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    • 11. 发明授权
    • Processing apparatus
    • 处理装置
    • US06802934B2
    • 2004-10-12
    • US10378890
    • 2003-03-05
    • Hiroaki SaekiKeiichi MatsushimaTeruo AsakawaMasaki Narushima
    • Hiroaki SaekiKeiichi MatsushimaTeruo AsakawaMasaki Narushima
    • H01L2100
    • H01L21/67766H01L21/67167H01L21/67201H01L21/67742H01L21/67745Y10S414/135Y10S414/136
    • Two load lock chambers 130 and 132 are arranged between a first transfer chamber 122 and a second transfer chamber 133. Each of the load lock chambers is capable of accommodating a single wafer W. The first transfer chamber 122 is provided with a first transfer unit 124 having two substrate holders 124a, 124b each capable of holding a single object to be processed, in order to transport the wafer W among a load port site 120, the first load lock chamber 130, the second load lock chamber 132 and a positioning unit 150. The second transfer chamber 133 is provided with a second transfer unit 156 having two substrate holders 156a, 156b each capable of holding the single object to be processed, in order to transport the wafer between the first load lock chamber 130, the second load lock chamber 132 and respective vacuum processing chambers 158 to 164. Since the volume of each load lock chamber can be minimized, it is possible to perform the prompt control of atmospheres in the load lock chambers. Additionally, it is possible to perform the delivery of the wafers promptly.
    • 两个负载锁定室130和132设置在第一传送室122和第二传送室133之间。每个负载锁定室能够容纳单个晶片W.第一传送室122设置有第一传送单元124 具有能够保持单个待处理物体的两个基板保持件124a,124b,以便在载荷端口位置120,第一加载锁定室130,第二加载锁定室132和定位单元150之间输送晶片W 第二传送室133设置有第二传送单元156,第二传送单元156具有两个能够保持单个待处理物体的基板保持器156a,156b,以便在第一加载锁定室130,第二加载锁 室132和相应的真空处理室158至164.由于每个负载锁定室的体积可以最小化,因此可以对负载锁中的气氛进行即时控制 mbers。 此外,可以及时执行晶片的传送。
    • 12. 发明授权
    • Cassette transfer mechanism
    • 纸盒传送机构
    • US5947675A
    • 1999-09-07
    • US967397
    • 1997-11-11
    • Keiichi Matsushima
    • Keiichi Matsushima
    • B65G49/07H01L21/677
    • H01L21/67775Y10S414/14
    • A cassette transfer mechanism according to the present invention comprises a cassette chamber for containing a cassette for holding a plurality of objects to be processed, a cassette transfer port formed in the cassette chamber, for allowing the cassette to be transferred into and from the cassette chamber, an object transfer port formed in the cassette chamber and opened at a predetermined angle to an opening direction of the cassette transfer port, for allowing the objects to be transferred into and from the cassette chamber, an elevation table provided in the cassette chamber such that the elevation table can be elevated, a shaft installed rotatably on the elevation table and extending in a direction substantially perpendicular to an opening direction of the object transfer port, a cassette support table fixed to the shaft and having a bottom support portion for receiving a bottom surface of the cassette and a back surface support portion for receiving a back surface of the cassette, for orienting the cassette supported by the bottom support portion and the back surface support portion, in the opening direction of the object transfer port, and a rotation mechanism for rotating the cassette support table between a first position inside the cassette chamber and a second position outside the cassette chamber, by rotating the shaft in in response to operation of the elevation table.
    • 根据本发明的盒式传送机构包括用于容纳用于保持待处理的多个物体的盒的盒室,形成在盒室中的盒传送端口,用于允许盒传送到盒室中 ,形成在盒室中并且以与盒传送口的打开方向成预定角度打开的物体传送口,用于允许物体被传送到盒室中和从盒室传送;设置在盒室中的升降台,使得 升降台可以升高,轴可旋转地安装在升降台上并且沿着与物体传送口的打开方向大致垂直的方向延伸;盒支撑台,固定到轴上,并具有用于接收底部的底部支撑部分 盒的表面和用于接收盒的后表面的后表面支撑部分 用于使由所述底部支撑部和所述后表面支撑部支撑的所述盒沿所述物体传送口的打开方向定向;以及旋转机构,用于使所述盒支撑台在所述盒室内的第一位置和第二位置之间旋转 通过响应于升降台的操作使轴转动,在盒室外部。
    • 15. 发明授权
    • Mounting/demounting device for wafer carrier lid
    • 晶圆托架盖的安装/拆卸装置
    • US06984097B1
    • 2006-01-10
    • US10019227
    • 2000-06-28
    • Hiroaki SaekiYoshiaki SasakiKeiichi MatsushimaYasushi TaniyamaShuuji Hagiwara
    • Hiroaki SaekiYoshiaki SasakiKeiichi MatsushimaYasushi TaniyamaShuuji Hagiwara
    • B65G49/07
    • H01L21/50H01L21/67772H01L21/67775
    • An attaching and removing unit of a lid for a wafer carrier according to the invention includes: a lid holding plate that can move forward and backward relatively to a lid for a wafer carrier provided with a lock unit having a keyhole exposed outside, on a side of the keyhole; a driver for causing the lid holding plate to move forward and backward; and a key element protruding from the lid holding plate on a side of the lid in a pivotable manner, the key element disposed opposite the keyhole in a direction of the forward and backward movement. The lock unit is adapted to be locked and unlocked by the key element pivoting in the keyhole. In a locked state, the key element can be inserted into and released from the keyhole, and in an unlocked state, the key element is engaged with and can not be released from the keyhole, while the lid holding plate holds the lid. The lid holding plate is provided with a lid-detecting unit for detecting whether the lid holding plate is holding the lid or not.
