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1. 发明授权

US06354932B1 Processing system for boning and skinning poultry 失效
标题翻译：腌制和剥皮家禽的加工系统
公开(公告)号：US06354932B1
公开(公告)日：2002-03-12
申请号：US09589916
申请日：2000-06-07
申请人： Han Moo Lee
发明人： Han Moo Lee
IPC分类号： A22C2106
CPC分类号： A22C21/0076 , A22C21/0092
摘要： A poultry processing machine including a distribution housing, a rotating dome and a truncated conical surface outwardly of the dome for the distribution of quarter legs to several processing units. Gates control the admission of the pieces to the processing units. The processing unit includes a converging inlet within which horizontal extending bars are positioned to allow the smaller end of the piece to drop downwardly into the unit. A rotatable circular blade and traction wheels draw the piece downwardly along with the operation of vacuum from a rotatable cutter. A passageway concentrically arranged within the cutter receives the bone of the quarter leg and vacuum drawn through the rotatable cutter draws the piece downwardly. A spreading surface lays the now deboned and longitudinally sliced piece into a flat slab. A skinning device having vacuum associated with a porous wheel pulls the skin away from the flesh. A skinning knife assists in this process. The skin is then discharged from the surface of the wheel by a compressed air section while the flesh progresses outwardly to trigger an outlet sensor which initiates the process again through the opening of the corresponding gate above the truncated conical surface.
摘要翻译：一种家禽加工机，其包括分配壳体，旋转圆顶和圆顶外侧的截锥形表面，用于将四分之一腿分配到多个处理单元。盖茨控制件到加工单元。处理单元包括会聚入口，水平延伸杆定位在该会聚入口中，以允许该件的较小端向下落入该单元。可旋转的圆形刀片和牵引轮随着来自可旋转刀具的真空操作而向下拉动件。同心地布置在切割器内的通道接收四分支腿的骨骼，并且通过可旋转切割器吸取的真空将片材向下拉。铺展表面将现在的剔骨和纵向切片放在平板上。具有与多孔轮相关联的真空的剥皮装置使皮肤远离肉体。剥皮刀帮助这个过程。然后，皮肤通过压缩空气部分从轮的表面排出，同时肉体向外进行以触发出口传感器，其通过在截锥形表面上方的相应门的开口再次启动该过程。

2. 发明授权

US08114302B2 Method of fabricating cantilever type probe and method of fabricating probe card using the same 有权
标题翻译：制造悬臂式探头的方法及使用其制造探针卡的方法
公开(公告)号：US08114302B2
公开(公告)日：2012-02-14
申请号：US12308012
申请日：2007-05-16
申请人： Han-Moo Lee , Yong-Hwi Jo
发明人： Han-Moo Lee , Yong-Hwi Jo
IPC分类号： B44C1/22
CPC分类号： G01R1/06744 , G01R1/06727 , G01R3/00
摘要： Disclosed is a method of fabricating a cantilever type probes. According to this method, after forming grooves each in tip portion and dummy tip portion regions of a substrate, the tip portion and dummy tip portion are formed with filling the grooves of the tip portion and dummy tip portion regions. A sacrificial layer is formed to cover the dummy tip portion region including dummy tip portion. A beam portion is formed in connection with the tip portion, extending upward the dummy tip portion including the sacrificial layer. The method includes steps of selectively etching the substrate of the tip portion and floating the tip portion from the substrate. Accordingly, it minimizes physical and chemical damages on the tip portion while fabricating a probe card, providing stability thereto with smaller defects of the tip portion.
摘要翻译：公开了制造悬臂型探针的方法。根据该方法，在基板的前端部分和虚设末端部分区域中形成沟槽之后，在尖端部分和虚拟顶端部分区域中填充尖端部分和虚拟顶端部分，形成凹槽。形成牺牲层以覆盖包括假顶端部分的假顶端部区域。梁部分与尖端部分形成，向上延伸包括牺牲层的虚拟顶端部分。该方法包括以下步骤：选择性地蚀刻尖端部分的基底并将尖端部分从衬底浮起。因此，在制造探针卡的同时，使尖端部分的物理和化学损伤最小化，从而在尖端部分的缺陷较小的情况下提供稳定性。

