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1. 发明申请

US20090184263A1 Charged Particle Beam Irradiation System 有权
标题翻译：带电粒子束照射系统
公开(公告)号：US20090184263A1
公开(公告)日：2009-07-23
申请号：US12336592
申请日：2008-12-17
申请人： Kunio Moriyama , Takahide Nakayama , Hideaki Nishiuchi
发明人： Kunio Moriyama , Takahide Nakayama , Hideaki Nishiuchi
IPC分类号： A61N5/00
CPC分类号： H05H7/04 , A61N5/1077 , A61N2005/1087 , H05H2007/046
摘要： A charged particle beam irradiation system comprises a high-speed steerer (beam dump device) 100 disposed in a course of a beam transport line 4 through which an ion beam is extracted from a charged-particle beam generator 1. The beam dump device 100 is provided with dose monitoring devices 105, 106 for measuring a dose of an ion beam applied to a beam dump 104 so that the intensity of the ion beam can be measured without transporting the ion beam to irradiation nozzles 15A through 15D. Thus, the system is capable of adjusting the intensity of an ion beam extracted from a synchrotron without operating each component of a beam transport line, and an irradiation nozzle.
摘要翻译：带电粒子束照射系统包括设置在束输送线4的过程中的高速搅拌器（束流装置）100，通过该高速搅拌器离子束从带电粒子束发生器1中提取离子束。束流装置100是设置有用于测量施加到光束倾倒器104的离子束的剂量的剂量监测装置105,106，使得可以测量离子束的强度而不将离子束传送到照射喷嘴15A至15D。因此，该系统能够调节从同步加速器提取的离子束的强度，而不必操作光束输送线的每个部件和照射喷嘴。

2. 发明申请

US20050099145A1 Particle therapy system 有权
标题翻译：粒子治疗系统
公开(公告)号：US20050099145A1
公开(公告)日：2005-05-12
申请号：US10981505
申请日：2004-11-05
申请人： Hideaki Nishiuchi , Katsuhisa Ike , Masumi Umezawa , Koji Matsuda
发明人： Hideaki Nishiuchi , Katsuhisa Ike , Masumi Umezawa , Koji Matsuda
IPC分类号： G21K5/00 , A61N5/10 , G21K5/04 , H05H7/06 , H05H13/04 , H05H7/00
CPC分类号： H05H13/04 , A61N2005/1087 , H05H7/06 , H05H2007/008
摘要： A particle therapy system capable of confirming energy of an accelerated charged particle beam before the charged particle beam is irradiated to an irradiation target. A beam position monitor is disposed in a synchrotron, and a cavity voltage monitor is associated with an RF cavity for acceleration. An ion beam orbiting within the synchrotron is accelerated with application of an RF voltage applied to the RF cavity and is extracted from the synchrotron with application of an RF voltage applied to an RF knockout electrode. Based on a cavity voltage signal detected by the cavity voltage monitor, a frequency counter measures the frequency of the RF voltage applied to the RF cavity. Based on a voltage detected by the beam position monitor, a beam signal processing unit measures the position of a beam orbit. Based on the frequency of the RF voltage and the position of the beam orbit, the energy judgment processing unit determines whether energy of the ion beam after the end of the acceleration is normal or abnormal.
摘要翻译：一种粒子治疗系统，其能够在将带电粒子束照射到照射目标之前确认加速带电粒子束的能量。光束位置监视器设置在同步加速器中，并且腔体电压监视器与RF腔相关联以用于加速。通过施加施加到RF空腔的RF电压来加速在同步加速器内运行的离子束，并且通过施加施加到RF击穿电极的RF电压从同步加速器中提取离子束。基于由腔体电压监测器检测到的腔体电压信号，频率计数器测量施加到RF空腔的RF电压的频率。基于由光束位置监视器检测的电压，光束信号处理单元测量光束轨道的位置。基于RF电压的频率和光束轨道的位置，能量判断处理单元判定加速结束后的离子束的能量是正常还是异常。

