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    • 33. 发明授权
    • Method for designing an integrated circuit having multiple voltage domains
    • 用于设计具有多个电压域的集成电路的方法
    • US07000214B2
    • 2006-02-14
    • US10707068
    • 2003-11-19
    • Joseph A. IadanzaRaminderpal SinghSebastian T. VentroneIvan L. Wemple
    • Joseph A. IadanzaRaminderpal SinghSebastian T. VentroneIvan L. Wemple
    • G06F17/50
    • G06F17/5045
    • A method for designing an integrated circuit having multiple voltage domains, including: (a) generating a logical integrated circuit design from information contained in a high-level design file, the high-level design file defining global connection declarations and voltage domain connection declarations; (b) synthesizing the logical integrated circuit design into a synthesized integrated circuit design based upon the logical integrated circuit design, information in a preferred components file and information in a voltage domain definition file; (c) generating a noise model from the synthesized integrated circuit design based on information in the voltage domain definition file and a design constraint file; and (d) simulating the noise model against constraints in the design constraint file and constraints in a circuit level profile file to determine if the synthesized integrated circuit design meets predetermined noise simulation targets.
    • 一种用于设计具有多个电压域的集成电路的方法,包括:(a)从包含在高级设计文件中的信息,定义全局连接声明和电压域连接声明的高级设计文件生成逻辑集成电路设计; (b)基于逻辑集成电路设计,优选组件文件中的信息和电压域定义文件中的信息,将逻辑集成电路设计合成为合成集成电路设计; (c)基于电压域定义文件和设计约束文件中的信息从合成的集成电路设计中产生噪声模型; 和(d)根据设计约束文件中的约束和电路级配置文件中的约束模拟噪声模型,以确定合成的集成电路设计是否满足预定的噪声模拟目标。
    • 35. 发明申请
    • SYSTEM AND METHOD FOR BALANCING DELAY OF SIGNAL COMMUNICATION PATHS THROUGH WELL VOLTAGE ADJUSTMENT
    • 通过良好的电压调整来平衡信号通信的延迟的系统和方法
    • US20080240222A1
    • 2008-10-02
    • US12136359
    • 2008-06-10
    • Hayden C. CranfordJoseph A. IadanzaSebastian T. Ventrone
    • Hayden C. CranfordJoseph A. IadanzaSebastian T. Ventrone
    • G01R31/28H03K5/159H03H7/40H03H7/30
    • H03K5/133H03K2005/00032
    • A method of balancing signal interconnect path delays between an analog domain and a digital domain of an integrated circuit includes applying a test signal to a selected one of a plurality of communication paths between the analog domain and the digital domain. A rising edge delay and a falling edge delay of the test signal is equalized by adjusting a body bias voltage of a delay element configured within the selected communication path. A rising edge delay and a falling edge delay for each of the remaining communication paths is compared with the equalized rising edge delay and falling edge delay of the selected communication path, and a body bias voltage for one or more of a plurality of delay elements configured within each of the remaining communication paths is adjusted until corresponding rising and falling edge delays thereof match the equalized rising edge delay and falling edge delay of the selected communication path.
    • 在集成电路的模拟域和数字域之间平衡信号互连路径延迟的方法包括将测试信号应用于模拟域和数字域之间的多个通信路径中的所选择的一个。 通过调整配置在所选择的通信路径内的延迟元件的体偏置电压来平衡测试信号的上升沿延迟和下降沿延迟。 将每个剩余通信路径的上升沿延迟和下降沿延迟与所选择的通信路径的均衡的上升沿延迟和下降沿延迟进行比较,并且配置多个延迟元件中的一个或多个的体偏置电压 在每个剩余的通信路径内进行调整,直到相应的上升沿和下降沿延迟与所选通信路径的均衡上升沿延迟和下降沿延迟相匹配。
    • 38. 发明授权
    • System and method for AC performance tuning by thereshold voltage shifting in tubbed semiconductor technology
    • 通过液晶半导体技术中的阈值电压偏移进行交流性能调谐的系统和方法
    • US06487701B1
    • 2002-11-26
    • US09711744
    • 2000-11-13
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • G06F1750
    • G01R31/3163G01R31/2891
    • A system and method are described for separating the bulk connections for FETs on a semiconductor wafer from the supply rails, testing the wafer to determine if a shift in the threshold voltage, VT, of certain devices within the wafer, as defined by the bulk-wells, can remove an AC defect in the IC circuit, and tailoring the voltage or voltages applied to the bulk nodes, post-manufacture, such that the integrated circuit meets its performance targets or is sorted to a more valuable performance level. The method requires generating a gate level netlist of the IC's circuitry and performing timing calculations on these circuit netlists using static timing analyses, functional delay simulations, circuit activity analyses, and functional performance testing. The failures are then correlated to respective IC circuits, worst case slack circuits are investigated, and proposed changes to the threshold voltages are employed in the hardware.
    • 描述了一种系统和方法,用于将半导体晶片上的FET的体连接与电源轨分开,测试晶片以确定晶片内的某些器件的阈值电压VT是否偏移, 孔可以去除IC电路中的AC缺陷,并且定制施加到散装节点的电压或电压,后制造,使得集成电路满足其性能目标或被分类到更有价值的性能水平。 该方法需要生成IC电路的门级网表,并使用静态时序分析,功能延迟模拟,电路活动分析和功能性能测试来对这些电路网表执行定时计算。 然后将故障与相应的IC电路相关联,最坏情况下调查松弛电路,并且在硬件中采用提出的阈值电压的改变。