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    • 21. 发明申请
    • LOW VOLTAGE COLUMN DECODER SHARING A MEMORY ARRAY P-WELL
    • 低电压柱解码器共享存储阵列P-WELL
    • US20080123415A1
    • 2008-05-29
    • US11557627
    • 2006-11-08
    • Massimiliano FrulioStefano SuricoAndrea SaccoDavide Manfre
    • Massimiliano FrulioStefano SuricoAndrea SaccoDavide Manfre
    • G11C16/14G11C16/04
    • G11C16/08
    • A plurality of memory sub-arrays are formed in a p-well region. Each of the memory sub-arrays has at least one first-level column decoder that includes a plurality of low-voltage MOS selector transistors that are also formed within the p-well. A last-level decoder is formed outside of the p-well region and includes high-voltage MOS transistors to provide an output signal to one of an array of sense amplifiers. During a memory erase mode of operation, a high voltage is provided to bias the p-well region and a plurality of high-voltage switches are activated to provide a high voltage to gate terminals of the selector transistor in the first-level column decoders. One or more intermediate-level column decoders are formed as low-voltage selector transistors in the p-well between the first-level column decoder and the last-level column decoder. Each of the intermediate-level column decoders also has a high-voltage switch that is activated during a memory erase mode of operation to provide a high voltage to gate terminals of the intermediate-level column decoders.
    • 多个存储器子阵列形成在p阱区域中。 每个存储器子阵列具有至少一个第一级列解码器,其包括也形成在p阱内的多个低压MOS选择晶体管。 最后一级解码器形成在p阱区域外部,并且包括高电压MOS晶体管,以向读出放大器阵列之一提供输出信号。 在存储器擦除操作模式期间,提供高电压以偏置p阱区域,并且激活多个高压开关以向第一级列解码器中的选择器晶体管的栅极端提供高电压。 在第一级列解码器和最后一级列解码器之间的p阱中形成一个或多个中间级列解码器作为低电压选择晶体管。 每个中间级列解码器还具有在存储器擦除操作模式期间激活的高压开关,以向中级列解码器的栅极端提供高电压。
    • 29. 发明授权
    • Implementation of column redundancy for a flash memory with a high write parallelism
    • 实现具有高写入并行性的闪存的列冗余
    • US07551498B2
    • 2009-06-23
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C7/00
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。
    • 30. 发明授权
    • Fast dynamic low-voltage current mirror with compensated error
    • 具有补偿误差的快速动态低压电流镜
    • US07242242B2
    • 2007-07-10
    • US11393153
    • 2006-03-29
    • Lorenzo BedaridaDanut ManeaMirella MarsellaAndrea Sacco
    • Lorenzo BedaridaDanut ManeaMirella MarsellaAndrea Sacco
    • G05F1/10
    • G05F3/262
    • A current mirror comprising: current source; a first p-channel transistor having a source coupled to operating potential, and a gate and drain coupled to current source; a second p-channel transistor having a source coupled to operating potential, a gate coupled to gate of first p-channel transistor, and a drain; a zero-threshold p-channel transistor having a source coupled to drain of second p-channel transistor, a gate coupled to gate of first p-channel transistor, and a drain; a first n-channel transistor having a source coupled to ground, and a gate and drain coupled to drain of zero-threshold p-channel transistor; a second n-channel transistor having a source coupled to ground, a gate coupled to gate of first n-channel transistor, and a drain; and a zero-threshold n-channel transistor having a source coupled to drain of second n-channel transistor, a gate coupled to gate of first n-channel transistor, and a drain coupled to current-output node.
    • 电流镜,包括:电流源; 具有耦合到工作电位的源极的第一p沟道晶体管和耦合到电流源的栅极和漏极; 具有耦合到工作电位的源极的第二p沟道晶体管,耦合到第一p沟道晶体管的栅极的栅极和漏极; 零阈值p沟道晶体管,其具有耦合到第二p沟道晶体管的漏极的源极,耦合到第一p沟道晶体管的栅极的栅极和漏极; 第一n沟道晶体管,其具有耦合到地的源极,以及耦合到零阈值p沟道晶体管的漏极的栅极和漏极; 具有耦合到地的源极的第二n沟道晶体管,耦合到第一n沟道晶体管的栅极的栅极和漏极; 以及零阈值n沟道晶体管,其具有耦合到第二n沟道晶体管的漏极的源极,耦合到第一n沟道晶体管的栅极的栅极和耦合到电流输出节点的漏极。