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    • 21. 发明授权
    • Photographing and recording method and apparatus for electronic still
picture cameras
    • 电子静态照相机的拍摄和记录方法和装置
    • US4692815A
    • 1987-09-08
    • US921844
    • 1986-10-23
    • Atsushi KawaharaMasaya Okita
    • Atsushi KawaharaMasaya Okita
    • G11B19/20G11B31/00H04N1/21H04N5/232H04N5/335H04N5/369H04N5/77H04N5/781
    • G11B19/20G11B31/006H04N1/2112H04N5/335H04N5/772H04N2101/00Y10S358/906
    • A photographing and recording method and apparatus for an electronic still picture camera of the type in which an image is picked up by a combination of a mechanical or electrooptical shutter and an image pickup device and the resulting picture signal is recorded on a magnetic disk, eliminate any undesired power consumption due to the preliminary revolution of the magnetic disk. The revolution of the magnetic disk is started upon the depression of the shutter button and the revolution is controlled at a constant speed by a velocity servosystem. The phase of the vertical synchronizing signals for reading the signal charges from the image pickup device and recording the signal on the disk after the exposure is shifted with respect to the vertical synchronizing signals for the extraneous charge draining operation of the image pickup device before the exposure and the phase-shifted vertical signals are reset in response to the beginning of the next exposure thereby controlling the phase difference between the vertical synchronizing signals and the rotational period of the disk at a desired value.
    • 一种用于电子静态照相机的拍摄和记录方法和装置,其中通过机械或电光门和图像拾取装置的组合拾取图像并将所得到的图像信号记录在磁盘上,消除 由于磁盘的初步旋转而导致的任何不期望的功率消耗。 在按下快门按钮时开始磁盘的旋转,并且通过速度伺服系统以恒定的速度控制旋转。 用于读取来自图像拾取装置的信号电荷并且在曝光之后将信号记录在盘上的垂直同步信号的相位相对于在曝光之前的图像拾取装置的无关电荷排放操作的垂直同步信号移位 并且相移的垂直信号响应于下一次曝光的开始被复位,从而将垂直同步信号和盘的旋转周期之间的相位差控制在期望的值。
    • 22. 发明授权
    • Automatic focusing device of a microscope
    • 自动对焦装置的显微镜
    • US4342905A
    • 1982-08-03
    • US180150
    • 1980-08-21
    • Norio FujiiAtsushi KawaharaMasahiro Sawada
    • Norio FujiiAtsushi KawaharaMasahiro Sawada
    • G02B21/24G01J1/20
    • G02B21/244
    • An automatic focusing device of a microscope having an objective lens and a stage on which a specimen is placed comprises distance varying means for varying the relative distance between the objective lens and the stage, distance detecting means for producing a distance output corresponding to said distance, photoelectric detector means for photoelectrically detecting a high frequency component of the space frequency component of the image of the specimen on the stage by the objective lens, judging means for judging whether or not a predetermined peak smaller than a maximum peak exists in the output of the photoelectric detector means within a predetermined distance range from a first distance output of the distance detecting means when the output of the photoelectric detector means assumes said maximum peak and for producing an in-focus output when said predetermined peak exists, and means for determining said relative distance on the basis of said in-focus output.
