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    • 81. 发明申请
    • X-RAY SYSTEM WITH EFFICIENT ANODE HEAT DISSIPATION
    • 具有高效阳极散热的X射线系统
    • US20110051895A1
    • 2011-03-03
    • US12990814
    • 2009-05-04
    • Gereon VogtmeierRainer PietigAstrid LewalterRolf Karl Otto Behling
    • Gereon VogtmeierRainer PietigAstrid LewalterRolf Karl Otto Behling
    • H05G1/70H01J35/24B82Y99/00
    • H01J35/14A61B6/032A61B6/4021A61B6/4028A61B6/4085A61B6/4488H01J35/26H01J35/30
    • X-ray systems for use in high-resolution imaging applications with an improved power rating are provided. An X-ray source comprises at least one integrated actuator unit (206, 206′, 206a or 206b) for performing at least one translational and/or rotational displacement by moving the position of the X-ray source's anode (204, 204′, 204a′ or 204b′) relative to a stationary reference position. This helps to overcome power limitations due to an overheating of the anode at its focal ̂spot position (205). In addition to that, a focusing unit (203) for allowing an adapted focusing of the anode's focal spot (205) which compensates deviations in the focal spot size resulting from said anode displacements and/or a deflection means (211, 21 Ia or 21 Ib) for generating an electric and/or magnetic field deflecting the electron beam (202, 202a or 202b) in a direction opposite to the direction of the rotary anode's displacement movement may be provided.
    • 提供了用于具有改进的额定功率的高分辨率成像应用中的X射线系统。 X射线源包括至少一个用于通过移动X射线源的阳极(204,204'和206b)的位置来执行至少一个平移和/或旋转位移的集成致动器单元(206,206',206a或206b) 204a'或204b')。 这有助于克服由于阳极在其焦点位置(205)处的过热而引起的功率限制。 除此之外,聚焦单元(203)用于允许补偿阳极焦点(205)的适应聚焦,其补偿由所述阳极位移引起的焦点尺寸偏差和/或偏转装置(211,211a或21 可以提供用于产生沿着与旋转阳极的位移运动的方向相反的方向偏转电子束(202,202a或202b)的电和/或磁场的电流(Ib)。
    • 82. 发明申请
    • MULTIPLE ENERGY X-RAY SOURCE
    • 多种能源X射线源
    • US20110007874A1
    • 2011-01-13
    • US12866745
    • 2009-02-10
    • Gereon Vogtmeier
    • Gereon Vogtmeier
    • H05G2/00
    • H01J1/3048H01J35/065H01J2235/062H01J2235/068
    • A source (19) for multiple energy X-ray generation in particular by field emitting carbon nanotubes (1, 2) is presented. In order to achieve a spatial overlap of the trajectories of the X-ray beams coming from different emitters, a focusing unit (7, 9) is supplied to the emitted electrons (28, 29). A fast switching between the emission of the different carbon nanotubes allows multiple kilovolt imaging. Independent determination of multiple focal spot parameters by the focusing unit leads to the possibilities of fast switching between different spot geometries and spatial resolutions. This might be seen in FIG. 1.
    • 提出了用于多能量X射线产生的源(19),特别是通过场发射碳纳米管(1,2)。 为了实现来自不同发射体的X射线束的轨迹的空间重叠,聚焦单元(7,9)被提供给发射的电子(28,29)。 在不同碳纳米管的发射之间的快速切换允许多次成像。 通过聚焦单元独立确定多个焦斑参数导致不同光斑几何形状和空间分辨率之间快速切换的可能性。 这可以在图1中看出。 1。
    • 83. 发明申请
    • MULTIPLE-SOURCE IMAGING SYSTEM WITH FLAT-PANEL DETECTOR
    • 具有平板检测器的多源成像系统
    • US20100322498A1
    • 2010-12-23
    • US12864880
    • 2009-02-02
    • Herfried WieczorekGereon Vogtmeier
    • Herfried WieczorekGereon Vogtmeier
    • G06K9/00
    • A61B6/4007A61B6/032A61B6/4014A61B6/4028A61B6/4233A61B6/4447A61B6/4488
    • When performing nuclear (e.g., SPECT or PET) and CT scans on a patient, an imaging system (10) includes three or more carbon nanotube x-ray sources (20) are circumferentially spaced along an arc of a rotatable gantry (16) that spans a distance larger than a maximum cross-sectional dimension of a section of a patient (14) to be imaged. The x-ray sources are sequentially pulsed to emit x-rays for scanning a section of a patient (14) including a volume of interest (VOI) (13). Only one source (20) is in an ON state at a time to create a duty cycle, which reduces cooling time for the respective sources as well as radiation dose to the subject. X-rays traversing the patient (14) are received at a flat panel x-ray detector (22) that has a width smaller than the maximum cross-sectional dimesion, which further reduces the weight and size of the system (10).
