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    • 1. 发明授权
    • Semiconductor testing apparatus and semiconductor testing method
    • 半导体测试仪器和半导体测试方法
    • US06833715B2
    • 2004-12-21
    • US10617387
    • 2003-07-11
    • Hideaki SakaguchiMasayuki EhiroMasami Mori
    • Hideaki SakaguchiMasayuki EhiroMasami Mori
    • G01R3126
    • G09G3/006G09G3/3688G09G3/3696G11C29/38
    • A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus includes output voltage testing device and comparison voltage generation data inputting device. The output voltage testing device includes test voltage inputting device, comparison voltage generating device, a high level comparator, a low level comparator, and comparison result outputting device. The high level comparator and the low level comparator constitute comparing device for comparing a voltage to be tested, with a comparison voltage.
    • 提供一种半导体测试装置和半导体测试方法,其允许具有廉价构造的装置精确地执行具有大量输出端子的半导体集成电路的接受或拒绝确定和测量测试,每个输出端子用于输出 多灰度级输出电压。 半导体测试装置包括输出电压测试装置和比较电压产生数据输入装置。 输出电压测试装置包括测试电压输入装置,比较电压发生装置,高电平比较器,低电平比较器和比较结果输出装置。 高电平比较器和低电平比较器构成用于比较被测电压的比较装置和比较电压。