3. 发明授权

US06472834B2 Accelerator and medical system and operating method of the same 有权
标题翻译：加速器与医疗系统及操作方法相同
公开(公告)号：US06472834B2
公开(公告)日：2002-10-29
申请号：US09791697
申请日：2001-02-26
申请人： Kazuo Hiramoto , Hideaki Nishiuchi
发明人： Kazuo Hiramoto , Hideaki Nishiuchi
IPC分类号： H05H1304
CPC分类号： G21K5/04
摘要： The accelerator is a cyclic type accelerator having deflection electromagnets and four-pole electromagnets for making a charged particle beam circulate, a multi-pole electromagnet for generating a stability limit of resonance of betatron oscillation for the production of the charged particle beam, and a high frequency source for applying a high frequency electromagnetic field to the beam to move the beam to the outside of the stability limit, thus exciting resonance in the betatron oscillation. The high frequency source generates a sum signal of a plurality of AC signals of which the instantaneous frequencies change with respect to time, and of which the average values of the instantaneous frequencies with respect to time are different, and applies the sum signal via electrodes to the beam.
摘要翻译：加速器是具有用于使带电粒子束循环的偏转电磁体和四极电磁体的循环型加速器，用于产生用于产生带电粒子束的贝塔振荡的共振稳定极限的多极电磁体和高用于将高频电磁场施加到光束以将光束移动到稳定极限的外部的频率源，从而激发贝塔振荡中的谐振。高频源产生瞬时频率相对于时间变化的多个AC信号的和信号，并且其瞬时频率相对于时间的平均值不同，并且将经过电极的和信号施加到梁。

4. 发明申请

US20070228304A1 PARTICLE BEAM IRRADIATION SYSTEM 有权
标题翻译：颗粒光束辐照系统
公开(公告)号：US20070228304A1
公开(公告)日：2007-10-04
申请号：US11692331
申请日：2007-03-28
申请人： Hideaki Nishiuchi , Kazuyoshi Saito
发明人： Hideaki Nishiuchi , Kazuyoshi Saito
IPC分类号： G21G4/00
CPC分类号： H05H7/10 , A61N5/1043 , A61N2005/1087 , G21K1/10 , G21K5/04
摘要： It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
摘要翻译：本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统，其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。为了实现上述目的，提供了一种粒子束照射系统，包括：用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置，用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置，用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。

5. 发明申请

US20140203186A1 CHARGED PARTICLE BEAM IRRADIATION SYSTEM AND OPERATING METHOD OF CHARGED PARTICLE BEAM IRRADIATION SYSTEM 有权
标题翻译：充电颗粒光束辐射系统和充电颗粒光束辐射系统的工作方法
公开(公告)号：US20140203186A1
公开(公告)日：2014-07-24
申请号：US14238068
申请日：2011-08-31
申请人： Tomohisa Iwamoto , Kunio Moriyama , Hideaki Nishiuchi , Hideaki Nihongi
发明人： Tomohisa Iwamoto , Kunio Moriyama , Hideaki Nishiuchi , Hideaki Nihongi
IPC分类号： A61N5/10
CPC分类号： A61N5/1067 , A61N5/1075 , A61N5/1079 , A61N2005/1087 , H05H7/12 , H05H13/04 , H05H2007/008 , H05H2007/046
摘要： A charged particle beam irradiation system in which the energy, Bragg peak, and irradiation depth of a charged particle beam, with which a patient is to be irradiated, can be checked in real time just before actual irradiation. Just before the actual irradiation, by providing a high-speed steering magnet with 100% current, a checking beam is intentionally hit into a beam damper. By using a dosimeter and a dose measuring device in front thereof, extraction beam intensity is measured. By using a multi-layer beam monitor, a dose distribution thereof is measured. Accordingly, just before the actual irradiation, the energy, Bragg peak, and irradiation depth of the charged particle beam, with which the patient is to be irradiated, can be checked accurately and in real time. When the beam has a desired dose distribution as a result of checking, continuously, extraction control is performed.
摘要翻译：可以在实际照射之前实时检查其中要照射患者的带电粒子束的能量，布拉格峰和照射深度的带电粒子束照射系统。在实际照射之前，通过提供具有100％电流的高速转向磁体，有意地将检查光束撞到光束阻尼器中。通过使用前面的剂量计和剂量测量装置，测量提取束强度。通过使用多层光束监视器，测量其剂量分布。因此，在实际照射之前，可以准确，实时地检查与患者照射的带电粒子束的能量，布拉格峰和照射深度。当光束作为检查结果具有期望的剂量分布时，连续地执行提取控制。

