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    • 2. 发明授权
    • Trench structure having a void and inductor including the trench structure
    • 具有包括沟槽结构的空隙和电感器的沟槽结构
    • US07326625B2
    • 2008-02-05
    • US11052552
    • 2005-02-07
    • Joo-Hyun JeongChul-Ho Chung
    • Joo-Hyun JeongChul-Ho Chung
    • H01L21/20
    • H01L28/10H01L21/764H01L27/08
    • In a method of forming a trench structure having a wide void therein, a first trench having a first width and a first depth is formed in a substrate. The first trench is filled with a first insulation layer pattern defining the void in the first trench. A second trench is formed on the first trench. The second trench has a second width wider than the first width and a second depth shallower than the first depth. The second trench is filled with a second insulation layer pattern. After an insulating interlayer on the substrate including the first and second trenches, a conductive line is formed on a portion of the insulating interlayer where the second trench is positioned so that an inductor is formed over the trench structure.
    • 在形成其中具有宽空隙的沟槽结构的方法中,在衬底中形成具有第一宽度和第一深度的第一沟槽。 第一沟槽填充有限定第一沟槽中的空隙的第一绝缘层图案。 在第一沟槽上形成第二沟槽。 第二沟槽具有比第一宽度宽的第二宽度和比第一深度浅的第二深度。 第二沟槽填充有第二绝缘层图案。 在包括第一沟槽和第二沟槽的衬底上的绝缘中间层之后,在绝缘中间层的一部分上形成导电线,其中第二沟槽被定位,使得电感器形成在沟槽结构之上。
    • 3. 发明申请
    • Method of fabricating semiconductor device
    • 制造半导体器件的方法
    • US20070170590A1
    • 2007-07-26
    • US11656451
    • 2007-01-23
    • Joo-hyun JeongChul-ho Chung
    • Joo-hyun JeongChul-ho Chung
    • H01L21/4763
    • H01L21/76841H01L21/2855H01L23/5227H01L23/53223H01L23/53238H01L28/10H01L2924/0002H01L2924/00
    • A semiconductor device and a method of fabricating a semiconductor device that includes forming an interlayer insulating film on a semiconductor substrate; depositing a first soft magnetic thin film on the interlayer insulating film through sputtering using a target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; forming a metal film on the first soft magnetic thin film; depositing a second soft magnetic thin film on the metal film through sputtering using the same or another target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; and patterning to form an inductor.
    • 一种半导体器件和制造半导体器件的方法,包括在半导体衬底上形成层间绝缘膜; 通过使用包含Fe,Co,Ni或其合金中的至少一种的靶通过溅射,在层间绝缘膜上沉积第一软磁性薄膜,靶还含有Ti,Hf或B中的至少一种,溅射为 使用N 2反应气体进行; 在第一软磁薄膜上形成金属膜; 通过溅射使用含有Fe,Co,Ni或其合金中的至少一种的相同或另一靶的溅射在金属膜上沉积第二软磁薄膜,靶还含有Ti,Hf或B中的至少一种, 使用N 2反应气体进行溅射; 并图案化以形成电感器。
    • 5. 发明授权
    • Transformers, balanced-unbalanced transformers (baluns) and integrated circuits including the same
    • 变压器,平衡不平衡变压器(baluns)和包括相同的集成电路
    • US08198970B2
    • 2012-06-12
    • US12453465
    • 2009-05-12
    • Tae-Hoon ChoiChul-Ho Chung
    • Tae-Hoon ChoiChul-Ho Chung
    • H01F5/00H01F27/28
    • H01F17/0013H03H7/1775H03H7/42
    • A transformer of fully symmetric structure includes a primary coil assembly and a secondary coil assembly. The primary coil assembly includes a plurality of primary coils formed in a plurality of metal layers, and a first interlayer connection unit for connecting the primary coils. The secondary coil assembly includes a plurality of secondary coils formed in the plurality of metal layers, and a second interlayer connection unit for connecting the secondary coils. The primary and secondary coils formed in the same metal layer are concentric and axisymmetric with respect to a diameter line passing through a planar center point. A balanced-unbalanced transformer (balun) is a type of transformer that may be used to convert an unbalanced signal to a balanced one or vice versa. An integrated circuit may include a semiconductor substrate and a transformer. Electrical elements such as transistors may be formed on the semiconductor substrate.
    • 完全对称结构的变压器包括初级线圈组件和次级线圈组件。 初级线圈组件包括形成在多个金属层中的多个初级线圈和用于连接初级线圈的第一层间连接单元。 次级线圈组件包括形成在多个金属层中的多个次级线圈和用于连接次级线圈的第二层间连接单元。 形成在同一金属层中的初级和次级线圈相对于通过平面中心点的直径线是同心的和轴对称的。 平衡 - 不平衡变压器(balun)是一种变压器,可用于将不平衡信号转换成平衡信号,反之亦然。 集成电路可以包括半导体衬底和变压器。 诸如晶体管的电气元件可以形成在半导体衬底上。
    • 6. 发明授权
    • Capacitor structure
    • 电容结构
    • US08130483B2
    • 2012-03-06
    • US12659687
    • 2010-03-17
    • Chul-Ho Chung
    • Chul-Ho Chung
    • H01G4/30
    • H01G4/228H01G4/33H01L23/5223H01L28/86H01L28/90H01L2924/0002Y10T29/43H01L2924/00
    • In a capacitor structure and method of forming the same, a first electrode, a second electrode, and a first insulation layer are sequentially formed on a substrate. The first and second electrodes and the first insulation layer are covered with a second insulation layer on the substrate. A first plug is in contact with the second electrode through the second insulation layer. A second plug is in contact with the first electrode through the first and second insulation layer. A third insulation layer is formed on the second insulation layer. Third and fourth comb-shaped electrodes are formed in the third insulation layer. The third electrode is contact with the first plug and the fourth electrode is contact with the second plug while facing the third electrode. Thus, the teeth of the comb-shaped electrodes are alternately arranged and spaced apart in the third insulation layer.
