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    • 11. 发明申请
    • Film-Deposition Apparatus and Film-Deposition Method
    • 薄膜沉积装置和薄膜沉积方法
    • US20090191338A1
    • 2009-07-30
    • US12226217
    • 2007-04-18
    • Kenji MatsumotoHiroshi SatoTatsuya OhiraHideaki MachidaMasato Ishikawa
    • Kenji MatsumotoHiroshi SatoTatsuya OhiraHideaki MachidaMasato Ishikawa
    • C23C16/06C23C16/54
    • C23C16/18C23C16/4482H01L21/28556H01L21/76843H01L23/53238H01L2924/0002H01L2924/00
    • A film-deposition apparatus and a film-deposition method for forming a manganese film on a surface of an object to be processed by a CVD method are provided. The film-deposition apparatus for forming a manganese film on a surface of an object to be processed by a CVD method (Chemical Vapor Deposition method), the film-deposition apparatus comprises: a process vessel capable of being evacuated; a table on which the object to be processed can be placed, the table being disposed in the process vessel; and a source-gas supply part connected to the process vessel, the source-gas supply part being configured to supply, into the process vessel, a source gas including an organic metal material containing manganese or a metal complex material containing manganese. The film-deposition method for forming a manganese film on a surface of an object to be processed by a CVD method (Chemical Vapor Deposition method), the film-deposition method comprises the steps of: placing an object to be processed in an inside of a process vessel capable of being evacuated; and forming a manganese film on a surface of the object to be processed in the process vessel by the CVD method with the use of a source gas including an organic metal material containing manganese or a metal complex material containing manganese.
    • 提供了一种通过CVD方法在待处理物体的表面上形成锰膜的成膜装置和膜沉积方法。 用于通过CVD法(化学气相沉积法)在待处理物体的表面上形成锰膜的成膜装置,所述成膜装置包括:能够被抽真空的处理容器; 可以放置待处理对象的工作台,该工作台设置在处理容器中; 以及连接到处理容器的源气供给部,所述源气供给部构成为向所述处理容器供给包含含有锰的有机金属材料或含有锰的金属络合物的源气体。 通过CVD法(化学气相沉积法)在待处理物体的表面上形成锰膜的成膜方法,成膜方法包括以下步骤:将待处理物体放置在 能够被抽真空的处理容器; 以及使用包含含有锰的有机金属材料或含有锰的金属络合物的源气体,通过CVD法在处理容器中的被处理物的表面上形成锰膜。
    • 12. 发明授权
    • Underlayer film for copper, and a semiconductor device including the underlayer film
    • 用于铜的底层膜和包括下层膜的半导体器件
    • US07022606B2
    • 2006-04-04
    • US10732798
    • 2003-12-11
    • Noboru MikamiHideaki Machida
    • Noboru MikamiHideaki Machida
    • H01L21/44
    • H01L21/76841C23C16/0272C23C16/18H01L21/28556
    • An underlayer film-forming material for copper, a method for forming the underlayer, an underlayer film for copper, and a semiconductor device including a substrate, the underlayer and copper wiring film, which prevents copper diffusion as well as provides superior adhesion to a copper wiring film, even if the film is thinner than conventional barrier metals. The underlayer film-forming material for copper is formed from a compound represented by a (R1R2)P—(R)n—Si(X1X2X3), wherein at least one of X1, X2, and X3 represents a hydrolysable group; each of R1 and R2 represents an alkyl group; R represents a divalent linear organic group which is selected from an alkylene group, an aromatic ring, and an alkylene group including an aromatic ring; and n is an integer from 1 to 6.
    • 铜的下层成膜材料,底层的形成方法,铜的下层膜以及包含衬底,底层和铜布线膜的半导体器件,其防止铜扩散以及提供对铜的优异的粘附性 布线膜,即使该膜比常规屏障金属更薄。 用于铜的下层膜形成材料由以下化合物形成:由(R 1 R 2)2 - (R)N - Si(X 1 X 2 X 3 X 3),其中X 1,X 2,X 3,X 3中的至少一个, 2,X 3表示可水解基团; R 1和R 2中的每一个代表烷基; R表示选自亚烷基,芳香环和包含芳环的亚烷基的二价线性有机基团; n为1〜6的整数。
    • 20. 发明授权
    • Optical sensor and sensing method
    • 光学传感器和传感方法
    • US06278106B1
    • 2001-08-21
    • US09123207
    • 1998-07-27
    • Shinzo MutoMasayuki MorisawaHideaki MachidaChuanxin LiangNoda Naoto
    • Shinzo MutoMasayuki MorisawaHideaki MachidaChuanxin LiangNoda Naoto
    • G01N2100
    • G01N21/7703G02B6/02033
    • The optical sensor of the present invention detects both the existence and concentration of substances by changing from light leakage mode to wave guide mode when the sensor is exposed to the substances to be detected. The changes in the mode results in a large change in optical output. This change is measured and the substance is identified and/or measured with high sensitivity. The change in light leakage mode to wave guide mode of the sensor is possible by having a clad material around the core material, with the clad material decreasing in the index of refraction when exposed to the substance to be detected. When the index of refraction of the clad becomes less than that of the core material, the sensor changes from the light leakage mode and operates in the wave guide mode. Changes in light intensity output from the sensor is measured over time, and correlated to the substance to be detected.
    • 本发明的光学传感器通过在将传感器暴露于待检测物质时从漏光模式变为波导模式来检测物质的存在和浓度。 该模式的变化导致光输出的大的变化。 测量该变化并且以高灵敏度识别和/或测量物质。通过在芯材周围具有包层材料,可以使传感器的波导模式的漏光模式变化,包层材料在指数中降低 当暴露于待检测物质时。 当包层的折射率变得小于芯材的折射率时,传感器从漏光模式变化并以波导模式工作。 随着时间的推移测量传感器输出的光强度变化,并与被检测物质相关。