6. 发明授权

US07875868B2 Charged particle beam irradiation system 有权
标题翻译：带电粒子束照射系统
公开(公告)号：US07875868B2
公开(公告)日：2011-01-25
申请号：US12336592
申请日：2008-12-17
申请人： Kunio Moriyama , Takahide Nakayama , Hideaki Nishiuchi
发明人： Kunio Moriyama , Takahide Nakayama , Hideaki Nishiuchi
IPC分类号： A61N5/00
CPC分类号： H05H7/04 , A61N5/1077 , A61N2005/1087 , H05H2007/046
摘要： A charged particle beam irradiation system comprises a high-speed steerer (beam dump device) 100 disposed in a course of a beam transport line 4 through which an ion beam is extracted from a charged-particle beam generator 1. The beam dump device 100 is provided with dose monitoring devices 105, 106 for measuring a dose of an ion beam applied to a beam dump 104 so that the intensity of the ion beam can be measured without transporting the ion beam to irradiation nozzles 15A through 15D. Thus, the system is capable of adjusting the intensity of an ion beam extracted from a synchrotron without operating each component of a beam transport line, and an irradiation nozzle.
摘要翻译：带电粒子束照射系统包括设置在束输送线4的过程中的高速搅拌器（束流装置）100，通过该高速搅拌器离子束从带电粒子束发生器1中提取离子束。束流装置100是设置有用于测量施加到光束倾倒器104的离子束的剂量的剂量监测装置105,106，使得可以测量离子束的强度而不将离子束传送到照射喷嘴15A至15D。因此，该系统能够调节从同步加速器提取的离子束的强度，而不必操作光束输送线的每个部件和照射喷嘴。

7. 发明授权

US08253113B2 Charged particle beam irradiation system and charged particle beam extraction method 有权
标题翻译：带电粒子束照射系统和带电粒子束提取方法
公开(公告)号：US08253113B2
公开(公告)日：2012-08-28
申请号：US12490696
申请日：2009-06-24
申请人： Hideaki Nishiuchi , Kazuyoshi Saito , Masahiro Tadokoro , Hiroshi Akiyama , Kazuo Hiramoto
发明人： Hideaki Nishiuchi , Kazuyoshi Saito , Masahiro Tadokoro , Hiroshi Akiyama , Kazuo Hiramoto
IPC分类号： G21K5/04
CPC分类号： A61N5/10 , A61N2005/1087 , H05H7/10 , H05H13/04
摘要： A charged particle beam irradiation system includes a synchrotron which accelerates an ion beam, an irradiation apparatus for irradiating an object with the ion beam introduced from the synchrotron, detection means for measuring an amount of accumulated charge of the ion beam that orbits in the synchrotron immediately before an extraction control period in an operating cycle of the synchrotron, and beam extraction control means for controlling extraction of the ion beam based on the measurement result of the accumulated beam charge amount so that extraction of a total amount of the ion beam is to be completed with an expiration of an extraction control time, the extraction control time representing a length of the extraction control period of the synchrotron and being set in advance.
摘要翻译：带电粒子束照射系统包括加速离子束的同步加速器，用于从同步加速器引入的离子束照射物体的照射装置，用于测量在同步加速器中轨道运动的离子束的累积电荷量的检测装置在同步加速器的操作循环中的提取控制期间之前，以及根据累积的光束电荷量的测量结果控制离子束的提取的光束提取控制装置，使得离子束的总量的提取为在提取控制时间到期时完成，提取控制时间表示同步加速器的提取控制周期的长度，并且预先设定。

8. 发明授权

US07807982B2 Particle beam irradiation system 有权
标题翻译：粒子束照射系统
公开(公告)号：US07807982B2
公开(公告)日：2010-10-05
申请号：US11692331
申请日：2007-03-28
申请人： Hideaki Nishiuchi , Kazuyoshi Saito
发明人： Hideaki Nishiuchi , Kazuyoshi Saito
IPC分类号： H01J49/00
CPC分类号： H05H7/10 , A61N5/1043 , A61N2005/1087 , G21K1/10 , G21K5/04
摘要： It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
摘要翻译：本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统，其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。为了实现上述目的，提供了一种粒子束照射系统，包括：用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置，用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置，用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。

