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    • 3. 发明授权
    • Method of selective via-hole and heat sink plating using a metal mask
    • 使用金属掩模的选择性通孔和散热电镀方法
    • US4842699A
    • 1989-06-27
    • US192199
    • 1988-05-10
    • Chang-Hwang HuaDing-Yuan S. DaySimon S. Chan
    • Chang-Hwang HuaDing-Yuan S. DaySimon S. Chan
    • C25D5/02H01L21/768H01L23/48
    • C25D5/022H01L21/76898H01L23/481H01L2924/0002
    • A method for simultaneous selective plating of viaholes and heat sinks associated with a semiconductor wafer using a metal mask and comprising the steps of:(a) coating a first side of the wafer with an insulating layer to prevent electroplating on this first side;(b) patterning on a second side of the wafer, opposite to the first side, a metal mask for defining the areas where plating should not occur;(c) forming via-holes through said wafer;(d) depositing a thin conductive film to coat the bottom and walls of the via-holes as well as areas of the second side of the wafer not covered by the metal mask; and(e) electrolytically plating the resulting wafer while ultrasonically agitating the electrolyte if necessary to ensure sufficient electrolyte transport into the via-holes for uniform plating.
    • 一种使用金属掩模同时选择性地电镀与半导体晶片相关的通孔和散热器的方法,包括以下步骤:(a)用绝缘层涂覆晶片的第一侧以防止在该第一侧上的电镀; (b)在晶片的与第一侧相对的第二面上图案化,用于限定不应发生电镀的区域的金属掩模; (c)通过所述晶片形成通孔; (d)沉积薄的导电膜以覆盖通孔的底部和壁以及未被金属掩模覆盖的晶片的第二面的区域; 和(e)如果需要的话,对所得的晶片进行电解电镀,同时超声波地搅动电解质,以确保足够的电解质输送到通孔中用于均匀的电镀。