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    • 36. 发明授权
    • Ground structure for page read and page write for flash memory
    • Flash存储器的页面读取和页面写入的接地结构
    • US06859393B1
    • 2005-02-22
    • US10264387
    • 2002-10-04
    • Tien-Chun YangShigekazu YamadaMing-Huei ShiehPau-Ling Chen
    • Tien-Chun YangShigekazu YamadaMing-Huei ShiehPau-Ling Chen
    • G11C16/04
    • G11C16/0466G11C16/0491G11C2216/14
    • A ground structure for page read and page write for flash memory. An array structure of flash memory cells comprises a plurality of sectors. Each sector comprises I/O blocks plus reference arrays and an array of redundant cells. Each I/O block comprises sub I/O blocks. Each sub I/O block within an I/O block, as well as other structures including reference cells, redundant cells and edge structures is coupled to a unique ground reference signal. These unique ground reference signals may be selectively coupled to a system ground or a biased ground reference. This novel ground arrangement enables a page read operation in which one bit from each sub I/O block can be read simultaneously. In addition, one bit from each I/O block may be programmed simultaneously. Further, the ground reference voltage for cells of the array may be selectively adjusted to optimize operation.
    • 用于闪存的页面读取和页面写入的接地结构。 闪存单元的阵列结构包括多个扇区。 每个扇区包括I / O块加参考阵列和冗余单元阵列。 每个I / O块包括子I / O块。 I / O块内的每个子I / O块以及包括参考单元,冗余单元和边缘结构的其他结构都耦合到独特的接地参考信号。 这些独特的接地参考信号可以选择性地耦合到系统接地或偏置的接地参考。 这种新颖的接地布置使得能够同时读取来自每个子I / O块的一个位的页面读取操作。 另外,每个I / O块的一位可以同时编程。 此外,可以选择性地调整阵列的单元的接地参考电压以优化操作。
    • 37. 发明授权
    • Path gate driver circuit
    • 路径驱动电路
    • US06728160B1
    • 2004-04-27
    • US10243433
    • 2002-09-12
    • Tien-Chun YangKurihara KazuhiroPau-Ling Chen
    • Tien-Chun YangKurihara KazuhiroPau-Ling Chen
    • G11C800
    • G11C16/24G11C7/1051G11C7/12
    • A path gate driver circuit of the present invention includes a shunt stage, a level shifter stage, a pull-up stage, and an output stage. The shunt stage has a control terminal coupled to a supply, and an input terminal coupled to a control signal path. The level shifter stage has a first control terminal coupled to the control signal path, a second control terminal coupled to an output terminal of the shunt stage, a first input terminal coupled to a boost-low supply, and a second input terminal coupled to a boost-high supply. The pull-up stage has a control terminal coupled to an output terminal of the level shifter stage, and an input terminal coupled to the boost-high supply. The output stage has a first control terminal coupled to the output terminal of the shunt stage and an output terminal of the pull-up stage, a second control terminal coupled to the control signal path a first input terminal coupled to the boost-low supply, and a second input terminal coupled to the boost-high supply. A boosted control signal is provided at the output terminal of the output stage in response to the control.
    • 本发明的路径栅极驱动电路包括分路级,电平转换级,上拉级和输出级。 分流级具有耦合到电源的控制端子和耦合到控制信号路径的输入端子。 电平移位器级具有耦合到控制信号路径的第一控制端,耦合到并联级的输出端的第二控制端,耦合到升压低电源的第一输入端和耦合到 增加高的供应。 上拉级具有耦合到电平移位器级的输出端子的控制端子和耦合到升压高电源的输入端子。 输出级具有耦合到并联级的输出端和上拉级的输出端的第一控制端,耦合到控制信号路径的第二控制端,耦合到升压低电源的第一输入端, 以及耦合到所述升压高电源的第二输入端子。 响应于该控制,在输出级的输出端提供升压控制信号。
    • 38. 发明授权
    • Sensing circuit, memory device and data detecting method
    • 感应电路,存储器和数据检测方法
    • US09437257B2
    • 2016-09-06
    • US13765513
    • 2013-02-12
    • Tien-Chun YangYue-Der ChihChan-Hong ChernTao Wen Chung
    • Tien-Chun YangYue-Der ChihChan-Hong ChernTao Wen Chung
    • G11C11/34G11C7/00G11C7/02G11C7/06G11C7/14G11C13/00
    • G11C7/062G11C7/14G11C13/004G11C2207/063
    • A sensing circuit includes a sensing resistor, a reference resistor and a comparator. The comparator has a first input coupled to the sensing resistor, a second input coupled to the reference resistor, and an output. The first input is configured to be coupled to a data bit line associated with a memory cell to receive a sensing input voltage caused by a cell current of the memory cell flowing through the sensing resistor. The second input is configured to be coupled to a reference bit line associated with a reference cell to receive a sensing reference voltage caused by a reference current of the reference cell flowing through the reference resistor. The comparator is configured to generate, at the output, an output signal indicating a logic state of data stored in the memory cell based on a comparison between the sensing input voltage and the sensing reference voltage.
    • 感测电路包括感测电阻器,参考电阻器和比较器。 比较器具有耦合到感测电阻器的第一输入端,耦合到参考电阻器的第二输入端和输出端。 第一输入被配置为耦合到与存储器单元相关联的数据位线,以接收由流过感测电阻器的存储单元的单元电流引起的感测输入电压。 第二输入被配置为耦合到与参考单元相关联的参考位线,以接收由参考电池流过参考电阻器的参考电流引起的感测参考电压。 比较器被配置为基于感测输入电压和感测参考电压之间的比较,在输出处产生指示存储在存储器单元中的数据的逻辑状态的输出信号。
    • 39. 发明授权
    • Charge pump doubler
    • 电荷泵倍增器
    • US08324960B2
    • 2012-12-04
    • US12849503
    • 2010-08-03
    • Ming-Chieh HuangChan-Hong ChernChih-Chang LinTien-Chun YangYuwen Swei
    • Ming-Chieh HuangChan-Hong ChernChih-Chang LinTien-Chun YangYuwen Swei
    • G05F1/10G05F3/02
    • H02M3/07
    • An integrated circuit includes a first PMOS transistor, where its drain is arranged to be coupled to a voltage output, and its source is coupled to the drain of a second PMOS transistor. The source of the second PMOS transistor is arranged to be coupled to a high power supply voltage. The source and drain of a MOS capacitor are coupled to the source of the first PMOS transistor. The drain of an NMOS transistor is coupled to the drain of the first PMOS transistor. The integrated circuit is configured to receive a voltage input to generate the voltage output having a maximum voltage higher than the voltage input. The gate oxide layer thickness of the MOS capacitor is less than that of the first PMOS transistor.
    • 集成电路包括第一PMOS晶体管,其中其漏极被布置成耦合到电压输出,并且其源极耦合到第二PMOS晶体管的漏极。 第二PMOS晶体管的源极被布置成耦合到高电源电压。 MOS电容器的源极和漏极耦合到第一PMOS晶体管的源极。 NMOS晶体管的漏极耦合到第一PMOS晶体管的漏极。 集成电路被配置为接收电压输入以产生具有高于电压输入的最大电压的电压输出。 MOS电容器的栅氧化层厚度小于第一PMOS晶体管的栅极氧化层厚度。