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    • 31. 发明授权
    • Semiconductor memory device and driving method of semiconductor memory device
    • 半导体存储器件及半导体存储器件的驱动方法
    • US07480198B2
    • 2009-01-20
    • US11680999
    • 2007-03-01
    • Katsuyuki Fujita
    • Katsuyuki Fujita
    • G11C7/00
    • G11C7/065G11C7/12G11C7/18G11C11/404G11C11/4085G11C11/4091G11C11/4094G11C11/4097G11C2207/002G11C2207/005G11C2207/2281G11C2211/4016
    • This disclosure concerns a semiconductor memory device comprising memory cells; word lines connected to gates of the memory cells; bit lines connected to drains or sources of the memory cells and transmitting data of the memory cells; sense nodes connected to the bit lines and transmitting data of the memory cells; transfer gates connected to between the bit lines and the sense nodes; and latch circuits latching data to the sense nodes, wherein in a data read operation, a selection word line is in an inactive state during a latch period which is from immediately before the latch circuits start a data latch operation until when the transfer gate disconnects the bit lines from the sense nodes after the latch operation, the selection word line being one of the word lines and being connected to selection memory cells from which data is to be read to the sense nodes.
    • 本公开涉及包括存储器单元的半导体存储器件; 连接到存储器单元的门的字线; 连接到存储器单元的漏极或源极的位线,并传送存储器单元的数据; 连接到位线的感测节点和发送存储器单元的数据; 连接到位线和感测节点之间的传输门; 并且锁存电路将数据锁存到感测节点,其中在数据读取操作中,在从锁存电路开始数据锁存操作之前的锁存时段期间,选择字线处于非活动状态,直到传输门断开 在锁存操作之后,来自感测节点的位线,选择字线是字线之一,并且连接到选择存储器单元,数据将从其读取到感测节点。
    • 32. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20060044794A1
    • 2006-03-02
    • US11056243
    • 2005-02-14
    • Kosuke HatsudaTakashi OhsawaKatsuyuki Fujita
    • Kosuke HatsudaTakashi OhsawaKatsuyuki Fujita
    • F21S2/00
    • G11C7/14G11C11/404G11C11/4091G11C11/4099G11C2211/4016
    • A semiconductor memory device comprises memory cells that store data by accumulating or discharging an electric charge; memory cell arrays that have a plurality of the memory cells disposed in a matrix; a plurality of word lines that are connected to the memory cells arrayed in rows of the memory cell arrays; a plurality of bit lines that are connected to the memory cells arrayed in columns of the memory cell arrays; a plurality of dummy cells that are arrayed in a row direction of the memory cell arrays and are connected to the bit lines; sense amplifiers that detect data within the memory cells by using an average value of electric characteristics of the dummy cells that plurality of switching elements that electrically connect four or more of the bit lines in order to generate the reference signal.
    • 半导体存储器件包括通过累积或放电来存储数据的存储器单元; 具有设置在矩阵中的多个存储单元的存储单元阵列; 连接到排列在存储单元阵列中的存储单元的多个字线; 连接到排列在存储单元阵列的列中的存储单元的多个位线; 多个虚拟单元,其被布置在存储单元阵列的行方向上并连接到位线; 读出放大器,通过使用电连接四个或更多个位线的多个开关元件的虚拟单元的电特性的平均值来检测存储单元内的数据,以便产生参考信号。
    • 34. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06567330B2
    • 2003-05-20
    • US10102981
    • 2002-03-22
    • Katsuyuki FujitaTakashi Ohsawa
    • Katsuyuki FujitaTakashi Ohsawa
    • G11C702
    • G11C7/06
    • A semiconductor memory device has a memory cell array including memory cells; a reference current generating circuit which generates a reference current; a reference voltage generating circuit which generates a reference voltage in a reference node on the basis of the reference current generated by the reference current generating circuit; a first sense circuit which generates an output current on the basis of a cell current of the selected memory cell and which generates a data potential in a sense node on the basis of the output current and the reference current; and a second sense circuit which detects the data held in the selected memory cell by comparing the data potential in the sense node with the reference voltage in the reference node.