3. 发明授权

US07602204B2 Probe card manufacturing method including sensing probe and the probe card, probe card inspection system 失效
标题翻译：探针卡制造方法包括感应探头和探针卡，探针卡检测系统
公开(公告)号：US07602204B2
公开(公告)日：2009-10-13
申请号：US11666645
申请日：2005-12-19
申请人： Han-Moo Lee
发明人： Han-Moo Lee
IPC分类号： G01R31/02
CPC分类号： G01R3/00 , G01R1/06727 , G01R1/06738 , G01R1/07342 , Y10T29/49155
摘要： There is provided a method of manufacturing a probe card. A first passivation pattern for implementing a tip portion of an electrical inspection probe and a tip portion of a planarity sensing probe on a sacrificial substrate is formed, and an etching process using the first passivation pattern as an etch mask is performed to form a first trench in the sacrificial substrate. The first passivation pattern is removed, and a second passivation pattern having bar-type first openings exposing the first trench is formed. A conductive material is provided in the openings to form beam portions connected respectively to the tip portions of the inspection and sensing probes, thereby forming the inspection probe and the sensing probe. The beam portions of the inspection and sensing probes are bonded to a multi-layer circuit board. The sacrificial substrate is removed to expose the inspection probe and the sensing probe.
摘要翻译：提供了一种制造探针卡的方法。形成用于在牺牲基板上实现电检查探针的尖端部分和平坦度检测探针的尖端部分的第一钝化图案，并且执行使用第一钝化图案作为蚀刻掩模的蚀刻工艺以形成第一沟槽在牺牲衬底中。去除第一钝化图案，并且形成具有暴露第一沟槽的条形第一开口的第二钝化图案。在开口中设置导电材料以形成分别连接到检查和感测探针的尖端部分的梁部分，从而形成检查探针和感测探头。检查和感测探头的光束部分结合到多层电路板。去除牺牲衬底以暴露检查探针和感测探头。

4. 发明申请

US20090173712A1 Method of fabricating cantilever type probe and method of fabricating probe card using the same 有权
标题翻译：制造悬臂式探头的方法及使用其制造探针卡的方法
公开(公告)号：US20090173712A1
公开(公告)日：2009-07-09
申请号：US12308012
申请日：2007-05-16
申请人： Han-Moo Lee , Yong-Hwi Jo
发明人： Han-Moo Lee , Yong-Hwi Jo
IPC分类号： B44C1/22
CPC分类号： G01R1/06744 , G01R1/06727 , G01R3/00
摘要： Disclosed is a method of fabricating a cantilever type probes. According to this method, after forming grooves each in tip portion and dummy tip portion regions of a substrate, the tip portion and dummy tip portion are formed with filling the grooves of the tip portion and dummy tip portion regions. A sacrificial layer is formed to cover the dummy tip portion region including dummy tip portion. A beam portion is formed in connection with the tip portion, extending upward the dummy tip portion including the sacrificial layer. The method includes steps of selectively etching the substrate of the tip portion and floating the tip portion from the substrate. Accordingly, it minimizes physical and chemical damages on the tip portion while fabricating a probe card, providing stability thereto with smaller defects of the tip portion.
摘要翻译：公开了制造悬臂型探针的方法。根据该方法，在基板的前端部分和虚设末端部分区域中形成沟槽之后，在尖端部分和虚拟顶端部分区域中填充尖端部分和虚拟顶端部分，形成凹槽。形成牺牲层以覆盖包括假顶端部分的假顶端部区域。梁部分与尖端部分形成，向上延伸包括牺牲层的虚拟顶端部分。该方法包括以下步骤：选择性地蚀刻尖端部分的基底并将尖端部分从衬底浮起。因此，在制造探针卡的同时，使尖端部分的物理和化学损伤最小化，从而在尖端部分的缺陷较小的情况下提供稳定性。

5. 发明申请

US20090212797A1 Probe card 失效
标题翻译：探针卡
公开(公告)号：US20090212797A1
公开(公告)日：2009-08-27
申请号：US11921336
申请日：2006-06-01
申请人： Han-Moo Lee
发明人： Han-Moo Lee
IPC分类号： G01R1/067
CPC分类号： G01R1/07342
摘要： The present invention provides a probe card that is easily assembled and maintained and configured to prevent the controlled level of a space transformer from changing due to various causes such as a thermal deformation during a test process. The probe card includes an installation member where probe tips are provided and a printed circuit hoard (PCB) disposed on the installation member. A reinforcement member is fixed to a top surface of the PCB, and a contact member is disposed between the PCB and the reinforcement member. The contact member and the installation member are fixed by means of a connect member inserted into an insert hole formed at the PCB, and a control bolt provided for controlling the level of the installation member is inserted into control holes formed at the installation member, the PCB, and the reinforcement member sequentially in a bottom-to-top direction. Due to a convex-up top surface of the contact member, the contact member continues to contact the reinforcement member even though the installation member and the contact member are inclined while controlling the level of the installation member.
摘要翻译：本发明提供了一种探针卡，其容易地组装和维护并构造成防止空间变压器的受控水平因各种原因（例如在测试过程中的热变形）而改变。探针卡包括设置探针尖端的安装构件和设置在安装构件上的印刷电路板（PCB）。加强构件固定到PCB的顶表面，并且接触构件设置在PCB和加强构件之间。接触构件和安装构件通过插入到形成在PCB上的插入孔中的连接构件固定，并且用于控制安装构件的高度的控制螺栓插入到安装构件所形成的控制孔中， PCB，并且加强构件顺序地从底部到顶部的方向。由于接触构件的凸起的上表面，即使安装构件和接触构件在控制安装构件的水平的同时倾斜，接触构件继续接触加强构件。