    • 在电容器结构及其形成方法中,第一电极,第二电极和第一绝缘层依次形成在基板上。 第一和第二电极和第一绝缘层被衬底上的第二绝缘层覆盖。 第一插头通过第二绝缘层与第二电极接触。 第二插头通过第一和第二绝缘层与第一电极接触。 在第二绝缘层上形成第三绝缘层。 第三和第四梳状电极形成在第三绝缘层中。 第三电极与第一插头接触,第四电极与第二插头接触,同时面向第三电极。 因此,梳状电极的齿在第三绝缘层中交替排列并间隔开。
    • 7. 发明申请
    • METHOD OF FABRICATING SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法
    • US20110183441A1
    • 2011-07-28
    • US13083309
    • 2011-04-08
    • Joo-hyun JEONGChul-ho Chung
    • Joo-hyun JEONGChul-ho Chung
    • H01L21/02
    • H01L21/76841H01L21/2855H01L23/5227H01L23/53223H01L23/53238H01L28/10H01L2924/0002H01L2924/00
    • A semiconductor device and a method of fabricating a semiconductor device that includes forming an interlayer insulating film on a semiconductor substrate; depositing a first soft magnetic thin film on the interlayer insulating film through sputtering using a target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; forming a metal film on the first soft magnetic thin film; depositing a second soft magnetic thin film on the metal film through sputtering using the same or another target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; and patterning to form an inductor.
    • 一种半导体器件和制造半导体器件的方法,包括在半导体衬底上形成层间绝缘膜; 通过使用包含Fe,Co,Ni或其合金中的至少一种的靶通过溅射,在层间绝缘膜上沉积第一软磁性薄膜,靶还含有Ti,Hf或B中的至少一种,溅射为 使用N2反应气体进行; 在第一软磁薄膜上形成金属膜; 通过溅射使用含有Fe,Co,Ni或其合金中的至少一种的相同或另一靶的溅射在金属膜上沉积第二软磁薄膜,靶还含有Ti,Hf或B中的至少一种, 使用N 2反应气体进行溅射; 并图案化以形成电感器。
    • 8. 发明授权
    • Method of fabricating semiconductor device
    • 制造半导体器件的方法
    • US08216860B2
    • 2012-07-10
    • US13083309
    • 2011-04-08
    • Joo-hyun JeongChul-ho Chung
    • Joo-hyun JeongChul-ho Chung
    • H01L21/02
    • H01L21/76841H01L21/2855H01L23/5227H01L23/53223H01L23/53238H01L28/10H01L2924/0002H01L2924/00
    • A semiconductor device and a method of fabricating a semiconductor device that includes forming an interlayer insulating film on a semiconductor substrate; depositing a first soft magnetic thin film on the interlayer insulating film through sputtering using a target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; forming a metal film on the first soft magnetic thin film; depositing a second soft magnetic thin film on the metal film through sputtering using the same or another target containing at least one of Fe, Co, Ni, or alloys thereof, the target further containing at least one of Ti, Hf, or B, the sputtering being performed using an N2 reactive gas; and patterning to form an inductor.
    • 一种半导体器件和制造半导体器件的方法,包括在半导体衬底上形成层间绝缘膜; 通过使用包含Fe,Co,Ni或其合金中的至少一种的靶通过溅射,在层间绝缘膜上沉积第一软磁性薄膜,靶还含有Ti,Hf或B中的至少一种,溅射为 使用N2反应气体进行; 在第一软磁薄膜上形成金属膜; 通过溅射使用含有Fe,Co,Ni或其合金中的至少一种的相同或另一靶的溅射在金属膜上沉积第二软磁薄膜,靶还含有Ti,Hf或B中的至少一种, 使用N 2反应气体进行溅射; 并图案化以形成电感器。
    • 9. 发明申请
    • METHOD OF FORMING CAPACITOR STRUCTURE
    • 形成电容结构的方法
    • US20120151726A1
    • 2012-06-21
    • US13401233
    • 2012-02-21
    • Chul-Ho CHUNG
    • Chul-Ho CHUNG
    • H01G7/00
    • H01G4/228H01G4/33H01L23/5223H01L28/86H01L28/90H01L2924/0002Y10T29/43H01L2924/00
    • In a capacitor structure and method of forming the same, a first electrode, a second electrode, and a first insulation layer are sequentially formed on a substrate. The first and second electrodes and the first insulation layer are covered with a second insulation layer on the substrate. A first plug is in contact with the second electrode through the second insulation layer. A second plug is in contact with the first electrode through the first and second insulation layer. A third insulation layer is formed on the second insulation layer. Third and fourth comb-shaped electrodes are formed in the third insulation layer. The third electrode is contact with the first plug and the fourth electrode is contact with the second plug while facing the third electrode. Thus, the teeth of the comb-shaped electrodes are alternately arranged and spaced apart in the third insulation layer.
    • 在电容器结构及其形成方法中,第一电极,第二电极和第一绝缘层依次形成在基板上。 第一和第二电极和第一绝缘层被衬底上的第二绝缘层覆盖。 第一插头通过第二绝缘层与第二电极接触。 第二插头通过第一和第二绝缘层与第一电极接触。 在第二绝缘层上形成第三绝缘层。 第三和第四梳状电极形成在第三绝缘层中。 第三电极与第一插头接触,第四电极与第二插头接触,同时面向第三电极。 因此,梳状电极的齿在第三绝缘层中交替排列并间隔开。