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    • 33. 发明授权
    • Inspection apparatus and method for producing image for inspection
    • 用于检查图像的检查装置和方法
    • US08730318B2
    • 2014-05-20
    • US13160108
    • 2011-06-14
    • Kenji NakahiraAtsushi MiyamotoNaoki HosoyaMinoru Yoshida
    • Kenji NakahiraAtsushi MiyamotoNaoki HosoyaMinoru Yoshida
    • H04N9/47H04N5/235G06K9/00
    • H04N5/265H04N5/217H04N5/2628H04N7/183
    • In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
    • 为了在高辐射环境下使用光学摄像机的检查中的辐射噪声获得质量图像而不劣化,检查装置由图像拾取单元,图像获取单元,其获取包含 信号(噪声),其基本上独立于由图像拾取单元获得的每个帧;局部对准单元,其对具有不同时间相位的帧进行局部对准,以形成由图像获取单元获取的图像;帧合成单元, 由本地对准单元对准的多个帧,用于产生SN比高于帧合成之前的帧的SN比的合成帧;以及图像输出单元,用于显示或记录由帧生成的合成帧形成的图像 合成单位。
    • 35. 发明申请
    • Inspection Apparatus and Method for Producing Image for Inspection
    • 检验仪器及其检测方法
    • US20120026317A1
    • 2012-02-02
    • US13160108
    • 2011-06-14
    • Kenji NAKAHIRAAtsushi MiyamotoNaoki HosoyaMinoru Yoshida
    • Kenji NAKAHIRAAtsushi MiyamotoNaoki HosoyaMinoru Yoshida
    • H04N7/18
    • H04N5/265H04N5/217H04N5/2628H04N7/183
    • In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
    • 为了在高辐射环境下使用光学摄像机的检查中的辐射噪声获得质量图像而不劣化,检查装置由图像拾取单元,图像获取单元,其获取包含 信号(噪声),其基本上独立于由图像拾取单元获得的每个帧;局部对准单元,其对具有不同时间相位的帧进行局部对准,以形成由图像获取单元获取的图像;帧合成单元, 由本地对准单元对准的多个帧,用于产生SN比高于帧合成之前的帧的SN比的合成帧;以及图像输出单元,用于显示或记录由帧生成的合成帧形成的图像 合成单位。
    • 36. 发明申请
    • METHOD AND DEVICE FOR DEFECT INSPECTION
    • 缺陷检查的方法和装置
    • US20110188735A1
    • 2011-08-04
    • US13057782
    • 2009-06-05
    • Naoki HosoyaToshifumi HondaTakashi Hiroi
    • Naoki HosoyaToshifumi HondaTakashi Hiroi
    • G06K9/00
    • G01N21/956G01N2223/6116G06T7/0004G06T7/001G06T2207/10061G06T2207/30148
    • Provided are a method and a device for defect inspection, wherein, in a state where a few DOIs exist in a large number of nuisances, a classification performance can be improved by a few appropriate defect instructions and a high classification performance is ensured while mitigating the burden of user's defect instructions. The method and device for defect inspection is characterized by repeating extraction of one or more defects from a plurality of defects detected by imaging a sample, instruction of a classification class of the extracted defects, and calculation of a classification criterion and a classification performance from the image information and classification class of the defects, and determining, based on the finally obtained classification criterion, the classification class of the unknown defects. This makes it possible to improve a classification performance by a few appropriate defect instructions and ensure a high classification performance while mitigating the burden of user's defect instructions.
