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1. 发明申请

US20210145063A1 VAPORIZING ARTICLE AND CONTAINERS FOR VAPORIZING ARTICLES 有权
公开(公告)号：US20210145063A1
公开(公告)日：2021-05-20
申请号：US17045081
申请日：2019-04-03
申请人： Rob PERRINS , Michel BOUCHARD , Jean-Pierre BOUCHARD
发明人： Rob PERRINS , Michel BOUCHARD , Jean-Pierre BOUCHARD
IPC分类号： A24F40/485 , A24F13/00 , A24F7/00 , A24F40/46 , A24F40/42 , A24F40/20 , A24D3/17 , A61M15/00 , A61M11/04
摘要： Systems and methods related to the near elimination of second-hand smoke or vapour from the process of smoking or vaporizing tobacco or Cannabis are provided. A vaporizing article is provided whereby a user may exhale into the article to capture a high percentage of the smoke and contaminants before they are released back into the surroundings. The article also provides for filtering gaseous by-products when the article is in idle mode. A prepackaged container for use with a vaporizing article is also provided. The container may be configured so as to optimize the heat distribution and consumption of product within the container.

2. 发明申请

US20100250034A1 METHOD OF MANAGING AIRCRAFT WARNINGS, AND A DEVICE FOR IMPLEMENTING SAID METHOD 审中-公开
标题翻译：管理飞机警告的方法和实施方法的装置
公开(公告)号：US20100250034A1
公开(公告)日：2010-09-30
申请号：US12726588
申请日：2010-03-18
申请人： Pierre BOUCHARD , Valérie JUPPET , Alexander REICH
发明人： Pierre BOUCHARD , Valérie JUPPET , Alexander REICH
IPC分类号： G06F19/00 , G01C21/00
CPC分类号： G07C5/0825 , G07C5/0833 , G08B7/06 , G08G5/0021
摘要： A method of managing warnings in an aircraft, includes: receiving information signals associated with a malfunction or with conditions requiring the pilot to be informed; preparing warning instructions as a function of the context and forwarding the warning instructions to visual and/or audible indicator elements; allocating a visual and/or audible warning to each of the warning instructions; and using visual indicator elements to display the visual warnings and using audible indicator elements to emit the audible warnings.
摘要翻译：管理飞机中的警告的方法包括：接收与故障相关联的信息信号或者需要通知飞行员的条件; 作为上下文的功能准备警告指令，并将警告指令转发到视觉和/或听觉指示元件; 向每个警告指令分配视觉和/或听觉警告; 并使用视觉指示器元件显示视觉警告并使用可听见的指示器元件发出可听见的警告。

3. 发明授权

US07001497B2 Process and apparatus for positioning replacement anodes in electrolytic cells 有权
标题翻译：将替代阳极定位在电解槽中的工艺和设备
公开(公告)号：US07001497B2
公开(公告)日：2006-02-21
申请号：US10423654
申请日：2003-04-25
申请人： Jean Pierre Gagné , Gilles Dufour , Bertrand St-Laurent , Claude Gauthier , Jacques Denis , Robin Boulianne , Pierre Bouchard , Jacques Pelletier
发明人： Jean Pierre Gagné , Gilles Dufour , Bertrand St-Laurent , Claude Gauthier , Jacques Denis , Robin Boulianne , Pierre Bouchard , Jacques Pelletier
IPC分类号： C25D21/00
CPC分类号： C25C3/06 , C25C7/06
摘要： A spent anode is replaced with a new anode in an electrolysis cell having an anode bus bar and an anode rod contacting the bus bar. A desired distance (D4) from the bus bar to a reference point on or adjacent to an anode rod for the new anode is calculated, the spent anode is replaced with a new anode so that the reference point on the new anode rod is spaced from the bus bar by an actual distance (D5), and the actual distance (D5) is measured at least once by means of a vision system. The actual distance (D5) is preferably adjusted using a feedback control loop in a computer so that D5 approaches the desired distance (D4).
摘要翻译：在具有阳极汇流条和阳极杆接触汇流条的电解池中，废阳极被替换为新阳极。计算从母线到与新阳极的阳极棒相邻或相邻的参考点的期望距离（D 4），废阳极被新阳极替代，使得新阳极棒上的参考点间隔开从母线到实际距离（D 5），并且通过视觉系统至少测量一次实际距离（D 5）。实际距离（D 5）优选使用计算机中的反馈控制回路进行调整，使得D 5接近期望距离（D 4）。

