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    • 41. 发明授权
    • Electrically alterable non-volatile memory device
    • 电可变非易失性存储器件
    • US4780750A
    • 1988-10-25
    • US815869
    • 1986-01-03
    • Joseph G. NolanMichael A. Van BuskirkTe-Long ChiuYing K. Shum
    • Joseph G. NolanMichael A. Van BuskirkTe-Long ChiuYing K. Shum
    • H01L21/8247H01L21/8246H01L27/10H01L27/112H01L29/788H01L29/792H01L29/78
    • H01L29/7883
    • In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM ceil comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function.
    • 在本发明中,公开了电可变非易失性存储器(EANOM)单元。 EANOM ceil包括具有源极,栅极和漏极的MOS晶体管。 EANOM单元还具有两端隧道器件,其一端连接到MOS晶体管的栅极。 另一个终端标记为“T”。 隧道装置使电荷从MOS晶体管的栅极存储或去除。 在优选实施例中,公开了四端子EANOM单元。 EANOM单元的四个端子是端子T,S(MOS晶体管的源极),D(MOS晶体管的漏极)和与MOS晶体管的栅极电容耦合的端子C. EANOM单元可用于存储器电路中以提高其可靠性。 两个或多个EANOM单元串联连接并同时操作。 一个EANOM细胞的灾难性故障导致另一个EANOM细胞继续发挥功能的开路。
    • 42. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08748959B2
    • 2014-06-10
    • US12751245
    • 2010-03-31
    • Michael A. Van BuskirkChristian CaillatViktor I KoldiaevJungtae KwonPierre C. Fazan
    • Michael A. Van BuskirkChristian CaillatViktor I KoldiaevJungtae KwonPierre C. Fazan
    • H01L27/108H01L21/762
    • H01L29/1095H01L21/76264H01L27/108H01L27/10802H01L27/10891H01L29/7841
    • A semiconductor memory device is disclosed. In one particular exemplary embodiment, the semiconductor memory device includes a plurality of memory cells arranged in an array of rows and columns. Each memory cell may include a first region connected to a source line extending in a first orientation. Each memory cell may also include a second region connected to a bit line extending a second orientation. Each memory cell may further include a body region spaced apart from and capacitively coupled to a word line, wherein the body region is electrically floating and disposed between the first region and the second region. The semiconductor device may also include a first barrier wall extending in the first orientation and a second barrier wall extending in the second orientation and intersecting with the first barrier wall to form a trench region configured to accommodate each of the plurality of memory cells.
    • 公开了一种半导体存储器件。 在一个特定的示例性实施例中,半导体存储器件包括以行和列的阵列排列的多个存储器单元。 每个存储单元可以包括连接到沿第一取向延伸的源极线的第一区域。 每个存储单元还可以包括连接到延伸第二取向的位线的第二区域。 每个存储器单元还可以包括与字线间隔开并且电容耦合到字线的主体区域,其中所述主体区域电浮动并且设置在所述第一区域和所述第二区域之间。 半导体器件还可以包括在第一取向上延伸的第一阻挡壁和在第二取向上延伸并与第一阻挡壁相交的第二阻挡壁,以形成配置成容纳多个存储单元中的每一个的沟槽区。
    • 48. 发明授权
    • Drain side sensing scheme for virtual ground flash EPROM array with adjacent bit charge and hold
    • 具有相邻位充电和保持的虚拟接地闪速EPROM阵列的漏极检测方案
    • US06510082B1
    • 2003-01-21
    • US09999869
    • 2001-10-23
    • Binh Q. LePau-Ling ChenMichael A. Van BuskirkSantosh K. YachareniMichael S. C. ChungKazuhiro KuriharaShane Hollmer
    • Binh Q. LePau-Ling ChenMichael A. Van BuskirkSantosh K. YachareniMichael S. C. ChungKazuhiro KuriharaShane Hollmer
    • G11C1604
    • G11C16/0491G11C16/28
    • A system is disclosed for producing an indication of the logical state of a flash memory cell for virtual ground flash memory operations. The system comprises a bit line charge and hold circuit which is operable to apply a read sense voltage (e.g., about 1.2 volts) to a bit line associated with the drain terminal of a cell of the flash array adjacent to the cell which is sensed, wherein the applied drain terminal voltage is substantially the same as the cell sense voltage (e.g., about 1.2 volts) applied to the drain terminal bit line of the selected memory cell to be sensed. The system further includes a selective bit line decode circuit which is operable to select the bit lines of a memory cell to be sensed and the bit line of an adjacent cell, and a core cell sensing circuit which is operable to sense a core cell sense current at a bit line associated with a drain terminal of the selected memory cell to be sensed during memory read operations, and produce an indication of the flash memory cell logical state, which is substantially independent of charge sharing leakage current to an adjacent cell.
    • 公开了一种用于产生用于虚拟接地闪速存储器操作的闪存单元的逻辑状态的指示的系统。 该系统包括位线充电和保持电路,其可操作以将读取感测电压(例如,约1.2伏特)施加到与所感测的电池相邻的闪光阵列的单元的漏极端子相关联的位线, 其中所施加的漏极端子电压基本上与施加到要被感测的所选择的存储器单元的漏极端子位线的单元检测电压(例如,约1.2伏特)相同。 该系统还包括选择性位线解码电路,其可操作以选择要感测的存储器单元的位线和相邻单元的位线;以及核心单元感测电路,其可操作以感测核心单元感测电流 在与存储器读取操作期间被感测的所选择的存储器单元的漏极端子相关联的位线处,并产生闪存单元逻辑状态的指示,其基本上与相邻单元的电荷共享泄漏电流无关。