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    • 41. 发明专利
    • CUTTING DEVICE
    • JPS6451252A
    • 1989-02-27
    • JP20401787
    • 1987-08-19
    • HITACHI LTD
    • KAMATA CHIYOSHI
    • B23Q11/08B23Q11/00B24B27/06
    • PURPOSE:To prevent chips from scattering into work environment in an effective manner by enclosing the circumference of a stage where a workpiece is mounted, with a cover, while setting up a shower nozzle, for spraying water, in this cover. CONSTITUTION:Water is sprayed in every direction from all shower nozzles 12 set up in an inner wall of a cover 2, then a blade 5 is rotated at high speed, while it moves downward toward a stage 3 whereby cutting of a wafer 4 is started. At this time, a large quantity of chips 14 produced are mixed in cooling water to be fed to a cutting spot of the wafer 4 from a cooling water nozzle 9, and these chips are accelerated by high speed rotation of the blade 5 and scattered sprayfully. A part of this spray flows in a drain hole 19 by its own weight, another part flows into the hole 10 by water sprayed out of the nozzle 12 after colliding with a side wall of the cover 2, furthermore the spray floated in the cover 2 also flows into the drain hole 10 by mixing with the water out of the nozzle 12. Accordingly, these chips are in no case scattered into work environment after coming to dust.
    • 43. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPS61236130A
    • 1986-10-21
    • JP7653385
    • 1985-04-12
    • HITACHI LTD
    • KAMATA CHIYOSHIOTSUKA KANJIYAMADA TAKEO
    • H01L21/60
    • PURPOSE:To accelerate the signal processing speed while shortening the wire length by a method wherein the end of lead is extended to the circuit forming face side of a pellet while bonding to the circuit forming face of the pellet to bond the lead to the nearest bonding pad by wire bonding process. CONSTITUTION:The inner end of a lead 1 as an outer terminal is bonded to the surface of a pellet 2 as a circuit forming face using silicon rubber base bonding agent 3. Moreover the inner end and the surface are electrically connected to each other by a bonding pad 4 of the pellet 2 and a wire 5. A package 6 is formed with said elements sealed as they are with epoxy resin. In such a constitution, the end of lead 1 is extended to the position near the bonding pad 4 on the surface of pellet 2 to extremely shorten the wire 5 besides the bonding pad 4 can be mounted on the pertinent position to receive signals from each circuit element within the shortest time.
    • 44. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPS6020521A
    • 1985-02-01
    • JP12763083
    • 1983-07-15
    • HITACHI LTD
    • ISHIDA TAKASHISEKI MASATOSHISAWARA KUNIZOUEMOTO YOSHIAKIKAMATA CHIYOSHI
    • H01L21/60
    • PURPOSE:To obtain a wiring, dimensional accuracy thereof is high and resistance thereof is low, by forming the wiring on a package substrate by a multilayer wiring consisting of chromium and copper. CONSTITUTION:A wiring 4 is formed as three layer thin-film multilayer wirings consisting of a chromium layer 10 formed on a package substrate 1 after sintering through the evaporation of a thin-film, a copper layer 11 evaporated on the layer 10 in a thin-film shape and a chromium layer 12 evaporated on the layer 11 in the thin-film shape. A pedestal section 5 is composed of a copper layer 13 evaporated on the chromium layer 12 as the uppermost layer of the wiring 4 in the thin-film shape and a chromium layer 14 evaporated around the copper layer 13 in the thin-film shape. Since the wiring 4 is formed by the three layer thin- film evaporated layers of the chromium layer 10, the copper layer 11 and the chromium layer 12, the wiring 4 and the pedestal section 5 are formed with dimensional accuracy higher than a tungsten wiring formed through sintering. Accordingly, a large-sized pellet can be face-down bonded, and the resistance of the wiring 4 can be lowered by the presence of the copper layer 11.
    • 47. 发明专利
    • SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • JPH03195049A
    • 1991-08-26
    • JP33603289
    • 1989-12-25
    • HITACHI LTD
    • KAMATA CHIYOSHI
    • H01L23/12H01L23/66H01L25/00H01P5/02H01P5/08
    • PURPOSE:To realize a high band of a signal frequency transmitted in a signal transmission line inside a package by a method wherein a specific adjustment impedance is installed at the inside of the package which houses a semiconductor chip. CONSTITUTION:A thick-film resistance 9 having a prescribed impedance is arranged near a package interconnection 6 formed at the outer circumference part of a substrate 2 so as to be nearly parallel with the package interconnection 6. The thick-film resistance 9 is a characteristic impedance of the package interconnection 6 and an adjustment impedance which compensates the mismatching to a terminal impedance of a signal transmission line. The thick- film resistance 9 is arranged one by one near all package interconnections 6 through which an input/output signal is transmitted out of a plurality of package interconnections 6; it is connected in parallel with the package interconnection 6 via bonding wires 10. Thereby, since the reflection of a signal and the waveform distortion at a terminal part are reduced, a transmission frequency of the signal transmission line inside a package can be made a high band.
    • 48. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPH03106047A
    • 1991-05-02
    • JP24452989
    • 1989-09-20
    • HITACHI LTD
    • KAMATA CHIYOSHI
    • H01L21/60H01L23/12
    • PURPOSE:To prevent the deterioration of a waveform by a method wherein a transmission line for making an exchange of an electrical signal with one terminal provided on a semiconductor chip is constituted into a hierarchical structure consisting of two layers or more and the upper and lower layer transmission lines of the transmission line are connected to each other by at least two pieces or more of connection conductors. CONSTITUTION:One end of a bonding wire 2 is connected to a bonding pad formed on a semiconductor chip 1. A transmission line 13 constituted into a two-layer hierarchical structure is connected to the other end of the wire 2. This line 13 constituted into a two-layer hierarchical structure is constituted of upper and lowe layer transmission lines 31 and 32 and via metals 41 and 42, which are connected with the lines 31 and 32 at both ends of each via metal. That is, as the line 13 is constituted into a two-layer hierarchical structure and the lines 31 and 32 are provided in such a way that they are connected to each other by two pieces of the metals 41 and 42, a transmission path can be made into two kinds like transmission paths A and B. Thereby, the deterioration of a waveform stops generating.
    • 49. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPH02198158A
    • 1990-08-06
    • JP1613589
    • 1989-01-27
    • HITACHI LTD
    • KAMATA CHIYOSHI
    • H01L23/12H01L23/50H01P5/02H01P5/08
    • PURPOSE:To improve the reliability of a high speed semiconductor device by a method wherein a plurality of wiring conductors, or plurality of other wiring conductors formed in a substrate so as to surround the former wiring conductors, a semiconductor chip, wires, metal films and a metal cap for sealing conductors are provided. CONSTITUTION:Outer constant potential wirings 7, inner constant potential wirings 5 and a metal film 2 are connected to each other with connection wirings 11 in a substrate 100. The top ends of the inner constant potential wirings 6 are connected to a cap 8 through metal films 9 on the surface of the substrate 100. The predetermined one of the inner constant potential wirings 6 is connected to a bonding pad on a semiconductor chip 1 for supplying a constant potential through a bonding wire 3. If the respective distances between a signal wiring 5 and the outer constant potential wirings 7, the inner constant potential wirings 6 and the metal film 2 are adjusted, various values of the impedance of the signal wiring 5 can be predelermined. With this constitution, a wiring structure suitable for microwave transmission can be obtained and the reliability of a high speed semiconductor device can be improved.