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11. 发明公开

EP1604406A1 TRANSISTOR FOR ACTIVE MATRIX DISPLAY AND A METHOD FOR PRODUCING SAID TRANSISTOR 审中-公开
标题翻译：晶体管用于生产晶体管有源矩阵显示器和方法
公开(公告)号：EP1604406A1
公开(公告)日：2005-12-14
申请号：EP04708761.4
申请日：2004-02-06
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) , ECOLE POLYTECHNIQUE
发明人： ROCA I CABARROCAS, Pere , VANDERHAGHEN, Régis , DREVILLON, Bernard
IPC分类号： H01L29/786 , H01L21/336
CPC分类号： H01L29/66765 , H01L29/78603 , H01L29/78678
摘要： The invention concerns a transistor for active matrix display and a method for producing the said transistor (1). The transistor (1) comprises a microcrystalline silicon film (5) and an insulator (3). The crystalline fraction of the said microcrystalline silicon film (5) is above 80%. According to the invention, the transistor (1) comprises a plasma treated interface (4) located between the insulator (3) and the microcrystalline silicon film (5) so that the said transistor (1) has a linear mobility equal or superior to 1.5 cm2V-1s-1, shows threshold voltage stability and wherein the microcrystalline silicon film (5) comprises grains (6) whose size ranges between 10 nm and 400 nm. The invention concerns as well a display unit having a line-column matrix of pixels that are actively addressed, each pixel comprising at least a transistor as described above.

12. 发明公开

EP1828712A1 CARACTERISATION METROLOGIQUE DE CIRCUITS DE MICROELECTRONIQUE 有权
标题翻译：麦德龙合理定位微电路的电子
公开(公告)号：EP1828712A1
公开(公告)日：2007-09-05
申请号：EP05848201.9
申请日：2005-12-22
申请人： ECOLE POLYTECHNIQUE , Centre National de la Recherche Scientifique
发明人： DE MARTINO, Antonello , DREVILLON, Bernard
IPC分类号： G01B11/06 , G01J4/00 , G01N21/21
CPC分类号： G01N21/211 , G01B11/0641 , G01N2021/213
摘要： The invention relates to a method and device for the polarimetric measurement of a flat object with regularly repeating patterns forming lines of a network. According to the invention, a first zero order measurement is carried out with an angle of incidence (1) for a first azimuthal angle (1), a second zero order measurement is made, with an angle of incidence (2) for a second azimuthal angle (2), the polarisation of the incident beam is modulated and the polarisation of the reflected beam analysed for each measurement, the theoretical polarimetric data for an object model of the real object are calculated, the object model having parameters which may be adjusted by means of a formalism of the electromagnetism. The object is characterised by making an iterative comparison of measured with the theoretical polarimetric data for different values for the adjustable parameters.

13. 发明公开

EP1695332A2 CELLULE DE COMMANDE ELECTRONIQUE POUR DIODE ELECTROLUMINESCENTE ORGANIQUE D AFFICHEUR A MATRICE ACTIVE, PROCEDES DE FONCTIONN EMENT ET AFFICHEUR 审中-公开
标题翻译：电子控制细胞的有机电致发光的有源矩阵显示和运行方式，并显示其
公开(公告)号：EP1695332A2
公开(公告)日：2006-08-30
申请号：EP04816539.3
申请日：2004-12-13
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) , ECOLE POLYTECHNIQUE
发明人： DREVILLON, Bernard , ANCEAU, François Camille , BONNASSIEUX, Yvan, Eric , VANDERHAGHEN, Régis
IPC分类号： G09G3/32
CPC分类号： G09G3/3233 , G09G3/3258 , G09G2300/0842 , G09G2310/066 , G09G2320/0261
摘要： The invention relates to an electronic control cell for at least one organic electroluminescent diode (OLED) of a pixel or segment of an active matrix display, wherein the cell comprises at least one control circuit (6,61,62) with a control input and functioning according to a control signal arriving on a control line (5,5') and enabling the OLED(s) to be switched on or not, a capacitative storage memory for the control signal whereby the capacitor thereof is linked to the control line, a selection circuit (4,41,42) functioning according to a selection signal Vsel on a selection line (3,3'), enabling the capacitative storage circuit to be linked to or to be insulated in relation to a control voltageVcom, (2) according to the selection signal. According to the invention, storage is temporary by discharging the capacitor via a resistor Rf parallel to the capacitor. The invention also relates to operating methods and a display.

