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    • 31. 发明申请
    • SOLID-STATE IMAGE SENSOR AND METHOD FOR PRODUCING THE SAME
    • 固态图像传感器及其制造方法
    • US20100176423A1
    • 2010-07-15
    • US12676520
    • 2008-09-04
    • Shigetoshi SugawaYasushi KondoHideki Tominaga
    • Shigetoshi SugawaYasushi KondoHideki Tominaga
    • H01L31/14H01L31/18H01L31/0352
    • H04N5/335H01L27/14603H01L27/14609H01L27/14612H01L27/14645H01L27/14689H04N5/374H04N5/37452H04N5/378
    • A floating diffusion (331) is created substantially at center of the light-receiving surface of an embedded photodiode (31), with a gate electrode of a transfer transistor (32) surrounding the floating diffusion. The concentration (or depth) of impurities in a p+-type semiconductor region, n-type semiconductor region or p-well region is changed in an inclined form so that a potential gradient being inclined downwards from the circumference to the center is created when an appropriate bias voltage is applied to the pn junction. The photocharges produced by incident light are rapidly moved along the potential gradient toward the center. Even in the case where the photocharge storage time is short, the photocharges can be efficiently collected since the maximum moving distance from the circumference of the photodiode (31) to the floating diffusion (331). Thus, the photocharges produced by the photodiode (31) are efficiently utilized, whereby the detection sensitivity is improved.
    • 基本上在嵌入式光电二极管(31)的光接收表面的中心处形成浮动扩散(331),其中传输晶体管(32)的栅电极围绕浮动扩散。 p +型半导体区域,n型半导体区域或p阱区域中的杂质的浓度(或深度)以倾斜形式改变,使得当从圆周向中心倾斜的电位梯度当 适当的偏置电压施加到pn结。 由入射光产生的光电荷沿电势梯度快速移动到中心。 即使在光电荷存储时间短的情况下,由于从光电二极管(31)的周边到浮动扩散(331)的最大移动距离,也可以有效地收集光电荷。 因此,有效地利用由光电二极管(31)产生的光电荷,从而提高检测灵敏度。
    • 36. 发明申请
    • SOLID STATE IMAGE PICKUP DEVICE AND MANUFACTURING METHOD THEREFOR
    • 固态图像拾取器件及其制造方法
    • US20070257281A1
    • 2007-11-08
    • US11773731
    • 2007-07-05
    • TORU KOIZUMIShigetoshi SugawaIsamu UenoTesunobu KochiKatsuhito SakuraiHiroki Hiyama
    • TORU KOIZUMIShigetoshi SugawaIsamu UenoTesunobu KochiKatsuhito SakuraiHiroki Hiyama
    • H01L31/06
    • H01L27/14806H01L27/14609H01L27/14643H01L27/14689H01L31/035281Y02E10/50
    • MOS-type solid-state image pickup device includes a photoelectric conversion unit having a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type forming a pn-junction with the first semiconductor region, a third semiconductor region of the first conductivity type disposed at a light incident side of the second semiconductor region, and a transfer MOS transistor having the second semiconductor region, a fourth semiconductor region of the second conductivity type, and a gate electrode disposed on an insulating film on the first semiconductor region between the photoelectric conversion unit and the fourth semiconductor region to transfer a charge carrier from the second semiconductor region to the fourth semiconductor region. The photoelectric conversion unit and the transfer MOS transistor are disposed on a substrate. A fifth semiconductor region of the second conductivity type is arranged continuously to the second semiconductor region under the gate electrode, and a sixth semiconductor region of the second conductivity type having an impurity concentration lower than that of the fourth semiconductor region is arranged at a side of the gate electrode in the fourth semiconductor region. A drain of the transfer MOS transistor includes the fourth and sixth semiconductor regions, and a bias is applied to the drain, and the fifth semiconductor region is depleted during reading out the charge carrier from the second semiconductor region.
    • MOS型固态摄像装置包括:具有第一导电类型的第一半导体区域的第一半导体区域的第二半导体区域和与该第一半导体区域形成pn结的第二导电类型的第二半导体区域的光电转换单元, 设置在第二半导体区域的光入射侧的第一导电类型和具有第二半导体区域的转移MOS晶体管,第二导电类型的第四半导体区域和设置在第一半导体上的绝缘膜上的栅电极 区域,以将电荷载体从第二半导体区域转移到第四半导体区域。 光电转换单元和转移MOS晶体管设置在基板上。 第二导电类型的第五半导体区域被连续配置到栅极下方的第二半导体区域,并且具有比第四半导体区域低的杂质浓度的第二导电类型的第六半导体区域被布置在 在第四半导体区域中的栅电极。 转移MOS晶体管的漏极包括第四和第六半导体区域,并且偏置被施加到漏极,并且在从第二半导体区域读出电荷载流子期间,第五半导体区域被耗尽。