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    • 5. 发明申请
    • METHOD AND DEVICE FOR THE CONTACT-FREE MEASUREMENT OF THE ACTUAL POSITION AND/OR THE PROFILE OF ROUGH SURFACES
    • 用于实时位置的接触式测量和/或粗糙表面轮廓的方法和装置
    • WO1984004810A1
    • 1984-12-06
    • PCT/EP1984000152
    • 1984-05-19
    • FIRMA CARL ZEISSFERCHER, Adolf, FriedrichHU, Hong, Zhang
    • FIRMA CARL ZEISS
    • G01B11/30
    • G01B9/02007G01B9/02002G01B11/303
    • Laser light having at least two different wavelengths is directed to the surface (8) to be measured. On the path of the light beams there is arranged a ray divider (4) generating a reference light beam which is reflected on a reference plane surface (5). In the interference plane of the reflected light a frange pattern is formed amongst which a bright laser frange is selected for all wavelengths by means of a measuring diaphragm (31) of which the diameter is smaller than that of a laser frange. Behind the measuring diaphragm (21), the two wavelengths are separated from each other and the phase difference between the signals of the different wavelengths is measured. Said phase difference is transformed into a signal proportional to the distance between the measuring point and the reference surface and is displayed. It is advisable to frequency-shift the reference light beam with respect to the object light by means of a heterodyne device (7).
    • 具有至少两个不同波长的激光被引导到待测量的表面(8)。 在光束的路径上布置有产生参考光束的光线分割器(4),该参考光束被反射在参考平面(5)上。 在反射光的干涉平面中,形成一个奇异的图案,其中通过其直径小于激光轮廓的直径的测量膜(31)为所有波长选择明亮的激光器。 在测量光圈(21)的后面,两个波长彼此分离,并且测量不同波长的信号之间的相位差。 所述相位差被变换为与测量点和参考表面之间的距离成比例的信号并被显示。 建议通过外差装置(7)将参考光束相对于物体光进行频移。
    • 10. 发明专利
    • AT3087T
    • 1983-04-15
    • AT80107083
    • 1980-11-15
    • FIRMA CARL ZEISS
    • WEBER, KLAUS, DR.
    • G02B21/26G02B21/34
    • The invention contemplates an upright microscope construction and a system of interchangeable specimen holders for selective use therewith, to accommodate a variety of types and sizes of specimens, such that, whatever the inserted specimen-bearing holder, the specimen surface to be observed, whether by transmitted light or by reflected light, will be in focus, i.e., in the focal plane or effectively in the focal plane of the microscope. This result is achieved by building into the microscope stage a reference-abutment surface having a predetermined relation to the focal plane of the microscope, and by devising all holders of the interchangeable system to support their intended kinds of specimens in such relation to the part of the holder which abuts the reference-abutment surface, that the inserted holder places the desired specimen surface in the focal plane of the microscope.