存储器件和制造这样的存储器件的方法
    • US20090179254A1
    • 2009-07-16
    • US12067491
    • 2006-09-13
    • Robertus Theodorus Franciscus Van SchaijkPablo Garcia TelloMichiel Slotboom
    • Robertus Theodorus Franciscus Van SchaijkPablo Garcia TelloMichiel Slotboom
    • H01L29/792H01L21/336
    • H01L29/1054G11C16/14H01L29/66833H01L29/7843H01L29/7848H01L29/792
    • Non-volatile memory device on a semiconductor substrate, comprising a semiconductor base layer, a charge storage layer stack, and a control gate; the base layer comprising source and drain regions and a current-carrying channel region being positioned in between the source and drain regions; the charge storage layer stack comprising a first insulating layer, a charge trapping layer and a second insulating layer, the first insulating layer being positioned above the current-carrying channel region, the charge trapping layer being above the first insulating layer and the second insulating layer being above the charge trapping layer; the control gate being positioned above the charge storage layer stack; the charge storage layer stack being arranged for trapping charge in the charge trapping layer by direct tunneling of charge carriers from the current-carrying channel region through the first insulating layer, wherein the current-carrying channel region is a p-type channel for p-type charge carriers, and the material of at least one of the current-carrying channel region and/or the source and drain regions is in an elastically strained state.
    • 半导体基板上的非易失性存储器件,包括半导体基底层,电荷存储层堆叠和控制栅极; 所述基极层包括源极和漏极区域,并且载流通道区域位于所述源极和漏极区域之间; 所述电荷存储层堆叠包括第一绝缘层,电荷捕获层和第二绝缘层,所述第一绝缘层位于所述载流通道区域的上方,所述电荷捕获层位于所述第一绝缘层之上,所述第二绝缘层 位于电荷捕获层之上; 控制栅极位于电荷存储层堆叠之上; 电荷存储层堆叠被布置用于通过从载流通道区域穿过第一绝缘层直接隧穿隧穿电荷来俘获电荷俘获层,其中载流通道区域是p型沟道, 并且载流通道区域和/或源极和漏极区域中的至少一个的材料处于弹性应变状态。