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    • 86. 发明授权
    • Semiconductor memory device having vertical transistors
    • 具有垂直晶体管的半导体存储器件
    • US08611122B2
    • 2013-12-17
    • US13064942
    • 2011-04-27
    • Kazuhiko Kajigaya
    • Kazuhiko Kajigaya
    • G11C5/02G11C5/06G11C11/40G11C11/401G11C11/21G11C11/24G11C11/34
    • G11C5/06G11C5/025G11C11/4097H01L27/0207H01L27/105H01L27/1052H01L27/10876H01L27/10897
    • A device includes a first region including a plurality of first memory elements and a plurality of first vertical transistors, the first vertical transistors comprising a plurality of first selective transistors and a first switching transistor, each of the first selective transistors including an upper electrode coupled to a corresponding one of the first memory elements and a lower electrode, the first switching transistor including an upper electrode and a lower electrode coupled in common to the lower electrodes of the first selective transistors through a first signal line, a second region arranged to make a first line with the first region in a first direction and including a plurality of second memory elements and a plurality of second vertical transistors, the second vertical transistors comprising a plurality of second selective transistors and a second switching transistor, and a third region sandwiched between the first and the second regions.
    • 一种器件包括包括多个第一存储器元件和多个第一垂直晶体管的第一区域,所述第一垂直晶体管包括多个第一选择晶体管和第一开关晶体管,每个第一选择晶体管包括上电极, 第一存储器元件和下电极中的相应一个,第一开关晶体管包括通过第一信号线共同连接到第一选择晶体管的下电极的上电极和下电极,第二区域被布置成使 第一线与第一区域在第一方向上并且包括多个第二存储器元件和多个第二垂直晶体管,第二垂直晶体管包括多个第二选择晶体管和第二开关晶体管,以及第三区域, 第一和第二个地区。
    • 89. 发明申请
    • Semiconductor device and control method thereof
    • 半导体装置及其控制方法
    • US20120063241A1
    • 2012-03-15
    • US13137745
    • 2011-09-09
    • Kazuhiko Kajigaya
    • Kazuhiko Kajigaya
    • G11C7/10
    • G11C11/4097G11C2207/005
    • A semiconductor device has a hierarchical bit line structure and comprises first and second local bit lines transmitting first and second signals of first and second memory cells corresponding to a selected word line, and first and second global bit lines electrically connected to the first and second local bit lines through first and second switches, first and second sense amplifiers connected to the first and second global bit lines, and a control circuit. During a first period after the first and second memory cells are simultaneously accessed, the control circuit controls the first switch to conduction state so that the first sense amplifier amplifies the first signal and controls the second switch to non conduction state. During a second period after sensing of the first sense amplifier finishes, the control circuit controls the second switch to conduction state so that the second sense amplifier amplifies the second signal.
    • 半导体器件具有分级位线结构,并且包括第一和第二本地位线,其传输与所选字线对应的第一和第二存储器单元的第一和第二信号,以及电连接到第一和第二本地的第一和第二全局位线 通过第一和第二开关的位线,连接到第一和第二全局位线的第一和第二读出放大器以及控制电路。 在同时访问第一和第二存储单元之后的第一时段期间,控制电路将第一开关控制到导通状态,使得第一读出放大器放大第一信号并将第二开关控制到非导通状态。 在感测到第一读出放大器结束之后的第二周期期间,控制电路将第二开关控制到导通状态,使得第二读出放大器放大第二信号。
    • 90. 发明授权
    • Sense amplifier circuit and semiconductor memory device
    • 感应放大器电路和半导体存储器件
    • US08068369B2
    • 2011-11-29
    • US12461858
    • 2009-08-26
    • Kazuhiko Kajigaya
    • Kazuhiko Kajigaya
    • G11C16/06
    • G11C7/067G11C11/4091G11C11/4097
    • A single-ended sense amplifier circuit amplifies a signal of a memory cell and transmitted through a bit line, and comprises first and second MOS transistors. The first MOS transistor supplies a predetermined voltage to the bit line and controls connection between the bit line and a sense node in response to a control voltage, and the second MOS transistor has a gate connected to the sense node and amplifies a signal transmitted from the bit line via the first MOS transistor. The predetermined voltage is supplied to the bit line before read operation and is set to a value such that a required voltage difference at the sense node between high and low level data of the memory cell can be obtained near a changing point between a charge transfer mode and a charge distributing mode within a range of a read voltage of the memory cell.
    • 单端读出放大器电路放大存储器单元的信号并通过位线传输,并且包括第一和第二MOS晶体管。 第一MOS晶体管向位线提供预定电压,并且响应于控制电压控制位线和感测节点之间的连接,并且第二MOS晶体管具有连接到感测节点的栅极,并且放大从 通过第一MOS晶体管的位线。 在读取操作之前将预定电压提供给位线,并将其设置为使得可以在电荷转移模式之间的变化点附近获得存储单元的高电平和低电平数据之间的感测节点处的所需电压差 以及在存储单元的读取电压范围内的电荷分配模式。