4. 发明申请

US20140013413A1 VIDEO AND AUDIO CONFERENCE SCHEDULING 审中-公开
标题翻译：视频和音频会议调度
公开(公告)号：US20140013413A1
公开(公告)日：2014-01-09
申请号：US14005903
申请日：2012-03-16
申请人： Larry E. Roher , Pierre Bouchard
发明人： Larry E. Roher , Pierre Bouchard
IPC分类号： H04L29/06
CPC分类号： H04L63/02 , G06Q10/02 , G06Q10/109
摘要： A method and system for enabling scheduling resources including associating a first client hosted on a first computer platform using a conference scheduling module, with a second client hosted on a second computer platform. The method including initiating a client software program on a first computer on a first platform for a first client, wherein the client software program including a conference scheduling module. The method further including generating a first private cloud using the client software on the first computer communicating with a first gateway module, the first gateway module being embodied on a first gateway computer not on the first platform. Further, the method includes joining the private cloud by initiating the client software on a second computer on a second platform for a second client.
摘要翻译：一种用于启用调度资源的方法和系统，包括使用会议调度模块将托管在第一计算机平台上的第一客户端与托管在第二计算机平台上的第二客户端相关联。该方法包括在用于第一客户端的第一平台上的第一计算机上发起客户端软件程序，其中所述客户端软件程序包括会议调度模块。该方法还包括使用与第一网关模块通信的第一计算机上的客户端软件生成第一私有云，第一网关模块体现在不在第一平台上的第一网关计算机上。此外，该方法包括通过在用于第二客户端的第二平台上的第二计算机上发起客户端软件来加入私有云。

5. 发明申请

US20080181482A1 MICRO-ARRAY ANALYSIS SYSTEM AND METHOD THEREOF 有权
标题翻译：微阵列分析系统及其方法
公开(公告)号：US20080181482A1
公开(公告)日：2008-07-31
申请号：US11668002
申请日：2007-01-29
申请人： Jean-Pierre BOUCHARD , Fabien Claveau , Isabelle Noiseux
发明人： Jean-Pierre BOUCHARD , Fabien Claveau , Isabelle Noiseux
IPC分类号： G06K9/00
CPC分类号： G06T7/0012 , G06T2207/10056 , G06T2207/30072
摘要： There is described a system and a method for analyzing spots in a micro-array, the spots containing targeted specimen, the method comprising the steps of: providing a slide with a micro-array of the spots thereon; illuminating at least one of the spots; directing the light onto the at least one spot; collecting light emitted from the at least one spot; forming an image of the at least one spot using the collected light; and analyzing the image to distinguish at least one unit of the targeted specimen located within the at least one spot from any undesired material. The analysis results are aimed at the detection, classification and quantification of optically resolvable specimen such as micro-organisms or cells.
摘要翻译：描述了用于分析微阵列中的斑点的系统和方法，所述斑点包含目标样本，所述方法包括以下步骤：提供具有其上的斑点的微阵列的载玻片; 照亮至少一个斑点; 将光引导到至少一个点上; 收集从至少一个点发射的光; 使用所收集的光形成所述至少一个点的图像; 以及分析图像以将位于至少一个点内的目标样本的至少一个单位与任何不期望的材料区分开。分析结果旨在检测，分类和定量光学可分辨的样品如微生物或细胞。

