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    • 12. 发明授权
    • Bipolar transistor with silicided sub-collector
    • 双极晶体管,带硅化子集电极
    • US07679164B2
    • 2010-03-16
    • US11620242
    • 2007-01-05
    • Francois PagetteChristian LavoieAnna Topol
    • Francois PagetteChristian LavoieAnna Topol
    • H01L27/102
    • H01L29/737H01L29/0821H01L29/66242
    • Embodiments of the invention provide a semiconductor device including a collector in an active region; a first and a second sub-collector, the first sub-collector being a heavily doped semiconductor material adjacent to the collector and the second sub-collector being a silicided sub-collector next to the first sub-collector; and a silicided reach-through in contact with the second sub-collector, wherein the first and second sub-collectors and the silicided reach-through provide a continuous conductive pathway for electrical charges collected by the collector from the active region. Embodiments of the invention also provide methods of fabricating the same.
    • 本发明的实施例提供了一种在有源区域中包括集电极的半导体器件; 第一和第二子集电极,所述第一子集电极是与所述集电极相邻的重掺杂半导体材料,所述第二子集电极是靠近所述第一子集电极的硅化副集电极; 以及与所述第二子集电器接触的硅化物到达通道,其中所述第一和第二子集电极和所述硅化物到达通道为所述集电器从所述有源区域收集的电荷提供连续的导电路径。 本发明的实施例还提供了制造该方法的方法。
    • 14. 发明申请
    • SUBLITHOGRAPHIC PATTERNING METHOD INCORPORATING A SELF-ALIGNED SINGLE MASK PROCESS
    • 自动对准单掩模过程的分层方案
    • US20090202952A1
    • 2009-08-13
    • US12028861
    • 2008-02-11
    • David W. AbrahamSteven E. SteenNicholas C.M. FullerFrancois Pagette
    • David W. AbrahamSteven E. SteenNicholas C.M. FullerFrancois Pagette
    • G03F7/26
    • H01L21/0337H01L21/32139
    • A method of implementing sub-lithographic patterning of a semiconductor device includes forming a first set of patterned features with a single lithography step, the initial set of patterned features characterized by a linewidth and spacing therebetween; forming a first set of sidewall spacers on the first set of patterned features, and thereafter removing the first set of patterned features so as to define a second set of patterned features based on the geometry of the first set of sidewall spacers; and performing one or more additional iterations of forming subsequent sets of sidewall spacers on subsequent sets of patterned features, followed by removal of the subsequent sets of patterned features, wherein a given set of patterned features is based on the geometry of an associated set of sidewall spacers formed prior thereto, and wherein a final of the subsequent sets of patterned features is characterized by a sub-lithographic dimension.
    • 实现半导体器件的次光刻图案化的方法包括用单个光刻步骤形成第一组图案化特征,初始的图案化特征集合以其间的线宽和间距为特征; 在所述第一组图案化特征上形成第一组侧壁间隔物,然后移除所述第一组图案特征,以便基于所述第一组侧壁间隔物的几何形状限定第二组图案特征; 以及执行在随后的图案化特征集合上形成随后的一组侧壁间隔物的一个或多个附加迭代,随后移除随后的一组图案化特征,其中给定的一组图案化特征基于相关联的一组侧壁的几何形状 间隔物在其之前形成,并且其中后续的一组图案化特征的最后的特征在于亚光刻尺寸。
    • 16. 发明授权
    • Bipolar transistor with a very narrow emitter feature
    • 双极晶体管具有非常窄的发射极特性
    • US07180157B2
    • 2007-02-20
    • US10978775
    • 2004-11-01
    • Gregory G. FreemanMarwan H. KhaterFrancois PagetteAndreas D. Stricker
    • Gregory G. FreemanMarwan H. KhaterFrancois PagetteAndreas D. Stricker
    • H01L27/082
    • H01L29/66287H01L29/0804H01L29/732
    • A double-polysilicon, self-aligned bipolar transistor has a collector region formed in a doped semiconductor substrate, an intrinsic counterdoped base formed on the surface of the substrate and a doped intrinsic emitter formed in the surface of the intrinsic base. An etch stop insulator layer overlies the intrinsic base layer above the collector. A base contact layer of a conductive material overlies the etch stop dielectric layer and the intrinsic base layer. A dielectric layer overlies the base contact layer. A wide window extends through the insulator layer and the base contact layer down to the insulator layer. An island or a peninsula is formed in the wide window leaving at least one narrowed window within the wide window, with sidewall spacers in either the wide window or the narrowed window. The narrowed windows are filled with doped polysilicon forming an extrinsic emitter with the intrinsic emitter formed below the extrinsic emitter in the surface of the intrinsic base.
    • 双重多晶硅,自对准双极晶体管具有在掺杂半导体衬底中形成的集电极区域,形成在衬底表面上的本征反掺杂基底和形成在本征基底表面的掺杂本征发射极。 蚀刻停止绝缘体层覆盖在收集器上方的本征基极层。 导电材料的基极接触层覆盖在蚀刻停止介电层和本征基极层之间。 电介质层覆盖在基底接触层上。 宽窗口延伸穿过绝缘体层和基底接触层向下延伸到绝缘体层。 在宽窗口中形成岛或半岛,在宽窗口内留下至少一个变窄的窗口,在宽窗口或狭窄窗口中具有侧壁间隔物。 变窄的窗口填充有掺杂的多晶硅,其形成外部发射极,本征发射极在本征基极表面的外部发射极之下形成。