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    • 2. 发明申请
    • POLARIZATION DIVERSITY OPTICAL INTERFEROMETER AND MICROSCOPE USING SAME
    • 极化多光学光学干涉仪和使用相同的显微镜
    • WO2012002720A3
    • 2012-05-03
    • PCT/KR2011004739
    • 2011-06-29
    • UNIV SOGANG IND UNIV COOP FOUNCHO KYU MANPARK YOUNG KYU
    • CHO KYU MANPARK YOUNG KYU
    • G01J4/00G01N21/21G02B21/18
    • G02B21/18G01B9/02028G01B2290/70G02B21/14G02B27/283
    • The present invention relates to an optical interferometer and a microscope using the same, and the optical interferometer comprises: a light source; a beamsplitter which splits light generated from said light source; a polarization splitter which splits said light into lights having mutually vertical polarized directions; and a plurality of photo detectors which detect said split lights, wherein at least one of said photo detectors is a polarization change detector capable of detecting a polarization change if the emitted light reflected or transmitted on a sample has a polarization diversity. According to the present invention, polarization changes in accordance with samples can be detected such that the invention is applied to all sorts of analysis devices for relevant study or to various equipment, and further optical characteristics of the samples are measured in a more precise manner.
    • 本发明涉及一种光学干涉仪和使用其的显微镜,并且所述光学干涉仪包括:光源; 分束器,其分离从所述光源产生的光; 将所述光分成具有相互垂直偏振方向的光的偏振分离器; 以及检测所述分光的多个光电检测器,其中至少一个所述光电检测器是如果在样品上反射或透射的发射光具有偏振分集,则能够检测偏振变化的偏振变化检测器。 根据本发明,可以检测根据样本的极化变化,使得本发明应用于各种用于相关研究的分析装置或各种设备,并且以更精确的方式测量样品的进一步的光学特性。
    • 7. 发明申请
    • APPARATUS FOR MEASURING HALL EFFECT
    • 用于测量霍尔效应的装置
    • WO2010056037A3
    • 2010-08-05
    • PCT/KR2009006616
    • 2009-11-11
    • ECOPIA CO LTDJUNG SUK WHANLEE GEUN TAEKPARK YOUNG KYULEE AHN SULEE JIN HO
    • JUNG SUK WHANLEE GEUN TAEKPARK YOUNG KYULEE AHN SU
    • G01N1/36G01N1/00G01N1/28
    • G01R33/07G01N35/0098G01N2035/00346G01R35/00
    • The present invention relates to a Hall effect-measuring apparatus for measuring values of characteristics of a semiconductor using the Hall effect. One embodiment of the present invention provides a Hall effect-measuring apparatus for measuring values of characteristics of a semiconductor sample by making use of the Hall effect, said Hall effect-measuring apparatus comprising a magnetic flux density applying device which accommodates a sample holder with a set sample therein, and moves a permanent magnet by an electric motor installed at one side thereof to form a predetermined magnetic field at the sample; and sample temperature control means for controlling the temperature of the sample holder to set the temperature of the sample. The Hall effect-measuring apparatus of the present invention applies current to the sample, and measures the Hall voltage output by the sample.
    • 本发明涉及一种霍尔效应测量装置,用于使用霍尔效应测量半导体特性值。 本发明的一个实施例提供了一种霍尔效应测量装置,用于通过利用霍尔效应来测量半导体样品的特性值,所述霍尔效应测量装置包括磁通量密度施加装置,该装置容纳具有 在其中放置样品,并通过安装在其一侧的电动机移动永磁体,以在样品处形成预定的磁场; 以及样品温度控制装置,用于控制样品架的温度以设定样品的温度。 本发明的霍尔效应测量装置向样品施加电流,并测量样品输出的霍尔电压。
    • 8. 发明申请
    • APPARATUS FOR INSPECTING HOMOGENEITY OF THE COEFFICIENT OF THE OPTICALLY INDUCED LINEAR BIREFRINGENCE IN THIN FILM
    • 用于检查薄膜中光学诱导线性绕射系数的均匀性的装置
    • WO2009064039A1
    • 2009-05-22
    • PCT/KR2008/000670
    • 2008-02-04
    • INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SOGANG UNIVERSITYCHO, Kyu-ManPARK, Young-Kyu
    • CHO, Kyu-ManPARK, Young-Kyu
    • G01J3/28G01N33/48
    • G01N21/23G01N21/1717
    • The present invention relates to an apparatus for inspecting homogeneity of a nonlinear coefficient in a sample. The apparatus comprises: a scanner arranged with a sample to be inspected and moving it along X and Y directions; a pumping system deriving birefringence by a light Kerr effect for the sample arranged on the scanner; an interferometer measuring the birefringence in the sample; and a control computer calculating the nonlinear coefficient values using the birefringence provided from the interferometer. The control computer receives the birefringence for all positions in the measurement region in the sample from the interferometer while moving the scanner in the X and Y directions along the measurement region in the sample, extracts the nonlinear coefficient values using the birefringence and the light source intensity values of the pumping system, and prepares and provides a 3D image using all the nonlinear coefficient values extracted for the measurement region in the sample. With the present invention, the nonlinear coefficients for the measurement region in the sample being the nonlinear medium are prepared and provided as the image, thereby making it possible to inspect the homogeneity of the nonlinear coefficient value.
    • 本发明涉及一种用于检查样品中非线性系数均匀性的装置。 该装置包括:扫描仪,其布置有要检查的样品并沿X和Y方向移动; 泵送系统通过用于布置在扫描仪上的样品的光克尔效应得到双折射; 测量样品中双折射的干涉仪; 以及使用由干涉仪提供的双折射率计算非线性系数值的控制计算机。 控制计算机沿着样品中的测量区域在扫描仪沿X和Y方向移动扫描仪时,从干涉仪接收样品中测量区域中的所有位置的双折射,使用双折射和光源强度提取非线性系数值 泵送系统的值,并准备并提供使用为样本中的测量区域提取的所有非线性系数值的3D图像。 利用本发明,准备作为非线性介质的样本中的测量区域的非线性系数作为图像,从而可以检查非线性系数值的均匀性。