    • 当对患者进行核(例如SPECT或PET)和CT扫描时,成像系统(10)包括三个或更多个碳纳米管x射线源(20)沿着可旋转机架(16)的圆弧沿圆周间隔开, 跨越要被成像的患者(14)的一部分的最大横截面尺寸的距离。 x射线源被顺序地脉冲以发射X射线,用于扫描包括感兴趣体积(VOI)(13)的患者(14)的一部分。 一次只有一个源(20)处于ON状态以创建占空比,这降低了各个源的冷却时间以及对被摄体的辐射剂量。 穿过患者(14)的X射线被接收在具有小于最大横截面尺寸的宽度的平板X射线检测器(22)上,这进一步减小了系统(10)的重量和尺寸。
    • 85. 发明申请
    • LOW OHMIC THROUGH SUBSTRATE INTERCONNECTION FOR SEMICONDUCTOR CARRIERS
    • 通过半导体载体的基板互连的低OHMIC
    • US20090079021A1
    • 2009-03-26
    • US12293101
    • 2007-03-16
    • Gereon VogtmeierRoger SteadmanRalf DorscheidJeroen Jonkers
    • Gereon VogtmeierRoger SteadmanRalf DorscheidJeroen Jonkers
    • H01L31/02H01L23/48H01L21/44
    • H01L21/76898H01L23/481H01L2224/0401H01L2224/05H01L2224/131H01L2924/014
    • It is described a low ohmic Through Wafer Interconnection (TWI) for electronic chips formed on a semiconductor substrate (600). The TWI comprises a first connection extending between a front surface and a back surface of the substrate (600). The first connection (610) comprises a through hole filled with a low ohmic material having a specific resistivity lower than poly silicon. The TWI further comprises a second connection (615) also extending between the front surface and the back surface. The second connection (615) is spatially separated from the first connection (610) by at least a portion of the semiconductor substrate (600). The front surface is provided with a integrated circuit arrangement (620) wherein the first connection (610) is electrically coupled to at least one node of the integrated circuit arrangement (620) without penetrating the integrated circuit arrangement (620). During processing the TWI the through hole may be filled first with a non-metallic material, e.g. poly silicon. After forming integrated components (620) on top of the front surface the substrate (600) may be thinned and the non-metallic material may be substituted with the low ohmic material, which is in particular a metallic material.
    • 描述了形成在半导体衬底(600)上的电子芯片的低欧姆通晶片互连(TWI)。 TWI包括在基板(600)的前表面和后表面之间延伸的第一连接。 第一连接(610)包括填充有低于多晶硅的比电阻率的低欧姆材料的通孔。 TWI还包括也在前表面和后表面之间延伸的第二连接(615)。 第二连接(615)通过半导体衬底(600)的至少一部分在空间上与第一连接(610)分离。 前表面设置有集成电路装置(620),其中第一连接(610)电耦合到集成电路装置(620)的至少一个节点而不穿透集成电路装置(620)。 在处理TWI期间,通孔可以首先用非金属材料填充,例如, 多晶硅。 在前表面顶部形成集成组件(620)之后,可以使衬底(600)变薄并且非金属材料可以被低欧姆材料代替,这是特别是金属材料。
    • 90. 发明申请
    • X-ray detector
    • X射线探测器
    • US20060138335A1
    • 2006-06-29
    • US10543563
    • 2004-01-22
    • Gereon VogtmeierFrancisco Morales SerranoRoger Steadman
    • Gereon VogtmeierFrancisco Morales SerranoRoger Steadman
    • G01T1/20
    • G01T1/2018
    • The invention relates to an X-ray detector for detecting X-radiation, as used, in particular, in computer tomographic (CT) systems. The X-ray detector in accordance with the invention is composed of a photo sensor device, which comprises individual detector elements (1), above which scintillator elements (2) are disposed. These convert the incident X-ray light (6) into visible or UV light (7), which is detected by a photodiode (4) located on the detector element (1). In accordance with the invention, a micro-lens (3), which focuses the light (7) departing from the scintillator element (2) onto the photodiode (4), is disposed between the scintillator element (2) and the detector element (1). It is possible, in this manner, to use large areas of the detector element (1) for further electronic components (5) outside the photodiode (4), and, at the same time, to ensure a high DQE (Detection Quantum Efficiency) in that the light (7) departing from the scintillator element (2) is virtually fully exploited. The crosstalk from scatter radiation from adjacent detector elements is effectively prevented simultaneously.
    • 本发明涉及用于检测X射线的X射线检测器,特别是在计算机断层摄影(CT)系统中使用。 根据本发明的X射线检测器由光传感器装置组成,该光传感器装置包括单独的检测器元件(1),其上设置有闪烁体元件(2)。 这些将入射的X射线光(6)转换成由位于检测器元件(1)上的光电二极管(4)检测到的可见光或紫外光(7)。 根据本发明,将从闪烁体元件(2)离开的光(7)聚焦到光电二极管(4)上的微透镜(3)设置在闪烁体元件(2)和检测器元件( 1)。 以这种方式,可以将大面积的检测器元件(1)用于在光电二极管(4)外部的另外的电子部件(5),同时,为了确保高的DQE(检测量子效率) 因为从闪烁体元件(2)出发的光(7)实际上被充分利用。 来自相邻检测器元件的散射辐射的串扰被有效地同时防止。