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    • 9. 发明申请
    • Noble metal precursors for copper barrier and seed layer
    • 铜屏障和种子层的贵金属前体
    • US20070207611A1
    • 2007-09-06
    • US11367160
    • 2006-03-03
    • Adrien LavoieJuan DominguezAaron Budrevich
    • Adrien LavoieJuan DominguezAaron Budrevich
    • H01L21/44
    • C23C28/00C23C28/322C23C28/34C23C28/36
    • A copper interconnect oh a semiconductor substrate comprises a dielectric layer having a trench, a noble metal layer on the dielectric layer within the trench, and a copper interconnect on the noble metal layer. The noble metal layer has a thickness that is between 3 Å and 100 Å and a density that is greater than or equal to 5 g/cm3. The copper interconnect may be formed by etching a trench into the dielectric layer, pulsing a noble metal containing precursor proximate to the semiconductor substrate, and pulsing a reactive gas proximate to the semiconductor substrate, wherein the reactive gas reacts with the precursor to form a noble metal layer on the dielectric layer. A copper layer may then be deposited atop the noble metal layer and planarized. The noble metal layer functions as a barrier to copper diffusion and provides a surface upon which the copper metal can nucleate.
    • 半导体衬底的铜互连包括具有沟槽的电介质层,沟槽内介电层上的贵金属层和贵金属层上的铜互连。 贵金属层的厚度在3埃至100埃之间,密度大于或等于5克/平方厘米。 铜互连可以通过将沟槽蚀刻到电介质层中,使靠近半导体衬底的含贵金属的前体脉冲,并且使靠近半导体衬底的反应性气体脉冲,其中反应气体与前体反应形成贵金属 电介质层上的金属层。 然后可以将铜层沉积在贵金属层上方并平坦化。 贵金属层用作铜扩散的阻挡层,并提供铜金属可以在其上成核的表面。