6. 发明申请

US20060195285A1 CANARY DEVICE FOR FAILURE ANALYSIS 失效
标题翻译：用于故障分析的CANARY设备
公开(公告)号：US20060195285A1
公开(公告)日：2006-08-31
申请号：US10906590
申请日：2005-02-25
申请人： Pierre Bouchard , Mark Hakey , Mark Masters , Leah Pastel , James Slinkman , David Vallett
发明人： Pierre Bouchard , Mark Hakey , Mark Masters , Leah Pastel , James Slinkman , David Vallett
IPC分类号： G06F19/00
CPC分类号： G01R31/2856 , G01R31/2831 , G01R31/318511 , G01R31/3187
摘要： A diagnostic system and method for testing an integrated circuit (IC) during fabrication thereof, wherein the diagnostic system comprises at least one IC chip comprising an electrical signature; a sacrificial circuit adjacent to the IC chip and comprising a known electrical signature and intentionally mis-designed circuitry; and a comparator adapted to compare the electrical signature of the IC chip with the known electrical signature of the sacrificial circuit, wherein a match in the electrical signature of the IC chip with the known electrical signature of the sacrificial circuit indicates that the IC chip is mis-designed. The diagnostic system further comprises a semiconductor wafer comprising a plurality of IC chips and a kerf area separating one IC chip from another IC chip. The sacrificial circuit is located in the kerf area or alternatively on each of the plurality of IC chips. A mis-designed IC chip comprises abnormally functioning circuitry.
摘要翻译：一种用于在其制造期间测试集成电路（IC）的诊断系统和方法，其中所述诊断系统包括至少一个包括电特征的IC芯片; 邻近于IC芯片的牺牲电路，包括已知的电气签名和故意错误设计的电路; 以及比较器，用于将IC芯片的电气签名与牺牲电路的已知电气签名进行比较，其中IC芯片的电子签名与牺牲电路的已知电气签名的匹配表明IC芯片是错误的设计。诊断系统还包括半导体晶片，其包括多个IC芯片和将IC芯片与另一IC芯片分开的切口区域。牺牲电路位于切口区域中，或者替代地位于多个IC芯片中的每一个上。错误设计的IC芯片包括异常功能的电路。

7. 发明申请

US20050055661A1 SYSTEM AND METHOD OF AUTOMATICALLY GENERATING KERF DESIGN DATA 失效
标题翻译：自动生成KERF设计数据的系统和方法
公开(公告)号：US20050055661A1
公开(公告)日：2005-03-10
申请号：US10605109
申请日：2003-09-09
申请人： Howard Barrett , Pierre Bouchard , James Clairmont , Karen Edwards , Maureen McFadden , John Rudden , Florence Sears , Jeffrey Stamm
发明人： Howard Barrett , Pierre Bouchard , James Clairmont , Karen Edwards , Maureen McFadden , John Rudden , Florence Sears , Jeffrey Stamm
IPC分类号： G06F17/50 , G06F19/00
CPC分类号： G06F17/5068
摘要： A method and system is provided to use the same design manipulation processes for both chip design and kerf design. Concurrent generation of kerf designs and chip designs provides a consistent, accurate, and repeatable process. Improved quality of wafer testing results because the data in the kerf matches data in the chip. The total cycle time for mask manufacturing is reduced because kerf build is accomplished prior to start of the mask manufacturing process. Also provided is the use of load balancing across multiple servers during kerf and chip design to optimize computing resources.
摘要翻译：提供了一种方法和系统，以对芯片设计和切角设计采用相同的设计操作过程。并口生成切口设计和芯片设计提供了一致，准确和可重复的过程。由于切片中的数据与芯片中的数据匹配，因此提高了晶圆测试的质量。掩模制造的总循环时间减少，因为在开始掩模制造过程之前完成切口构造。还提供了在切割和芯片设计期间跨多个服务器的负载平衡的使用，以优化计算资源。

8. 发明授权

US08014577B2 Micro-array analysis system and method thereof 有权
标题翻译：微阵列分析系统及其方法
公开(公告)号：US08014577B2
公开(公告)日：2011-09-06
申请号：US11668002
申请日：2007-01-29
申请人： Jean-Pierre Bouchard , Fabien Claveau , Isabelle Noiseux
发明人： Jean-Pierre Bouchard , Fabien Claveau , Isabelle Noiseux
IPC分类号： G06K9/00
CPC分类号： G06T7/0012 , G06T2207/10056 , G06T2207/30072
摘要： There is described a system and a method for analyzing spots in a micro-array, the spots containing targeted specimen, the method comprising the steps of: providing a slide with a micro-array of the spots thereon; illuminating at least one of the spots; directing the light onto the at least one spot; collecting light emitted from the at least one spot; forming an image of the at least one spot using the collected light; and analyzing the image to distinguish at least one unit of the targeted specimen located within the at least one spot from any undesired material. The analysis results are aimed at the detection, classification and quantification of optically resolvable specimen such as micro-organisms or cells.
摘要翻译：描述了用于分析微阵列中的斑点的系统和方法，所述斑点包含目标样本，所述方法包括以下步骤：提供具有其上的斑点的微阵列的载玻片; 照亮至少一个斑点; 将光引导到至少一个点上; 收集从至少一个点发射的光; 使用所收集的光形成所述至少一个点的图像; 以及分析图像以将位于至少一个点内的目标样本的至少一个单位与任何不期望的材料区分开。分析结果旨在检测，分类和定量光学可分辨的样品如微生物或细胞。