    • 半导体存储器件具有包括存储单元的存储单元阵列; 产生参考电流的参考电流产生电路; 参考电压产生电路,其基于由参考电流产生电路产生的参考电流在参考节点中产生参考电压; 第一感测电路,其基于所选存储单元的单元电流产生输出电流,并且基于输出电流和参考电流在感测节点中产生数据电位; 以及第二感测电路,通过将感测节点中的数据电位与参考节点中的参考电压进行比较来检测保持在所选择的存储器单元中的数据。
    • 36. 发明授权
    • Semiconductor storage device
    • 半导体存储设备
    • US08498145B2
    • 2013-07-30
    • US13205094
    • 2011-08-08
    • Katsuyuki FujitaYoshihiro Ueda
    • Katsuyuki FujitaYoshihiro Ueda
    • G11C11/00
    • G11C8/10G11C5/025G11C7/14G11C8/08G11C11/1659G11C11/1675
    • A memory includes bit lines, word lines, and memory cells connected between first and second BLs. The cells arranged in an extending direction of the BLs constitute columns. The second BL is shared between two columns. The cells in a first pair of columns are arranged to be shifted in the extending direction of the BLs by a half-pitch from the cells in a second pair of columns. The device includes a dummy cell having an equal distance from the adjacent memory elements. Further, the device includes a row decoder driving the cells in the first pair of columns by driving paired word lines, and driving the cells in the second pair of columns by driving paired word lines. Each cell includes selection transistors. The selection transistors are connected in parallel between the memory element and the first BL. Gates of the transistors are connected to different WLs.
    • 存储器包括连接在第一和第二BL之间的位线,字线和存储单元。 布置在BL的延伸方向上的单元构成列。 第二个BL在两列之间共享。 第一对列中的单元布置成沿着第二对列中的单元在BL的延伸方向上以半间距移位。 该装置包括与相邻存储元件具有相等距离的虚拟单元。 此外,该装置包括行解码器,通过驱动配对字线来驱动第一对列中的单元,并且通过驱动配对字线来驱动第二对列中的单元。 每个单元包含选择晶体管。 选择晶体管并联连接在存储元件和第一BL之间。 晶体管的栅极连接到不同的WL。
    • 37. 发明授权
    • Semiconductor memory device with variable resistance element
    • 具有可变电阻元件的半导体存储器件
    • US08369129B2
    • 2013-02-05
    • US12818028
    • 2010-06-17
    • Katsuyuki FujitaKenji Tsuchida
    • Katsuyuki FujitaKenji Tsuchida
    • G11C11/00
    • G11C13/004G11C11/1659G11C11/1673G11C13/0004G11C13/0007G11C2013/0054
    • According to one embodiment, a semiconductor memory device includes a variable resistance element configured to store data “0” and data “1” in accordance with a change in resistance value, a current generator configured to generate a reference current for determining data of the variable resistance element, and having an admittance middle between an admittance of a variable resistance element storing data “0” and an admittance of a variable resistance element storing data “1”, and a sense amplifier includes a first input terminal connected to the variable resistance element and a second input terminal connected to the current generator, and configured to compare currents of the first input terminal and the second input terminal.
    • 根据一个实施例,半导体存储器件包括可变电阻元件,其被配置为根据电阻值的变化来存储数据0和数据1;电流发生器,被配置为产生用于确定可变电阻元件的数据的参考电流;以及 在存储数据0的可变电阻元件的导纳与存储数据1的可变电阻元件的导纳之间的导纳中心处的导纳和感测放大器包括连接到可变电阻元件的第一输入端子和连接到可变电阻元件的第二输入端子 电流发生器,并且被配置为比较第一输入端子和第二输入端子的电流。
    • 40. 发明申请
    • SEMICONDUCTOR STORAGE DEVICE
    • 半导体存储设备
    • US20120063216A1
    • 2012-03-15
    • US13205094
    • 2011-08-08
    • Katsuyuki FujitaYoshihiro Ueda
    • Katsuyuki FujitaYoshihiro Ueda
    • G11C11/00
    • G11C8/10G11C5/025G11C7/14G11C8/08G11C11/1659G11C11/1675
    • A memory includes bit lines, word lines, and memory cells connected between first and second BLs. The cells arranged in an extending direction of the BLs constitute columns. The second BL is shared between two columns. The cells in a first pair of columns are arranged to be shifted in the extending direction of the BLs by a half-pitch from the cells in a second pair of columns. The device includes a dummy cell having an equal distance from the adjacent memory elements. Further, the device includes a row decoder driving the cells in the first pair of columns by driving paired word lines, and driving the cells in the second pair of columns by driving paired word lines. Each cell includes selection transistors. The selection transistors are connected in parallel between the memory element and the first BL. Gates of the transistors are connected to different WLs.
    • 存储器包括连接在第一和第二BL之间的位线,字线和存储单元。 布置在BL的延伸方向上的单元构成列。 第二个BL在两列之间共享。 第一对列中的单元布置成沿着第二对列中的单元在BL的延伸方向上以半间距移位。 该装置包括与相邻存储元件具有相等距离的虚拟单元。 此外,该装置包括行解码器,通过驱动配对字线来驱动第一对列中的单元,并且通过驱动配对字线来驱动第二对列中的单元。 每个单元包括选择晶体管。 选择晶体管并联连接在存储元件和第一BL之间。 晶体管的栅极连接到不同的WL。