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    • 2. 发明授权
    • Optical apparatus
    • 光学仪器
    • US06829051B2
    • 2004-12-07
    • US10189622
    • 2002-07-08
    • Katsuyuki AbeKazuhiko Osa
    • Katsuyuki AbeKazuhiko Osa
    • G01N2164
    • G01N21/6458
    • An optical apparatus including an illuminating optical system for illuminating a sample with light from a light source, a first wavelength selecting member, a light beam splitter for directing illuminating light toward the sample, an objective lens, a detector, and a second wavelength selecting member disposed between the objective lens and the detector, in which the first wavelength selecting member has a wavelength selecting element for selectively transmitting light having wavelengths in a predetermined region out of the illuminating light, the second wavelength selecting member has a wavelength selecting element for transmitting light having a predetermined wavelength out of light reflected by the sample, and the light beam splitter has an optical element having transmittance not lower than 85% and reflectance not higher than 14% in a wavelength region not shorter than 400 nm and not longer than 700 nm. The optical apparatus permits observing fluorescent light at the same time with a high efficiency.
    • 一种光学装置,包括:用来自光源的光照射样品的照明光学系统;第一波长选择部件;将光照射到样品的光束分离器;物镜;检测器;以及第二波长选择部件 配置在所述物镜与所述检测器之间,所述第一波长选择部件具有用于选择性地透过所述照明光中的预定区域的波长的光的波长选择元件,所述第二波长选择部件具有用于透射光的波长选择元件 具有由样品反射的光的预定波长,并且光束分离器具有在不小于400nm且不大于700nm的波长区域中具有不低于85%的透射率和不高于14%的透射率的光学元件 。 光学装置允许以高效率同时观察荧光。
    • 7. 发明授权
    • Scanning examination apparatus, lens unit, and objective-lens adaptor
    • 扫描检查装置,镜头单元和物镜适配器
    • US07436562B2
    • 2008-10-14
    • US11375042
    • 2006-03-15
    • Nobuyuki NagasawaYoshihisa TanikawaKazuhiko OsaYoshiharu Saito
    • Nobuyuki NagasawaYoshihisa TanikawaKazuhiko OsaYoshiharu Saito
    • G02B26/08G02B21/06
    • G02B21/006A61B5/0059A61B5/0068G02B21/0012G02B21/0028G02B26/0816
    • It is possible to easily and accurately confirm the position of an optical axis of an objective lens relative to an examination site on a specimen, and positioning of the objective relative to the specimen can be carried out rapidly in a preparation stage. The invention provides scanning examination apparatus comprising a first light source; a light scanning unit configured to scan light from the first light source on a specimen; an objective lens configured to form an image of the light scanned in the light scanning unit at the specimen; a light-detecting unit configured to detect return light emitted from the specimen; a second light source configured to emit visible light; a deflecting optical element, disposed between the light scanning unit and the objective lens, for making visible light emitted from the second light source enter the objective lens along an optical axis of the objective lens; and a beam-shaping unit configured to form the visible light from the second light source, which is irradiated onto a surface of the specimen via the objective lens using the deflecting optical element, into a pattern that enables the optical axis of the objective lens to be indicated.
    • 可以容易且准确地确认物镜的光轴相对于检体的检查部位的位置,能够在准备阶段快速地进行物体相对于检体的定位。 本发明提供一种扫描检查装置,包括:第一光源; 光扫描单元,被配置为在样本上扫描来自第一光源的光; 物镜,被配置为在所述样本处形成在所述光扫描单元中扫描的光的图像; 光检测单元,被配置为检测从所述样本发射的返回光; 配置为发射可见光的第二光源; 设置在光扫描单元和物镜之间的偏转光学元件,用于使从第二光源发出的可见光沿着物镜的光轴进入物镜; 以及光束整形单元,被配置为将来自所述第二光源的可见光通过所述偏转光学元件通过所述物镜照射到所述样本的表面上,使得能够使所述物镜的光轴 被指示。
    • 8. 发明申请
    • Dark box apparatus for fluoroscopy, fluoroscopy system, and fluroscopy method
    • 用于荧光透视,荧光透视系统和荧光法的暗盒装置
    • US20080116395A1
    • 2008-05-22
    • US12005893
    • 2007-12-27
    • Kei TsuyukiKazuhiko OsaNobuyuki Nagasawa
    • Kei TsuyukiKazuhiko OsaNobuyuki Nagasawa
    • G01N21/00
    • G01N21/6458G01N21/6456
    • Noise in a fluorescence image acquired during fluoroscopy is eliminated to present a clear fluorescence image, and the relative positional relationship between the fluoroscopy unit and the specimen can be recognized even while fluoroscopy is in progress. A dark box apparatus for fluoroscopy includes: a dark-box main body enclosing a specimen and a fluoroscopy unit for illuminating the specimen with excitation light with a first spectral band and for detecting fluorescence with a second spectral band generated by the specimen; an illumination light source disposed in the dark-box main body to emit light with a third spectral band different from the first spectral band and the second spectral band; and an observation window disposed in the dark-box main body, the observation window being capable of transmitting light with a fourth spectral band which includes at least part of the third spectral band and does not include the first spectral band and the second spectral band.