    • 根据本发明的用于晶片载体的盖的安装和拆卸单元包括:盖保持板,其能相对于晶片载体的盖子前后移动,所述盖板设置有具有在外侧露出的锁孔的锁定单元, 的钥孔; 用于使盖保持板前后移动的驱动器; 以及从所述盖保持板在所述盖的侧面以可转动的方式突出的键元件,所述键元件在所述向前和向后移动的方向上与所述键孔相对设置。 锁定单元适于通过在键孔中枢转的键元件来锁定和解锁。 在锁定状态下,键元件可以插入钥匙孔中并从钥匙孔释放,并且在解锁状态下,当盖子保持板握住盖子时,钥匙元件与钥匙孔接合并且不能从钥匙孔释放。 盖保持板设置有用于检测盖保持板是否保持盖的盖检测单元。
    • 16. 发明授权
    • Method and apparatus for measuring flow velocity and method and apparatus for measuring flow rate
    • 测量流速的方法和装置及测量流量的方法和装置
    • US06675111B2
    • 2004-01-06
    • US10081240
    • 2002-02-25
    • Eisaku KomatsuKeiichi Matsushima
    • Eisaku KomatsuKeiichi Matsushima
    • G01F100
    • G01F1/667
    • Disclosed is a method and apparatus for measuring flow velocity and flow rate of a fluid in a tube member or the like with high precision. A flow vel0ocity measuring method has: a step of allowing a signal sound of ultrasound to propagate through a fluid in a tube member or the like and detecting a phase difference between the signal sound and an original signal; a step of eliminating a phase difference detected in the step to obtain synchronism; a step of detecting time or oscillation frequency required to complete the phase synchronization in the step; and a step of, on the basis of the time or oscillation frequency required to complete phase synchronization in the step, calculating flow velocity by referring to flow velocity which is preset in a table in correspondence with the time or frequency. In the table, flow velocities corresponding to changes in temperature, pressure, and kind of a fluid may be preset together with the time or oscillation frequency. A flow velocity measuring apparatus is realized by hardware having the functions of the above steps. A flow rate is obtained by multiplying the measured flow velocity with the internal diameter of a tube member.
    • 公开了一种用于以高精度测量管构件等中的流体的流速和流量的方法和装置。 流动测量方法具有:允许超声波的信号通过管构件等中的流体传播并检测信号声音与原始信号之间的相位差的步骤; 消除在步骤中检测到的相位差以获得同步的步骤; 检测在步骤中完成相位同步所需的时间或振荡频率的步骤; 以及基于在该步骤中完成相位同步所需的时间或振荡频率的步骤,通过参考与时间或频率对应的表中预设的流速来计算流速。 在表中,与流体的温度,压力和种类的变化对应的流速可以与时间或振荡频率一起预先设定。 流量测量装置由具有上述步骤功能的硬件实现。 通过将测量的流速与管构件的内径相乘来获得流量。
    • 17. 发明授权
    • Processing system
    • 处理系统
    • US06339730B1
    • 2002-01-15
    • US09680439
    • 2000-10-05
    • Keiichi Matsushima
    • Keiichi Matsushima
    • G06F700
    • H01L21/67167H01L21/67196H01L21/67259Y10S414/136Y10S414/139
    • A processing system comprises a plurality of processing vessels (8A to 8D) provided with openings in which a wafer (W) is subjected to predetermined processes, and a common transfer vessel (4) connected to the openings of the processing vessels. A transfer mechanism (14) capable of turning, bending and stretching is installed in the common transfer vessel to transfer the wafer (W) between the common transfer vessel (4) and the processing vessels (8A to 8D). Stand-by spaces (24A to 24D), where the wafer (W) is held temporarily, are determined so as to correspond to the openings of the processing vessels (8A to 8D), respectively. Position sensors (26-1 to 26-5) are assigned in pairs to the stand-by spaces to measure the position of the perimeter of the wafer. The position sensors are arranged so that each stand-by space (24A to 24D) shares one of the pair of position sensors with the adjacent stand-by space for common use. A control means determines an offset of the object held by the transfer mechanism on the basis of the position of the perimeter of the object detected by the position sensors and controls the operation of the transfer mechanism so as to correct the offset of the object.