9. 发明授权

US07439528B2 Particle therapy system and method 有权
标题翻译：粒子治疗系统及方法
公开(公告)号：US07439528B2
公开(公告)日：2008-10-21
申请号：US10981505
申请日：2004-11-05
申请人： Hideaki Nishiuchi , Katsuhisa Ike , Masumi Umezawa , Koji Matsuda
发明人： Hideaki Nishiuchi , Katsuhisa Ike , Masumi Umezawa , Koji Matsuda
IPC分类号： A61N5/00
CPC分类号： H05H13/04 , A61N2005/1087 , H05H7/06 , H05H2007/008
摘要： A particle therapy system capable of confirming energy of an accelerated charged particle beam before the charged particle beam is irradiated to an irradiation target. A beam position monitor is disposed in a synchrotron, and a cavity voltage monitor is associated with an RF cavity for acceleration. An ion beam orbiting within the synchrotron is accelerated with application of an RF voltage applied to the RF cavity and is extracted from the synchrotron with application of an RF voltage applied to an RF knockout electrode. Based on a cavity voltage signal detected by the cavity voltage monitor, a frequency counter measures the frequency of the RF voltage applied to the RF cavity. Based on a voltage detected by the beam position monitor, a beam signal processing unit measures the position of a beam orbit. Based on the frequency of the RF voltage and the position of the beam orbit, the energy judgment processing unit determines whether energy of the ion beam after the end of the acceleration is normal or abnormal.
摘要翻译：一种粒子治疗系统，其能够在将带电粒子束照射到照射目标之前确认加速带电粒子束的能量。光束位置监视器设置在同步加速器中，并且腔体电压监视器与RF腔相关联以用于加速。通过施加施加到RF空腔的RF电压来加速在同步加速器内运行的离子束，并且通过施加施加到RF击穿电极的RF电压从同步加速器中提取离子束。基于由腔体电压监测器检测到的腔体电压信号，频率计数器测量施加到RF空腔的RF电压的频率。基于由光束位置监视器检测的电压，光束信号处理单元测量光束轨道的位置。基于RF电压的频率和光束轨道的位置，能量判断处理单元判定加速结束后的离子束的能量是正常还是异常。

10. 发明授权

US09199094B2 Charged particle beam irradiation system and operating method of charged particle beam irradiation system 有权
标题翻译：带电粒子束照射系统和带电粒子束照射系统的操作方法
公开(公告)号：US09199094B2
公开(公告)日：2015-12-01
申请号：US14238068
申请日：2011-08-31
申请人： Tomohisa Iwamoto , Kunio Moriyama , Hideaki Nishiuchi , Hideaki Nihongi
发明人： Tomohisa Iwamoto , Kunio Moriyama , Hideaki Nishiuchi , Hideaki Nihongi
IPC分类号： A61N5/00 , A61N5/10 , H05H7/12 , H05H13/04 , H05H7/00 , H05H7/04
CPC分类号： A61N5/1067 , A61N5/1075 , A61N5/1079 , A61N2005/1087 , H05H7/12 , H05H13/04 , H05H2007/008 , H05H2007/046
摘要： A charged particle beam irradiation system in which the energy, Bragg peak, and irradiation depth of a charged particle beam, with which a patient is to be irradiated, can be checked in real time just before actual irradiation. Just before the actual irradiation, by providing a high-speed steering magnet with 100% current, a checking beam is intentionally hit into a beam damper. By using a dosimeter and a dose measuring device in front thereof, extraction beam intensity is measured. By using a multi-layer beam monitor, a dose distribution thereof is measured. Accordingly, just before the actual irradiation, the energy, Bragg peak, and irradiation depth of the charged particle beam, with which the patient is to be irradiated, can be checked accurately and in real time. When the beam has a desired dose distribution as a result of checking, continuously, extraction control is performed.
摘要翻译：可以在实际照射之前实时检查其中要照射患者的带电粒子束的能量，布拉格峰和照射深度的带电粒子束照射系统。在实际照射之前，通过提供具有100％电流的高速转向磁体，有意地将检查光束撞到光束阻尼器中。通过使用前面的剂量计和剂量测量装置，测量提取束强度。通过使用多层光束监视器，测量其剂量分布。因此，在实际照射之前，可以准确，实时地检查与患者照射的带电粒子束的能量，布拉格峰和照射深度。当光束作为检查结果具有期望的剂量分布时，连续地执行提取控制。

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