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    • 2. 发明授权
    • Zone air-conditioning control system for motor vehicle compartment
    • 机动车厢区域空调控制系统
    • US4537245A
    • 1985-08-27
    • US428613
    • 1982-09-30
    • Masao NishimuraMasami MoriAkirou Yoshimi
    • Masao NishimuraMasami MoriAkirou Yoshimi
    • B60H1/00B60H1/12F24F3/052F24F11/00G05D23/20F24F3/044F24F7/06
    • F24F11/0009B60H1/00842F24F3/0527G05D23/1917G05D23/20F24F11/0012
    • A portion of an air-conditioning unit is divided into two so as to provide first and second air-mixing chambers each following first and second temperature adjustment mechanisms. The temperature of air in the first chamber is controlled independently of the temperature of air in the second chamber, while the first chamber communicates with a first group of air-conditioning zone or zones and the second chamber communicates with a second group of remaining zone or zones. Thus, the temperature of air fed to the first group can be controlled in a manner different from the temperature of air fed to the second group. A plurality of distributing valves are provided at air discharging outlets communicating with the first or second chambers, and the opening degree of each damper may be controlled so that air distribution amount may be controlled. The temperature of the air in each of the first and second chambers and the opening degree of each damper may be automatically controlled in accordance with temperature measurement signals, temperature settings and other information such as the intensity of sun light.
    • 空调单元的一部分被分成两部分,以便在第一和第二温度调节机构之后提供第一和第二空气混合室。 第一室中的空气的温度独立于第二室中的空气的温度来控制,而第一室与第一组空调区域或区域连通,并且第二室与第二组剩余区域连通或 区域。 因此,可以以与供给第二组的空气的温度不同的方式来控制供给第一组的空气的温度。 多个分配阀设置在与第一或第二室连通的排气口处,并且可以控制每个阻尼器的开度,从而可以控制空气分配量。 可以根据温度测量信号,温度设置和诸如太阳光强度的其它信息来自动控制第一和第二室中的每一个中的空气温度和每个风门的开度。
    • 4. 发明申请
    • Apparatus and method for managing an encapsulated document
    • 用于管理封装文件的装置和方法
    • US20080071820A1
    • 2008-03-20
    • US11894839
    • 2007-08-21
    • Masami MoriAkira SuzukiTaiga Asano
    • Masami MoriAkira SuzukiTaiga Asano
    • G06F17/30
    • G06F16/93
    • An apparatus for managing an encapsulated document is disclosed that includes a file management unit to manage one or more content files; a program management unit to manage one or more programs for causing the content files to be manipulated; a document creation unit to create the encapsulated document by storing a content file selected from the content files managed by the file management unit and a program selected from the programs managed by the program management unit in a single file; an extraction unit to extract information on a manipulation by a user of the content file stored in the encapsulated document, the information being recorded in the encapsulated document by the program stored in the encapsulated document in accordance with the manipulation; and a manipulation information management unit to manage the extracted information on the manipulation.
    • 公开了一种用于管理封装文档的装置,其包括用于管理一个或多个内容文件的文件管理单元; 程序管理单元,用于管理用于使所述内容文件被操纵的一个或多个程序; 文档创建单元,通过将从由文件管理单元管理的内容文件中选择的内容文件和从程序管理单元管理的程序中选择的程序存储在单个文件中来创建封装文档; 提取单元,用于根据所述操作提取存储在所述封装文档中的所述内容文件的操作的信息,所述信息被存储在所述封装文档中的程序记录在所述封装文档中; 以及操作信息管理单元,用于管理所提取的关于操作的信息。
    • 7. 发明授权
    • Semiconductor testing apparatus and semiconductor testing method
    • 半导体测试仪器和半导体测试方法
    • US06833715B2
    • 2004-12-21
    • US10617387
    • 2003-07-11
    • Hideaki SakaguchiMasayuki EhiroMasami Mori
    • Hideaki SakaguchiMasayuki EhiroMasami Mori
    • G01R3126
    • G09G3/006G09G3/3688G09G3/3696G11C29/38
    • A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus includes output voltage testing device and comparison voltage generation data inputting device. The output voltage testing device includes test voltage inputting device, comparison voltage generating device, a high level comparator, a low level comparator, and comparison result outputting device. The high level comparator and the low level comparator constitute comparing device for comparing a voltage to be tested, with a comparison voltage.
    • 提供一种半导体测试装置和半导体测试方法,其允许具有廉价构造的装置精确地执行具有大量输出端子的半导体集成电路的接受或拒绝确定和测量测试,每个输出端子用于输出 多灰度级输出电压。 半导体测试装置包括输出电压测试装置和比较电压产生数据输入装置。 输出电压测试装置包括测试电压输入装置,比较电压发生装置,高电平比较器,低电平比较器和比较结果输出装置。 高电平比较器和低电平比较器构成用于比较被测电压的比较装置和比较电压。