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    • 8. 发明授权
    • Exposure apparatus and method
    • 曝光装置和方法
    • US5657130A
    • 1997-08-12
    • US408714
    • 1995-03-22
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • G03F7/20G03F7/207G03F9/00H01L21/027G01B11/00
    • G03F7/70216G03F7/70275G03F7/70358G03F7/70791G03F9/70
    • In an exposure apparatus and method, a mask and a substrate are scanned in synchronism with each other so that the pattern of the mask may be transferred onto the substrate through a projection optical system. First beams of light are irradiated to least two locations on the mask spaced apart in a direction intersecting the scanning direction of the mask. The reflected light thereof is received, and the positions of the points on the mask to which the beam of light has been irradiated are detected in the direction of the optical axis of the projection optical system. In addition, second beams of light are irradiated to at least two locations on the substrate spaced apart in the scanning direction, and the reflected light thereof is received. The positions of the points on the substrate to which the second beam of light has been irradiated are also detected in the direction of the optical axis of the projection optical system are detected. The posture of at least one of the mask and the substrate is adjusted on the basis of the positions detected with the first and second beams.
    • 在曝光装置和方法中,掩模和基板彼此同步地扫描,使得掩模的图案可以通过投影光学系统被转印到基板上。 第一光束照射在与掩模的扫描方向相交的方向间隔开的掩模上的至少两个位置。 在投影光学系统的光轴的方向上检测其反射光,并且在光束照射的掩模上的点的位置被检测。 此外,第二光束照射到沿扫描方向间隔开的基板上的至少两个位置,并且其反射光被接收。 检测到在投影光学系统的光轴的方向上检测到已经照射第二光束的基板上的点的位置。 基于由第一和第二光束检测到的位置来调整掩模和基板中的至少一个的姿势。
    • 10. 发明申请
    • INTERMEDIATE VACUUM SEAL ASSEMBLY FOR SEALING A CHAMBER HOUSING TO A WORKPIECE
    • 用于将工作室密封住的室内真空密封组件
    • US20100245795A1
    • 2010-09-30
    • US12721493
    • 2010-03-10
    • Fardad A. HashemiHiroshi ShirasuDouglas C. Watson
    • Fardad A. HashemiHiroshi ShirasuDouglas C. Watson
    • G03B27/54H01J9/00
    • G03F7/70841G03B27/54G03F7/70525G03F7/70808
    • A chamber assembly (226) for providing a sealed chamber (38) adjacent to a workpiece (28) includes a chamber housing (244), a chamber pressure source (246) and a seal assembly (250). The chamber housing (244) cooperates with the workpiece (28) to define at least a portion of the sealed chamber (38). The chamber pressure source (246) controls a chamber pressure within the sealed chamber (38) to be different than the environmental pressure. The seal assembly (250) seals the chamber housing (244) to the workpiece (28). The seal assembly (250) can include a first seal contact region (270) and a second seal contact region (272) that cooperate to define a seal gap (274) adjacent to at least one of the chamber housing (244) and the workpiece (28). The seal assembly (250) may further include a seal pressure source (276) for controlling a seal pressure within the seal gap (274) so that the seal pressure is different than the chamber pressure and the environmental pressure. The first seal contact region (270) and the second seal contact region (272) cooperate to exert a first force (284) on a surface (278). The seal pressure source (276) generates a second force (286) on the surface (278). The first force (284) is approximately equal in magnitude and opposite in direction to the second force (286).
    • 用于提供与工件(28)相邻的密封腔(38)的腔室组件(226)包括腔室壳体(244),腔室压力源(246)和密封组件(250)。 腔室壳体(244)与工件(28)配合以限定密封腔室(38)的至少一部分。 腔室压力源(246)控制密封腔室(38)内的腔室压力不同于环境压力。 密封组件(250)将腔室壳体(244)密封到工件(28)。 密封组件(250)可以包括第一密封接触区域(270)和第二密封接触区域(272),第一密封接触区域(270)和第二密封接触区域(272)协作以限定邻近腔室壳体(244)和工件 (28)。 密封组件(250)还可以包括用于控制密封间隙(274)内的密封压力的密封压力源(276),使得密封压力不同于腔室压力和环境压力。 第一密封接触区域(270)和第二密封接触区域(272)协作以在表面(278)上施加第一力(284)。 密封压力源(276)在表面(278)上产生第二力(286)。 第一力(284)的大小相等并且在与第二力(286)相反的方向上相反。