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    • 61. 发明授权
    • Integrated circuit configuration having at least one transistor and one capacitor, and method for fabricating it
    • 具有至少一个晶体管和一个电容器的集成电路配置及其制造方法
    • US06593614B1
    • 2003-07-15
    • US09716336
    • 2000-11-20
    • Franz HofmannWolfgang Krautschneider
    • Franz HofmannWolfgang Krautschneider
    • H01L27108
    • H01L27/10852H01L27/10808H01L27/10823H01L27/10876
    • A patterned conductive layer and a structure via which a transistor can be driven, e.g. a word line, are disposed one above the other. A vertical conductive structure, e.g. a spacer, connects a first source/drain region of the transistor to the conductive layer, with which it forms a first capacitor electrode which has a large effective area in conjunction with a high packing density. A capacitor dielectric is disposed over the vertical conductive structure and the conductive layer, and a second capacitor electrode is disposed over the capacitor dielectric. The vertical conductive structure may be disposed on a first sidewall of the first source/drain region and a gate electrode of the transistor may be disposed on an adjoining second sidewall of the first source/drain region. The circuit configuration may form a DRAM cell configuration.
    • 图案化的导电层和可以驱动晶体管的结构,例如, 一个字线,一个在另一个之上。 垂直导电结构,例如 间隔件将晶体管的第一源极/漏极区域连接到导电层,由此形成第一电容器电极,其具有大的有效面积并结合高的堆积密度。 电容器电介质设置在垂直导电结构和导电层之上,并且第二电容器电极设置在电容器电介质上。 垂直导电结构可以设置在第一源极/漏极区域的第一侧壁上,并且晶体管的栅电极可以设置在第一源极/漏极区域的相邻的第二侧壁上。 电路配置可以形成DRAM单元配置。
    • 63. 发明授权
    • Method of forming DRAM cell arrangement
    • 形成DRAM单元布置的方法
    • US06352894B1
    • 2002-03-05
    • US09482064
    • 2000-01-13
    • Bernd GoebelWolfgang RoesnerFranz HofmannEmmerich BertagnolliEve Marie Martin
    • Bernd GoebelWolfgang RoesnerFranz HofmannEmmerich BertagnolliEve Marie Martin
    • H01L218242
    • H01L27/10876H01L27/10808H01L27/10823Y10S257/906Y10S438/947
    • A storage cell has a number of projections of a semiconductor substrate arranged in rows and columns, neighboring rows of the projections being translation-symmetrical in relation to a y-axis which extends parallel to the columns. Each of the projections has at least one first source/drain region of a selection transistor and one channel region arranged below the first source/drain region, which is surrounded by a gate electrode annularly. A storage capacitor is connected between the first source/drain region and a bit line. The bit line as well as the storage capacitor are arranged essentially above the semiconductor substrate. Second source/drain regions of selection transistors are buried in the semiconductor substrate and connected with each other. Word lines can be formed self-justified in the form of adjacent gate electrodes. The projections can be created by etching with only one mask. The storage cell can be produced with an area of 4F2, F being the minimal structural size that can be produced in the respective technology.
    • 存储单元具有排列成行和列的半导体衬底的多个突起,相邻的一列突起相对于平行于列延伸的y轴平移对称。 每个突起具有选择晶体管的至少一个第一源极/漏极区域和布置在第一源极/漏极区域下方的一个沟道区域,其被环形的栅极电极包围。 存储电容器连接在第一源极/漏极区域和位线之间。 位线以及存储电容器基本上布置在半导体衬底的上方。 选择晶体管的第二源极/漏极区域被埋在半导体衬底中并彼此连接。 字线可以形成为相邻栅电极的形式自对称。 可以通过仅使用一个掩模的蚀刻来产生突起。 可以生产具有4F2面积的存储单元,F是可以在各自技术中生产的最小结构尺寸。