    • 具有物镜的显微镜的自动聚焦装置和放置有试样的台架包括用于改变物镜与台架之间的相对距离的距离变化装置,用于产生对应于所述距离的距离输出的距离检测装置, 光电检测装置,用于通过物镜光电检测载物台上的样本的空间频率分量的高频分量;判断装置,用于判断小于最大峰值的预定峰值是否存在于 光电检测装置,当光电检测装置的输出呈现所述最大峰值时,距距离检测装置的第一距离输出预定距离范围内,并且当存在所述预定峰值时产生对焦输出,以及用于确定所述相对 基于所述对焦输出的距离。
    • 23. 发明授权
    • Particle inspection apparatus, exposure apparatus, and device manufacturing method
    • 粒子检查装置,曝光装置及装置的制造方法
    • US07760348B2
    • 2010-07-20
    • US12389323
    • 2009-02-19
    • Atsushi Kawahara
    • Atsushi Kawahara
    • G01N21/88
    • G03F1/84
    • A particle inspection apparatus includes an irradiation unit configured to apply a light beam onto front and back surfaces of an object to be inspected, first and second detection units configured to detect scattering light from the surfaces, a calculation unit configured to conduct a particle inspection on the surfaces on the basis of outputs from the detection units, and a control unit configured to control the irradiation unit, the detection units, and the calculation unit. The irradiation unit can selectively apply the beam onto the front or back surface. The control unit causes the calculation unit to conduct the particle inspection on the inspection surface on which the light beam is selectively applied, on the basis of outputs made by the detection unit corresponding to simultaneous application and selective application of the light beam.
    • 一种粒子检查装置,包括:被配置为将被检测体的前后表面施加光束的照射部,配置为检测来自所述表面的散射光的第一检测部和第二检测部, 基于来自检测单元的输出的表面,以及被配置为控制照射单元,检测单元和计算单元的控制单元。 照射单元可以选择性地将光束施加到前表面或后表面上。 控制单元使得计算单元基于对应于同时施加和选择性地施加光束的由检测单元产生的输出,在选择了光束的检查表面上进行粒子检查。
    • 24. 发明申请
    • PARTICLE INSPECTION APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
    • 颗粒检查装置,曝光装置和装置制造方法
    • US20090207406A1
    • 2009-08-20
    • US12389323
    • 2009-02-19
    • Atsushi Kawahara
    • Atsushi Kawahara
    • G01N21/88
    • G03F1/84
    • A particle inspection apparatus includes an irradiation unit configured to apply a light beam onto front and back surfaces of an object to be inspected, first and second detection units configured to detect scattering light from the surfaces, a calculation unit configured to conduct a particle inspection on the surfaces on the basis of outputs from the detection units, and a control unit configured to control the irradiation unit, the detection units, and the calculation unit. The irradiation unit can selectively apply the beam onto the front or back surface. The control unit causes the calculation unit to conduct the particle inspection on the inspection surface on which the light beam is selectively applied, on the basis of outputs made by the detection unit corresponding to simultaneous application and selective application of the light beam.
    • 一种粒子检查装置,包括:被配置为将被检测体的前后表面施加光束的照射部,配置为检测来自所述表面的散射光的第一检测部和第二检测部, 基于来自检测单元的输出的表面,以及被配置为控制照射单元,检测单元和计算单元的控制单元。 照射单元可以选择性地将光束施加到前表面或后表面上。 控制单元使得计算单元基于对应于同时施加和选择性地施加光束的由检测单元产生的输出,在选择了光束的检查表面上进行粒子检查。
    • 28. 发明授权
    • Illumination device
    • 照明装置
    • US5810463A
    • 1998-09-22
    • US563232
    • 1995-11-28
    • Atsushi KawaharaOsamu Inoue
    • Atsushi KawaharaOsamu Inoue
    • F21K99/00F21V8/00
    • G02B6/0006F21K9/61F21Y2101/00
    • An illumination device for an image input device includes a cylindrical light guiding unit, a board having a plurality of light emitting diode elements, a connection member connecting the light guiding unit with the board and a terminal reflection member formed at one end of the light guiding unit. A surface of the light guiding unit has a scattering reflection member extending linearly along the axial direction of the light guiding unit. A cylindrical reflection member is spaced around the light guiding unit and a linear space is provided in the reflection member along the axial direction of the guiding unit.
    • 一种用于图像输入装置的照明装置包括圆柱形导光单元,具有多个发光二极管元件的板,连接导光单元与板的连接构件和形成在导光体的一端的端子反射构件 单元。 导光单元的表面具有沿着导光单元的轴向线性延伸的散射反射构件。 圆柱形反射构件围绕导光单元间隔开,并且沿着引导单元的轴向方向在反射构件中设置线性空间。