    • 在荧光透视期间获取的荧光图像中的噪声被消除以呈现清晰的荧光图像,并且即使在进行荧光透视时也能够识别透视单元和样本之间的相对位置关系。 用于荧光透视的暗盒装置包括:包围样本的暗盒主体和用于用具有第一光谱带的激发光照射样本并用于用由样本产生的第二光谱带检测荧光的荧光透视单元; 照明光源,其设置在所述暗盒主体内,以与所述第一光谱带和所述第二光谱带不同的第三光谱带发光; 以及设置在暗箱主体中的观察窗,所述观察窗能够透射具有包括所述第三光谱带的至少一部分的第四光谱带的光,并且不包括所述第一光谱带和所述第二光谱带。
    • 9. 发明授权
    • Dark box apparatus for fluoroscopy, fluoroscopy system, and fluoroscopy method
    • 用于荧光透视,荧光透视系统和荧光透视法的暗盒装置
    • US07339667B2
    • 2008-03-04
    • US11726885
    • 2007-03-23
    • Kei TsuyukiKazuhiko OsaNobuyuki Nagasawa
    • Kei TsuyukiKazuhiko OsaNobuyuki Nagasawa
    • G01N21/64
    • G01N21/6458G01N21/6456
    • Noise in a fluorescence image acquired during fluoroscopy is eliminated to present a clear fluorescence image, and the relative positional relationship between the fluoroscopy unit and the specimen can be recognized even while fluoroscopy is in progress. A dark box apparatus for fluoroscopy includes: a dark-box main body enclosing a specimen and a fluoroscopy unit for illuminating the specimen with excitation light with a first spectral band and for detecting fluorescence with a second spectral band generated by the specimen; an illumination light source disposed in the dark-box main body to emit light with a third spectral band different from the first spectral band and the second spectral band; and an observation window disposed in the dark-box main body, the observation window being capable of transmitting light with a fourth spectral band which includes at least part of the third spectral band and does not include the first spectral band and the second spectral band.
    • 在荧光透视期间获取的荧光图像中的噪声被消除以呈现清晰的荧光图像,并且即使在进行荧光透视时也能够识别透视单元和样本之间的相对位置关系。 用于荧光透视的暗盒装置包括:包围样本的暗盒主体和用于用具有第一光谱带的激发光照射样本并用于用由样本产生的第二光谱带检测荧光的荧光透视单元; 照明光源,其设置在所述暗盒主体内,以与所述第一光谱带和所述第二光谱带不同的第三光谱带发光; 以及设置在暗箱主体中的观察窗,所述观察窗能够透射具有包括所述第三光谱带的至少一部分的第四光谱带的光,并且不包括所述第一光谱带和所述第二光谱带。
    • 10. 发明申请
    • Scanning examination apparatus, lens unit, and objective-lens adaptor
    • 扫描检查装置,镜头单元和物镜适配器
    • US20060214095A1
    • 2006-09-28
    • US11375042
    • 2006-03-15
    • Nobuyuki NagasawaYoshihisa TanikawaKazuhiko OsaYoshiharu Saito
    • Nobuyuki NagasawaYoshihisa TanikawaKazuhiko OsaYoshiharu Saito
    • H01J40/14H01J3/14H01J5/16
    • G02B21/006A61B5/0059A61B5/0068G02B21/0012G02B21/0028G02B26/0816
    • It is possible to easily and accurately confirm the position of an optical axis of an objective lens relative to an examination site on a specimen, and positioning of the objective relative to the specimen can be carried out rapidly in a preparation stage. The invention provides scanning examination apparatus comprising a first light source; a light scanning unit configured to scan light from the first light source on a specimen; an objective lens configured to form an image of the light scanned in the light scanning unit at the specimen; a light-detecting unit configured to detect return light emitted from the specimen; a second light source configured to emit visible light; a deflecting optical element, disposed between the light scanning unit and the objective lens, for making visible light emitted from the second light source enter the objective lens along an optical axis of the objective lens; and a beam-shaping unit configured to form the visible light from the second light source, which is irradiated onto a surface of the specimen via the objective lens using the deflecting optical element, into a pattern that enables the optical axis of the objective lens to be indicated.
    • 可以容易且准确地确认物镜的光轴相对于检体的检查部位的位置,能够在准备阶段快速地进行物体相对于检体的定位。 本发明提供一种扫描检查装置,包括:第一光源; 光扫描单元,被配置为在样本上扫描来自第一光源的光; 物镜,被配置为在所述样本处形成在所述光扫描单元中扫描的光的图像; 光检测单元,被配置为检测从所述样本发射的返回光; 配置为发射可见光的第二光源; 设置在光扫描单元和物镜之间的偏转光学元件,用于使从第二光源发出的可见光沿着物镜的光轴进入物镜; 以及光束整形单元,被配置为将来自所述第二光源的可见光通过所述偏转光学元件通过所述物镜照射到所述样本的表面上,使得能够使所述物镜的光轴 被指示。