    • 提供了一种用于缺陷检查的方法和装置,其中,在少数DOI存在大量滋扰的状态下,可以通过少量适当的缺陷指令来提高分类性能,并且在减轻分类性能的同时确保高分类性能 用户的缺陷指示负担。 用于缺陷检查的方法和装置的特征在于,从通过成像样本检测到的多个缺陷中重复提取一个或多个缺陷,提取的缺陷的分类等级的指令,以及来自所述缺陷的分类标准和分类性能的计算 图像信息和分类类的缺陷,并根据最终获得的分类标准确定未知缺陷的分类等级。 这使得可以通过几个适当的缺陷指令提高分类性能,并确保高分类性能,同时减轻用户缺陷指令的负担。
    • 39. 发明申请
    • Bottled beverage
    • 瓶装饮料
    • US20070092624A1
    • 2007-04-26
    • US10582873
    • 2004-09-10
    • Masaki IwasakiEiichi HoshinoNaoki HosoyaShinji Yamamoto
    • Masaki IwasakiEiichi HoshinoNaoki HosoyaShinji Yamamoto
    • A23F3/00
    • A23F3/163A23L2/38A23L2/52A23V2002/00A23V2250/2116
    • A packaged beverage of pH 2 to 6 with a green tea extract mixed therein, comprising the following ingredients (A) to (E) (A) from 0.01 to 1.0 wt % of non-polymer catechins, (B) quinic acid or a salt thereof, (C) from 0.0001 to 15 wt % of a sweetener, (D) from 0.001 to 0.5 wt % of sodium ions, and (E) from 0.001 to 0.2 wt % of potassium ions, wherein a content weight ratio [(B)/(A)] of said quinic acid or salt thereof (B) to said non-polymer catechins (A) is from 0.0001 to 0.5. The packaged beverage contains catechins at high concentration, is reduced in bitterness and astringency and is suited for long-term drinking, is excellent in the stability of bitterness and astringency and also in the feeling when it is swallowed, and further, remains stable in color tone even when filled in a clear container and stored at high temperatures.
    • 将混合有绿茶提取物的pH为2〜6的包装饮料,含有0.01〜1.0重量%的非聚合型儿茶素的以下成分(A)〜(E)(A),(B)奎宁酸或其盐 ,(C)0.0001〜15重量%的甜味剂,(D)0.001〜0.5重量%的钠离子,(E)0.001〜0.2重量%的钾离子,其中含量重量比[(B 所述奎宁酸或其盐(B))与所述非聚合型儿茶素类(A)的比例为0.0001〜0.5。 包装饮料含有高浓度的儿茶素类,减少苦味和涩味,适合长期饮用,苦味和涩味的稳定性以及吞咽感觉优异,而且颜色保持稳定 即使填充在清澈的容器中并在高温下储存也可以使用。
    • 40. 发明授权
    • Method and apparatus for analyzing composition of defects
    • 分析缺陷组成的方法和装置
    • US06870169B2
    • 2005-03-22
    • US10735575
    • 2003-12-11
    • Kenji ObaraYuji TakagiHisae ShibuyaNaoki Hosoya
    • Kenji ObaraYuji TakagiHisae ShibuyaNaoki Hosoya
    • G01N23/225G01Q30/02G01R31/26G06T7/00H01J37/147H01J37/252H01L21/66
    • G06T7/0004G06T2207/30148
    • In order to be able to detect an irradiation position of an electron beam matching a defect position and conduct composition analysis of a defect with high precision and high efficiency, in the present invention, when a composition analysis target defect is selected and irradiation conditions of the electron beam are set for EDX analysis, a low-resolution reference image of low resolution is acquired using the electron beam at a defect corresponding position corresponding to the position of this defect on a chip in the vicinity of a target chip including defects, and a low-resolution defect image of the same low resolution is next acquired at the defect position of the target chip. Then, by comparing these low-resolution images, the defect position is acquired, the electron beam is slanted and irradiated on this defect position to acquire a composition spectrum of the defect.
    • 为了能够检测匹配缺陷位置的电子束的照射位置并且以高精度和高效率进行缺陷的组成分析,在本发明中,当选择组成分析目标缺陷并且 电子束被设置用于EDX分析,使用电子束在与包括缺陷的目标芯片附近的芯片上的该缺陷的位置相对应的缺陷对应位置处采集低分辨率的低分辨率参考图像,并且 接下来在目标芯片的缺陷位置获取相同低分辨率的低分辨率缺陷图像。 然后,通过比较这些低分辨率图像,获取缺陷位置,电子束被倾斜并照射在该缺陷位置以获得缺陷的组成谱。