6. 发明授权

US07859280B2 Probe card for testing semiconductor devices 失效
标题翻译：用于测试半导体器件的探针卡
公开(公告)号：US07859280B2
公开(公告)日：2010-12-28
申请号：US11921336
申请日：2006-06-01
申请人： Han-Moo Lee
发明人： Han-Moo Lee
IPC分类号： G01R31/02
CPC分类号： G01R1/07342
摘要： A probe card is disclosed that is easily assembled and maintained and configured to prevent the controlled level of a space transformer from changing due to various causes such as a thermal deformation during a test process. The probe card includes an installation member where probe tips are provided and a printed circuit board (PCB) disposed on the installation member. A reinforcement member is fixed to a top surface of the PCB, and a contact member is disposed between the PCB and the reinforcement member. The contact member and the installation member are fixed by a connect member inserted into an insert hole formed at the PCB, and a control bolt provided for controlling the level of the installation member is inserted into control holes formed at the installation member, the PCB, and the reinforcement member sequentially in a bottom-to-top direction. Due to a convex-up top surface of the contact member, the contact member continues to contact the reinforcement member even though the installation member and the contact member are inclined while controlling the level of the installation member.
摘要翻译：公开了一种易于组装和维护和构造的探针卡，以防止由于各种原因（例如在测试过程中的热变形）空间变压器的受控水平而变化。探针卡包括设置探针尖端的安装构件和设置在安装构件上的印刷电路板（PCB）。加强构件固定到PCB的顶表面，并且接触构件设置在PCB和加强构件之间。接触构件和安装构件通过插入到形成在PCB上的插入孔中的连接构件固定，并且用于控制安装构件的高度的控制螺栓插入到安装构件，PCB上形成的控制孔中，和加强构件顺序地从底部到顶部的方向。由于接触构件的凸起的上表面，即使安装构件和接触构件在控制安装构件的水平的同时倾斜，接触构件继续接触加强构件。

7. 发明申请

US20080186041A1 Probe Card Manufacturing Method Including Sensing Probe And The Probe Card, Probe Card Inspection System 失效
标题翻译：探头卡制造方法包括传感探头和探头卡，探头卡检测系统
公开(公告)号：US20080186041A1
公开(公告)日：2008-08-07
申请号：US11666645
申请日：2005-12-19
申请人： Han-Moo Lee
发明人： Han-Moo Lee
IPC分类号： G01R1/067 , H05K3/10
CPC分类号： G01R3/00 , G01R1/06727 , G01R1/06738 , G01R1/07342 , Y10T29/49155
摘要： There is provided a method of manufacturing a probe card. A first passivation pattern for implementing a tip portion of an electrical inspection probe and a tip portion of a planarity sensing probe on a sacrificial substrate is formed, and an etching process using the first passivation pattern as an etch mask is performed to form a first trench in the sacrificial substrate. The first passivation pattern is removed, and a second passivation pattern having bar-type first openings exposing the first trench is formed. A conductive material is provided in the openings to form beam portions connected respectively to the tip portions of the inspection and sensing probes, thereby forming the inspection probe and the sensing probe. The beam portions of the inspection and sensing probes are bonded to a multi-layer circuit board. The sacrificial substrate is removed to expose the inspection probe and the sensing probe.
摘要翻译：提供了一种制造探针卡的方法。形成用于在牺牲基板上实现电检查探针的尖端部分和平坦度检测探针的尖端部分的第一钝化图案，并且执行使用第一钝化图案作为蚀刻掩模的蚀刻工艺以形成第一沟槽在牺牲衬底中。去除第一钝化图案，并且形成具有暴露第一沟槽的条形第一开口的第二钝化图案。在开口中设置导电材料以形成分别连接到检查和感测探针的尖端部分的梁部分，从而形成检查探针和感测探头。检查和感测探头的光束部分结合到多层电路板。去除牺牲衬底以暴露检查探针和感测探头。

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