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    • 12. 发明授权
    • Extreme ultra violet light source apparatus
    • 极紫外光源装置
    • US07880153B2
    • 2011-02-01
    • US12073001
    • 2008-02-28
    • Takashi SuganumaTamotsu AbeHiroshi SomeyaAkira Sumitani
    • Takashi SuganumaTamotsu AbeHiroshi SomeyaAkira Sumitani
    • H05G2/00G01J1/42
    • G03F7/70916G03F7/70033
    • An EUV light source apparatus capable of preventing deterioration and/or breakage of a filter for filtering EUV light. The EUV light source apparatus includes an EUV generation chamber in which EUV light is generated; a target material supply unit for supplying a target material into the EUV light generation chamber; a laser source for applying a laser beam to the target material supplied into the EUV light generation chamber to generate plasma; collection optics for collecting EUV light radiated from the plasma; a filter for filtering the EUV light collected by the collection optics; and a filter protecting member provided between the plasma and the filter, for protecting the filter by blocking flying matter flying from the plasma toward the filter.
    • EUV光源装置,能够防止过滤EUV光的过滤器的劣化和/或破损。 EUV光源装置包括产生EUV光的EUV产生室; 目标材料供应单元,用于将目标材料供应到EUV光产生室中; 激光源,用于将激光束施加到提供到EUV光产生室中的目标材料以产生等离子体; 用于收集从等离子体辐射的EUV光的收集光学器件; 用于过滤由收集光学器件收集的EUV光的滤光器; 以及设置在等离子体和过滤器之间的过滤器保护构件,用于通过阻挡从等离子体飞向过滤器的飞散物质来保护过滤器。