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    • 2. 发明授权
    • Particle beam irradiation system
    • 粒子束照射系统
    • US07807982B2
    • 2010-10-05
    • US11692331
    • 2007-03-28
    • Hideaki NishiuchiKazuyoshi Saito
    • Hideaki NishiuchiKazuyoshi Saito
    • H01J49/00
    • H05H7/10A61N5/1043A61N2005/1087G21K1/10G21K5/04
    • It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
    • 本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统,其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。 为了实现上述目的,提供了一种粒子束照射系统,包括:用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置,用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置,用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。
    • 3. 发明授权
    • Particle beam irradiation system
    • 粒子束照射系统
    • US07982198B2
    • 2011-07-19
    • US12493379
    • 2009-06-29
    • Hideaki NishiuchiKazuyoshi Saito
    • Hideaki NishiuchiKazuyoshi Saito
    • A61N5/00
    • H05H7/10A61N5/1043A61N2005/1087G21K1/10G21K5/04
    • It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
    • 本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统,其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。 为了实现上述目的,提供了一种粒子束照射系统,包括:用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置,用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置,用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。
    • 4. 发明申请
    • PARTICLE BEAM IRRADIATION SYSTEM
    • 颗粒光束辐照系统
    • US20090283704A1
    • 2009-11-19
    • US12493379
    • 2009-06-29
    • Hideaki NishiuchiKazuyoshi Saito
    • Hideaki NishiuchiKazuyoshi Saito
    • A61N5/00
    • H05H7/10A61N5/1043A61N2005/1087G21K1/10G21K5/04
    • It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
    • 本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统,其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。 为了实现上述目的,提供了一种粒子束照射系统,包括:用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置,用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置,用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。
    • 5. 发明申请
    • PARTICLE BEAM IRRADIATION SYSTEM
    • 颗粒光束辐照系统
    • US20070228304A1
    • 2007-10-04
    • US11692331
    • 2007-03-28
    • Hideaki NishiuchiKazuyoshi Saito
    • Hideaki NishiuchiKazuyoshi Saito
    • G21G4/00
    • H05H7/10A61N5/1043A61N2005/1087G21K1/10G21K5/04
    • It is an object of the present invention to provide a charged particle beam extraction method and particle beam irradiation system that make it possible to exercise intensity control over an extracted ion beam while a simple device configuration is employed. To accomplish the above object, there is provided a particle beam irradiation system comprising: a synchrotron for accelerating and extracting an charged particle beam; an irradiation apparatus for extracting the charged particle beam that is extracted from the synchrotron; first beam intensity modulation means for controlling the beam intensity of the charged particle beam extracted from the synchrotron during an extraction control period of an operation cycle of the synchrotron; and second beam intensity modulation means for controlling the beam intensity during each of a plurality of irradiation periods contained in the extraction control period of the operation cycle.
    • 本发明的目的是提供一种带电粒子束提取方法和粒子束照射系统,其可以在采用简单的装置配置的情况下对提取的离子束进行强度控制。 为了实现上述目的,提供了一种粒子束照射系统,包括:用于加速和提取带电粒子束的同步加速器; 用于提取从同步加速器提取的带电粒子束的照射装置; 第一光束强度调制装置,用于在同步加速器的操作周期的提取控制周期期间控制从同步加速器提取的带电粒子束的束强度; 以及第二光束强度调制装置,用于在包含在操作周期的提取控制周期中的多个照射周期的每一个期间控制光束强度。