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    • 2. 发明授权
    • Semiconductor laser device and method for fabricating the same
    • 半导体激光器件及其制造方法
    • US07408968B2
    • 2008-08-05
    • US11489616
    • 2006-07-20
    • Toshiya FukuhisaMasaya MannohHidetoshi Furukawa
    • Toshiya FukuhisaMasaya MannohHidetoshi Furukawa
    • H01S5/00H01S3/14
    • H01S5/4031B82Y20/00H01S5/1039H01S5/162H01S5/2231H01S5/3201H01S5/3211H01S5/34313H01S5/34326H01S5/4087
    • A semiconductor laser device includes: a first light emitting device, the first light emitting device including a first first-conductive-type cladding layer, a first active layer having a first window region in the vicinity of a light emitting edge surface and a first second-conductive-type cladding layer stacked in this order on a substrate; and a second light emitting device, the second light emitting device including a second first-conductive-type cladding layer, a second active layer having a second window region in the vicinity of a light emitting edge surface and a second second-conductive-type cladding layer stacked in this order on the substrate. In the semiconductor laser device, respective lattice constants of the first second-conductive-type and second second-conductive-type cladding layers are adjusted to compensate for a difference in diffusion rate of an impurity between the first window region in the first active layer and the second window region in the second active layer.
    • 半导体激光器件包括:第一发光器件,所述第一发光器件包括第一第一导电型包覆层,在发光边缘表面附近具有第一窗口区域的第一有源层和第一第二导电型包层 导电型包覆层依次层叠在基板上; 和第二发光器件,所述第二发光器件包括第二第一导电型包覆层,在发光边缘表面附近具有第二窗口区域的第二有源层和第二第二导电型覆层 层以此顺序堆叠在基板上。 在半导体激光器件中,调整第一第二导电型和第二第二导电型包覆层的各自的晶格常数,以补偿第一有源层中的第一窗口区域和第一有源层之间的杂质的扩散速率的差异 第二活动层中的第二窗口区域。
    • 4. 发明授权
    • Semiconductor laser with improved oscillation wavelength reproducibility
    • 具有改善振荡波长再现性的半导体激光器
    • US5345463A
    • 1994-09-06
    • US45423
    • 1993-04-13
    • Masaya MannohKiyoshi Ohnaka
    • Masaya MannohKiyoshi Ohnaka
    • H01S5/00H01S5/223H01S5/30H01S5/32H01S5/323H01S3/19
    • H01S5/32325H01S5/305H01S5/2231H01S5/3211
    • A lateral mode control type of semiconductor laser has a high-yield structure having a long life and improved oscillation wavelength reproducibility. A diffusion limit layer formed of an undoped Ga.sub.0.5 In.sub.0.5 P layer and an undoped (Al.sub.0.6 Ga.sub.0.4).sub.0.5 In.sub.0.5 P layer is provided between a p-(Al.sub.0.6 Ga.sub.0.4).sub.0.5 In.sub.0.5 P clad layer and an undoped Ga.sub.0.5 In.sub.0.5 P active layer. The diffusion limit layer has a diffusion coefficient smaller than that of the clad layer. Impurity Zn diffused from the p-(Al.sub.0.6 Ga.sub.0.4).sub.0.5 In.sub.0.5 P clad layer during crystal growth or working is trapped in the undoped Ga.sub.0.5 In.sub.0.5 P layer almost entirely. A part of the impurity Zn diffuses in the undoped (Al.sub.0.6 Ga.sub.0.4).sub.0.5 In.sub.0.5 P layer thereunder but does not reach the undoped Ga.sub.0.5 In.sub.0.5 P active layer.
    • 半导体激光器的横向模式控制型具有寿命长,振荡波长再现性提高的高产率结构。 由未掺杂的Ga0.5In0.5P层和未掺杂的(Al0.6Ga0.4)0.5In0.5P层形成的扩散极限层设置在p(Al 0.6 Ga 0.4)0.5 In 0.5 P包层和 未掺杂的Ga0.5In0.5P有源层。 扩散极限层的扩散系数小于包覆层的扩散系数。 在晶体生长或加工期间从p-(Al0.6Ga0.4)0.5In0.5P包覆层扩散的杂质Zn几乎完全被捕获在未掺杂的Ga 0.5 In 0.5 P层中。 杂质Zn的一部分在其下面的未掺杂(Al 0.6 Ga 0.4)0.5 In 0.5 P层中扩散,但未到达未掺杂的Ga 0.5 In 0.5 P活性层。