9. 发明申请

US20050235230A1 PROCESS AND DESIGN METHOD, SYSTEM AND PROGRAM PRODUCT 有权
标题翻译：过程和设计方法，系统和程序产品
公开(公告)号：US20050235230A1
公开(公告)日：2005-10-20
申请号：US10709130
申请日：2004-04-15
申请人： Michel Bohn , Pierre Bouchard , Neil Ginter , Derrick Kunze , Reginald Vance
发明人： Michel Bohn , Pierre Bouchard , Neil Ginter , Derrick Kunze , Reginald Vance
IPC分类号： G06F17/50 , H01L21/78
CPC分类号： G05B19/4183 , G05B2219/32129 , G05B2219/35032 , G05B2219/45031 , H01L21/78 , Y02P90/10 , Y02P90/265
摘要： A method, system and program product for generating a process aid on a wafer are disclosed. A “process aid” can be any device provided on a wafer that assists in some process step, but does not ultimately make up part of a usable die. The invention implements libraries of technology design rules, and process aid parameters, and a process aid instruction file library to allow automatic generation of a process aid according to the technology design rules and parameters. As a result, all the inputs required to build a process aid are available up front, which allows the invention to automatically adjust kerf designs to conform to the new technologies. In addition, the invention provides documentation indicating the inputs and details of the process aid produced.
摘要翻译：公开了一种用于在晶片上产生加工助剂的方法，系统和程序产品。 “加工助剂”可以是提供在晶片上的任何装置，其有助于一些工艺步骤，但是最终不能构成可用的模具的一部分。本发明实现了技术设计规则库和处理辅助参数，以及一个可以根据技术设计规则和参数自动生成过程辅助的过程辅助指令文件库。因此，建立加工助剂所需的所有投入都可以在前面获得，这使得本发明可以自动调整切口设计以符合新技术。此外，本发明提供了指出所生产的加工助剂的输入和细节的文件。

10. 发明申请

US20070266363A1 SYSTEM AND METHOD OF AUTOMATICALLY GENERATING KERF DESIGN DATA 失效
标题翻译：自动生成KERF设计数据的系统和方法
公开(公告)号：US20070266363A1
公开(公告)日：2007-11-15
申请号：US11763808
申请日：2007-06-15
申请人： Howard BARRETT , Pierre BOUCHARD , James CLAIRMONT , Karen EDWARDS , Maureen MCFADDEN , John RUDDEN , Florence SEARS , Jeffrey STAMM
发明人： Howard BARRETT , Pierre BOUCHARD , James CLAIRMONT , Karen EDWARDS , Maureen MCFADDEN , John RUDDEN , Florence SEARS , Jeffrey STAMM
IPC分类号： G06F17/50
CPC分类号： G06F17/5068
摘要： A method and system is provided to use the same design manipulation processes for both chip design and kerf design. Concurrent generation of kerf designs and chip designs provides a consistent, accurate, and repeatable process. Improved quality of wafer testing results because the data in the kerf matches data in the chip. The total cycle time for mask manufacturing is reduced because kerf build is accomplished prior to start of the mask manufacturing process. Also provided is the use of load balancing across multiple servers during kerf and chip design to optimize computing resources.
摘要翻译：提供了一种方法和系统，以对芯片设计和切角设计采用相同的设计操作过程。并口生成切口设计和芯片设计提供了一致，准确和可重复的过程。由于切片中的数据与芯片中的数据匹配，因此提高了晶圆测试的质量。掩模制造的总循环时间减少，因为在开始掩模制造过程之前完成切口构造。还提供了在切割和芯片设计期间跨多个服务器的负载平衡的使用，以优化计算资源。

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