    • 处理系统包括设置有晶片(W)进行预定处理的开口的多个处理容器(8A至8D)和连接到处理容器的开口的公共转移容器(4)。 在公共转移容器中安装能够转动,弯曲和拉伸的转移机构(14),以在公共转移容器(4)和处理容器(8A至8D)之间转移晶片(W)。 确定晶片(W)暂时保持的备用空间(24A至24D)分别对应于处理容器(8A至8D)的开口。 位置传感器(26-1至26-5)成对分配给待机空间,以测量晶片周边的位置。 位置传感器被布置成使得每个备用空间(24A至24D)共享一对位置传感器中的一个与相邻的备用空间共同使用。 控制装置基于由位置传感器检测到的物体的周边的位置来确定由传送机构保持的物体的偏移,并且控制传送机构的操作,以便校正物体的偏移。
    • 18. 发明授权
    • Digitizer and position determination method therefor
    • 数字化仪及其位置确定方法
    • US5670754A
    • 1997-09-23
    • US411110
    • 1995-03-27
    • Keiichi Matsushima
    • Keiichi Matsushima
    • G06F3/046G06F3/033G06F3/041G09C21/00
    • G06F3/046
    • A digitizer and a method for calculating the position coordinates indicated by a position indicator on a tablet. The position indicator has a coil that electromagnetically interacts with the loop coil group of the tablet. A signal detection unit, a "sum" signal specifying unit, and a coordinate determination unit are utilized. The signal detection unit sequentially selects two loop coils as a loop coil pair from the loop coil group of the tablet and acquires a "sum" of and a "difference" between signals generated in respective coils of each loop coil pair. The "sum" signal specifying unit specifies one of the loop coil pairs of the loop coil group which generates a "sum" signal of a maximum absolute value when the coil of the position indicator and the loop coil group of the tablet are brought into an interaction state. The coordinate determination unit determines position coordinates on the tablet designated by the position indicator, on the basis of a "difference" signal of the specified loop coil pair.
    • 用于计算由平板电脑上的位置指示器指示的位置坐标的数字化仪和方法。 位置指示器具有与片剂的环线圈组电磁相互作用的线圈。 使用信号检测单元,“和”信号指定单元和坐标确定单元。 信号检测单元顺序地从图形输入板的环形线圈组中选择两个环形线圈作为环形线圈对,并且获得每个环形线圈对的各个线圈中产生的信号之间的“和”和“差”。 “和”信号指定单元指定环形线圈组的环形线圈对之一,当线圈组的位置指示器的线圈和平板的环形线圈组进入时,产生最大绝对值的“和”信号 互动状态 坐标确定单元基于指定的环形线圈对的“差分”信号来确定由位置指示器指定的图形输入板上的位置坐标。
    • 20. 发明授权
    • Method of sensing access positions of arm
    • 检测手臂进入位置的方法
    • US6144926A
    • 2000-11-07
    • US64003
    • 1998-04-21
    • Shigeru IshizawaKeiichi Matsushima
    • Shigeru IshizawaKeiichi Matsushima
    • H01L21/677G05B19/401H01L21/68G06F19/00
    • H01L21/681G05B19/4015
    • In an arm access position sensing method according to the present invention, optical sensors are provided in a cassette chamber. An adjusting cassette holding wafers W in the top slot and bottom slot is placed on a stage in the cassette chamber. The stage is movable. In a calibration process, the reference slot position, map position, and map thickness are calculated using optical sensors. Similarly, in a mapping process, the sampling thickness and map wafer offset value of each slot in the cassette holding the wafers W are calculated. In an arm access position sensing process, the access position of the transfer arm is calculated using the sampling thickness, map wafer offset value, reference slot position, map position, map thickness, and specific values. On the basis of the access position, the transfer arm and stage are actuated to transfer the wafer W.
    • 在根据本发明的臂访问位置检测方法中,光学传感器设置在盒室中。 在顶部狭槽和底部狭槽中保持晶片W的调节盒放置在盒室中的台上。 舞台是可动的 在校准过程中,使用光学传感器计算参考时隙位置,地图位置和地图厚度。 类似地,在映射处理中,计算保持晶片W的盒中的每个槽的采样厚度和映射晶片偏移值。 在臂访问位置检测处理中,使用采样厚度,地图晶片偏移值,参考时隙位置,地图位置,地图厚度和特定值来计算传送臂的访问位置。 基于进入位置,传送臂和台被致动以传送晶片W.