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    • 87. 发明授权
    • Modulated metal removal using localized wet etching
    • 使用局部湿蚀刻调制金属去除
    • US08530359B2
    • 2013-09-10
    • US12462424
    • 2009-08-04
    • Steven T. MayerDavid W. Porter
    • Steven T. MayerDavid W. Porter
    • H01I21/302
    • H01L21/6708C23F1/08C23F1/34C25F3/12H01L21/32115H01L21/32134
    • An apparatus for wet etching metal from a semiconductor wafer comprises a wafer holder for rotating a wafer and a plurality of nozzles for applying separate flow patterns of etching liquid to the surface of the wafer. The flow patterns impact the wafer in distinct band-like impact zones. The flow pattern of etching liquid from at least one nozzle is modulated during a total etching time control the cumulative etching rate in one local etch region relative to the cumulative etching rate in one or more other local etch regions. Some embodiments include a lower etch chamber and an upper rinse chamber separated by a horizontal splash shield. Some embodiments include a retractable vertical splash shield used to prevent splashing of etching liquid onto the inside walls of a treatment container. An etch-liquid delivery system includes a plurality of nozzle flow paths having corresponding nozzle flow resistances, and a plurality of drain flow paths having corresponding drain flow resistances. Nozzle flow resistances and drain flow resistances are matched so that switching the flow from a nozzle to a corresponding drain flow path does not change the flow rate of etching liquid through other nozzles. A non-wafer-contacting measuring device measures a metal thickness on a rotating semiconductor wafer during metal wet etching by immersing a plurality of electrodes in etching liquid in close proximity to the wafer surface of the rotating wafer and determining electrical resistance between a plurality of electrodes.
    • 用于从半导体晶片湿式蚀刻金属的设备包括用于旋转晶片的晶片保持器和用于将分离的蚀刻液体的流动图案施加到晶片的表面的多个喷嘴。 流动模式影响晶片在不同的带状冲击区域。 在总腐蚀时间期间,调制来自至少一个喷嘴的蚀刻液体的流动模式,以控制一个局部蚀刻区域中相对于一个或多个其它局部蚀刻区域中的累积蚀刻速率的累积蚀刻速率。 一些实施例包括由水平防溅罩隔开的下蚀刻室和上冲洗室。 一些实施例包括用于防止蚀刻液体溅射到处理容器的内壁上的可伸缩垂直防溅屏蔽。 蚀刻液输送系统包括具有相应的喷嘴流动阻力的多个喷嘴流动路径和具有相应的漏极流动阻力的多个排出流动路径。 喷嘴流阻和排流阻力匹配,使得从喷嘴到相应的排水流路的流动不会改变通过其它喷嘴的蚀刻液的流量。 非晶片接触测量装置通过将多个电极浸入在旋转晶片的晶片表面附近的蚀刻液中来测量金属湿蚀刻期间的旋转半导体晶片上的金属厚度,并且确定多个电极之间的电阻 。