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    • 69. 发明授权
    • Magnetoresistive element and magnetic memory using the same
    • 磁阻元件和使用其的磁存储器
    • US08659103B2
    • 2014-02-25
    • US13424136
    • 2012-03-19
    • Daisuke WatanabeKatsuya NishiyamaToshihiko NagaseKoji UedaTadashi Kai
    • Daisuke WatanabeKatsuya NishiyamaToshihiko NagaseKoji UedaTadashi Kai
    • H01L29/82G11C11/02
    • H01L27/228H01L43/08H01L43/10
    • According to one embodiment, a magnetoresistive element includes the following configuration. A first magnetic layer has an invariable magnetization. A second magnetic layer has a variable magnetization. A nonmagnetic layer is provided between the first and the second magnetic layers. The first magnetic layer has a structure in which first, second and third magnetic material films and a nonmagnetic material film are stacked. The first magnetic material film is provided in contact with the nonmagnetic layer, the nonmagnetic material film is provided in contact with the first magnetic material film, the second magnetic material film is provided in contact with the nonmagnetic material film, and the third magnetic material film is provided in contact with the second magnetic material film. The second magnetic material film has a Co concentration higher than that of the first magnetic material film.
    • 根据一个实施例,磁阻元件包括以下构造。 第一磁性层具有不变的磁化。 第二磁性层具有可变磁化强度。 在第一和第二磁性层之间提供非磁性层。 第一磁性层具有堆叠第一,第二和第三磁性材料膜和非磁性材料膜的结构。 第一磁性材料膜设置成与非磁性层接触,非磁性材料膜设置成与第一磁性材料膜接触,第二磁性材料膜设置成与非磁性材料膜接触,并且第三磁性材料膜 设置成与第二磁性材料膜接触。 第二磁性材料膜的Co浓度高于第一磁性材料膜。
    • 70. 发明授权
    • Test apparatus, transmission apparatus, receiving apparatus, test method, transmission method and receiving method
    • 测试装置,传输装置,接收装置,测试方法,传输方法和接收方法
    • US08643412B2
    • 2014-02-04
    • US13026155
    • 2011-02-11
    • Daisuke Watanabe
    • Daisuke Watanabe
    • H03L7/00
    • G01R31/31932G01R31/31726
    • Provided is a test apparatus that tests a device under test, comprising a phase comparing section that compares a phase of an internal clock generated in the test apparatus and a phase of a clock superimposed on a device signal output by the device under test; an adjusting section that adjusts a phase shift amount of the internal clock with respect to the device signal, based on the phase comparison result; an acquiring section that acquires the device signal according to the internal clock whose phase shift amount with respect to the device signal is adjusted; and an inhibiting section that inhibits change of the phase shift amount based on the phase comparison result, for at least a portion of a period during which the clock is not superimposed on the device signal. Also provided is a test method relating to the test apparatus.
    • 提供了一种测试被测设备的测试装置,包括相位比较部分,其比较测试装置中产生的内部时钟的相位和叠加在由被测器件输出的器件信号上的时钟的相位; 调整部,其根据所述相位比较结果调整所述内部时钟相对于所述装置信号的相移量; 获取部,其根据调整了相对于所述装置信号的相移量的内部时钟获取所述装置信号; 以及禁止部,其在所述时钟未叠加在所述装置信号上的周期的至少一部分期间,基于所述相位比较结果,禁止所述相位偏移量的变化。 还提供了与测试装置相关的测试方法。