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    • 32. 发明授权
    • Memory device, memory system and method of inputting/outputting data into/from the same
    • 存储器件,存储器系统以及从其输入/输出数据的方法
    • US07366052B2
    • 2008-04-29
    • US11582290
    • 2006-10-17
    • Joo-Sun Choi
    • Joo-Sun Choi
    • G01C8/00
    • G11C7/1039G11C7/1051G11C7/106G11C7/1066G11C7/1072G11C7/22G11C7/222G11C11/4076G11C11/4093G11C2207/107
    • A memory device includes a memory cell array, a row decoding section, a K-bit prefetch section and an output buffer section. The row decoding section decodes a row address in response to a first clock, to activate one of the word lines corresponding to the decoded row address. The K-bit prefetch section decodes a column address in response to a second clock and prefetches K data from K memory cells connected to the activated word line and corresponds to the decoded column address, in response to a second clock, where a frequency of the second clock is 1/M of that of the first clock. The output buffer section outputs the K prefetched data as a data stream in response to a third clock. Therefore, a burden from the physical limit of the access speed may be alleviated when the data I/O speed is increased.
    • 存储器件包括存储单元阵列,行解码部分,K位预取部分和输出缓冲器部分。 行解码部分响应于第一时钟解码行地址,以激活对应于解码的行地址的字线之一。 K位预取部分响应于第二时钟对列地址进行解码,并且响应于第二时钟从与连接到激活字线的K个存储器单元中的K个存储器单元相对应地对应于解码的列地址, 第二个时钟是第一个时钟的1 / M。 输出缓冲器部分响应于第三个时钟输出K个预取数据作为数据流。 因此,当数据I / O速度增加时,可以减轻访问速度的物理限制的负担。
    • 35. 发明申请
    • Memory system having point-to-point (PTP) and point-to-two-point (PTTP) links between devices
    • 在设备之间具有点到点(PTP)和点到两点(PTTP)链路的存储器系统
    • US20070133247A1
    • 2007-06-14
    • US11603648
    • 2006-11-22
    • Jae-Jun LeeJoo-Sun ChoiKyu-Hyoun KimKwang-Soo Park
    • Jae-Jun LeeJoo-Sun ChoiKyu-Hyoun KimKwang-Soo Park
    • G11C5/06
    • G11C5/063
    • A memory system has first and second primary memories and first and second secondary memories coupled to the first and second primary memories, respectively, the coupling comprising at least one point-to-point connection. A memory module includes at least two of the first and second primary and first and second secondary memories. A first connection element, such as a connector or solder, connects the memory module to a mother board. A second connection element, such as a connector or solder, connects at least one other of the first and second primary and first and second secondary memories to the mother board. At least one of the memories on the first memory module is coupled to at least one of the other memories. The memory system also includes a memory controller which is connected to the primary memories by a point-to-two-point link.
    • 存储器系统具有第一和第二主存储器以及分别耦合到第一和第二主存储器的第一和第二辅助存储器,耦合器包括至少一个点到点连接。 存储器模块包括第一和第二主要和第一和第二辅助存储器中的至少两个。 诸如连接器或焊料的第一连接元件将存储器模块连接到母板。 诸如连接器或焊料的第二连接元件将第一和第二初级和第二和第二辅助存储器中的至少一个连接到母板。 第一存储器模块上的至少一个存储器耦合到至少一个其他存储器。 存储器系统还包括存储器控制器,其通过点对二点链接连接到主存储器。
    • 37. 发明授权
    • Antifuse circuitry for post-package DRAM repair
    • 用于后封装DRAM修复的防漏电路
    • US06240033B1
    • 2001-05-29
    • US09479665
    • 2000-01-10
    • Woodward YangJoo Sun ChoiJae Kyung WeeYoung Ho SeolJin Keun OhPhil Jung KimHo Youe Cho
    • Woodward YangJoo Sun ChoiJae Kyung WeeYoung Ho SeolJin Keun OhPhil Jung KimHo Youe Cho
    • G11C700
    • G11C29/781G11C17/18
    • The anti-fuse circuit includes three sub-blocks: a multiplexer having inputs of control signals and addresses and yielding the activation of a programming signal and program addresses; a programming voltage generator consisting of an oscillator and a charge pump; and an anti-fuse unit circuits for the program/read of anti-fuse states. For an anti-fuse program at the special test mode, a program address generation circuit having inputs of control signals and addresses activates the programming voltage generator and makes a special or program address for selection of anti-fuse. In the normal mode, the program address generation circuit and an internal power generator remain at an inactive state. In anti-fuse unit circuit, the program address and the programming voltage signal from the programming voltage generator serve to switch the terminal of the anti-fuse up to a programming voltage level when the anti-fuse is selected for programming of anti-fuse elements.
    • 反熔丝电路包括三个子块:具有控制信号和地址的输入并产生编程信号和程序地址的激活的多路复用器; 由振荡器和电荷泵组成的编程电压发生器; 以及用于编程/读取反熔丝状态的反熔丝单元电路。 对于在特殊测试模式下的反熔丝程序,具有控制信号和地址的输入的程序地址产生电路激活编程电压发生器,并产生用于选择反熔丝的特殊或程序地址。 在正常模式中,程序地址产生电路和内部发电机保持在非工作状态。 在反熔丝单元电路中,编程电压发生器的程序地址和编程电压信号用于在反熔丝被选择用于编程抗熔丝元件时将反熔丝的端子切换到编程电压电平 。
    • 39. 发明授权
    • Integrated circuit memory device
    • 集成电路存储器件
    • US08817549B2
    • 2014-08-26
    • US13478774
    • 2012-05-23
    • Choong-Sun ShinJoo-Sun Choi
    • Choong-Sun ShinJoo-Sun Choi
    • G11C7/10
    • G11C5/04G11C5/025G11C7/10G11C8/12G11C11/408G11C11/4093G11C11/4097
    • A semiconductor memory device includes a plurality of memory regions formed on one chip, each of the memory regions having a plurality of volatile memory cells that are formed with a density or capacity of 2^K bits, where K is an integer greater than or equal to 0, and a plurality of input/output (I/O) terminals for inputting and outputting data of the volatile memory cells, and at least one peripheral region that controls a write operation for writing data into the memory regions and a read operation for reading data from the memory regions based on a command and an address input from outside. Thus, a total or entire density of the memory regions corresponds to a non-standard (or ‘interim’) density so that the semiconductor memory device may have an interim density.
    • 半导体存储器件包括形成在一个芯片上的多个存储器区域,每个存储器区域具有多个易失性存储器单元,其形成为2K比特的密度或容量,其中K是大于或等于的整数 以及用于输入和输出易失性存储器单元的数据的多个输入/输出(I / O)端子,以及控制用于将数据写入存储区域的写入操作的至少一个外围区域,以及用于 基于从外部输入的命令和地址从存储器区域读取数据。 因此,存储区域的总体或整个密度对应于非标准(或“临时”)密度,使得半导体存储器件可具有临时密度。