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    • 21. 发明申请
    • IMPLEMENTATION OF COLUMN REDUNDANCY FOR A FLASH MEMORY WITH A HIGH WRITE PARALLELISM
    • 实现具有高写并发性的闪存存储器的冗余冗余
    • US20080144379A1
    • 2008-06-19
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C16/06
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。
    • 27. 发明授权
    • Sectored semiconductor memory device with configurable memory sector addresses
    • 具有可配置存储器扇区地址的扇区半导体存储器件
    • US06401164B1
    • 2002-06-04
    • US09159322
    • 1998-09-23
    • Simone BartoliVincenzo DimaMauro Luigi Sali
    • Simone BartoliVincenzo DimaMauro Luigi Sali
    • G06F1206
    • G11C8/12G11C16/08
    • A memory device comprises a plurality of independent memory sectors, external address signal inputs for receiving external address signals that address individual memory locations of the memory device, the external address signals including external memory sector address signals allowing for individually addressing each memory sector, and a memory sector selection circuit for selecting one of the plurality of memory sectors according to a value of the external memory sector address signals. A first and a second alternative internal memory sector address signal paths are provided for supplying the external memory sector address signals to the memory sector selection circuit, the first path providing no logic inversion and the second path providing logic inversion. A programmable circuit activates either one or the other of the first and second internal memory sector address signal paths, so that a position of each memory sector in a space of values (00000h-3FFFFh) of the external address signals can be changed by activating either one or the other of the first and second internal memory sector address signal paths.
    • 存储器件包括多个独立存储器扇区,外部地址信号输入用于接收寻址存储器件的各个存储器位置的外部地址信号,外部地址信号包括允许单独寻址每个存储器扇区的外部存储器扇区地址信号,以及 存储器扇区选择电路,用于根据外部存储器扇区地址信号的值来选择多个存储器扇区之一。 提供第一和第二替代的内部存储器扇区地址信号路径用于将外部存储器扇区地址信号提供给存储器扇区选择电路,第一路径不提供逻辑反转,而第二路径提供逻辑反转。 可编程电路激活第一和第二内部存储器扇区地址信号路径中的一个或另一个,使得外部地址信号的值(00000h-3FFFFh)的空间中的每个存储器扇区的位置可以通过激活 第一和第二内部存储器扇区地址信号路径中的一个或另一个。
    • 30. 发明授权
    • Sense amplifier
    • 感应放大器
    • US07920436B2
    • 2011-04-05
    • US12336965
    • 2008-12-17
    • Lorenzo BedaridaSimone BartoliDavide ManfreAlex Pojer
    • Lorenzo BedaridaSimone BartoliDavide ManfreAlex Pojer
    • G11C7/00
    • G11C7/062
    • A sense amplifier includes a first cascode transistor, a second cascode transistor, a first feedback circuit, a second feedback circuit, and a comparator. The drain of the first cascode transistor is connected directly to a first voltage source. The gate of the first cascode transistor is connected to the first feedback circuit and a first input of the comparator, and the source of the first cascode transistor is connected to the first feedback circuit and a first column decoder. The drain of the second cascode transistor is connected directly to a second voltage source. The gate of the second cascode transistor is connected to the second feedback circuit and a second input of the comparator, and the source of the second cascode transistor is connected to the second feedback circuit and a second column decoder.
    • 读出放大器包括第一共源共栅晶体管,第二共源共栅晶体管,第一反馈电路,第二反馈电路和比较器。 第一共源共栅晶体管的漏极直接连接到第一电压源。 第一共源共栅晶体管的栅极连接到第一反馈电路和比较器的第一输入端,并且第一共源共栅晶体管的源极连接到第一反馈电路和第一列解码器。 第二共源共栅晶体管的漏极直接连接到第二电压源。 第二共源共栅晶体管的栅极连接到第二反馈电路和比较器的第二输入端,第二共源共栅晶体管的源极连接到第二反馈电路和第二列解码器。