14. 发明公开

EP2948778A1 MICROSCOPE À SONDE LOCALE MULTIMODE, MICROSCOPE RAMAN EXALTÉ PAR POINTE ET PROCÉDÉ DE RÉGULATION DE LA DISTANCE ENTRE LA SONDE LOCALE ET L'ÉCHANTILLON 审中-公开
标题翻译：用于控制之间的本地和探测器的探测器距离的地方多模式探头尖端INCREASED拉曼显微镜和法显微镜
公开(公告)号：EP2948778A1
公开(公告)日：2015-12-02
申请号：EP14703140.5
申请日：2014-01-13
申请人： Ecole Polytechnique , Centre National de la Recherche Scientifique (C.N.R.S.)
发明人： CHAIGNEAU, Marc , KARAR, Akli , DREVILLON, Bernard , OSSIKOVSKI, Razvigor
IPC分类号： G01Q10/04 , G01Q20/04 , G01Q30/02 , G01Q60/04 , G01Q60/16 , G01Q60/26 , G01N21/65
CPC分类号： G01Q10/00 , G01J3/06 , G01J3/44 , G01N21/658 , G01Q10/045 , G01Q20/04 , G01Q30/02 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/26
摘要： The present invention relates to a microscope having a multimode local probe comprising: a resonator (1); a first electrode (9) and a second electrode (8); an excitation source suitable for generating mechanical resonance in the resonator; a metal tip (4) attached to the resonator; means allowing relative movement between the local probe and a sample, which can move the end of the tip so that it is at a distance Z between 0 and 100 nm from the sample; and means for detecting at least one electrical signal representing shear forces on the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said second output electrode (9), and the microscopy apparatus comprises means for amplifying and filtering the signals relative to the shear forces and to the tunneling current in a single electronic circuit; and means for controlling the distance Z between the end of the tip and the surface of the sample.

15. 发明授权

EP1828712B1 CARACTERISATION METROLOGIQUE DE CIRCUITS DE MICROELECTRONIQUE 有权
标题翻译：麦德龙合理定位微电路的电子
公开(公告)号：EP1828712B1
公开(公告)日：2008-07-23
申请号：EP05848201.9
申请日：2005-12-22
申请人： ECOLE POLYTECHNIQUE , Centre National de la Recherche Scientifique
发明人： DE MARTINO, Antonello , DREVILLON, Bernard
IPC分类号： G01B11/06 , G01J4/00 , G01N21/21
CPC分类号： G01N21/211 , G01B11/0641 , G01N2021/213
摘要： The invention relates to a method and device for the polarimetric measurement of a flat object with regularly repeating patterns forming lines of a network. According to the invention, a first zero order measurement is carried out with an angle of incidence (1) for a first azimuthal angle (1), a second zero order measurement is made, with an angle of incidence (2) for a second azimuthal angle (2), the polarisation of the incident beam is modulated and the polarisation of the reflected beam analysed for each measurement, the theoretical polarimetric data for an object model of the real object are calculated, the object model having parameters which may be adjusted by means of a formalism of the electromagnetism. The object is characterised by making an iterative comparison of measured with the theoretical polarimetric data for different values for the adjustable parameters.

16. 发明申请

WO2006018575A1 NANOCOMPOSITE PHOTOACTIF ET SON PROCEDE DE FABRICATION 审中-公开
标题翻译：光学纳米复合材料及其生产方法
公开(公告)号：WO2006018575A1
公开(公告)日：2006-02-23
申请号：PCT/FR2005/050605
申请日：2005-07-21
申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE - CEA , ECOLE POLYTECHNIQUE , FIRON, Muriel , DREVILLON, Bernard , FONCTCUBERTA I MORRAL, Anna , PALACIN, Serge , ROCA I CABARROCAS, Pere
发明人： FIRON, Muriel , DREVILLON, Bernard , FONCTCUBERTA I MORRAL, Anna , PALACIN, Serge , ROCA I CABARROCAS, Pere
IPC分类号： H01L51/20
CPC分类号： H01L51/4213 , B82Y10/00 , B82Y30/00 , H01L51/002 , H01L51/0036 , H01L51/0048 , H01L51/4266 , H01L2251/308 , Y02E10/549
摘要： L'invention concerne un nanocomposite (3) photoactif comportant au moins un couple d'éléments semiconducteurs donneur-accepteur. L'un des éléments est formé de nanofils (7) dopés à structure sp3, et l'autre des éléments est un composé organique (8). Lesdits éléments sont supportés par un substrat (1 ) de dispositif. L'invention concerne aussi un procédé de fabrication. Selon un premier mode de réalisation, après leur croissance, les nanofils (7) sont prélevés, fonctionnalisés et sont solubilisés dans l'élément organique (8). Le mélange est déposé par enduction sur un substrat de dispositif. Selon un deuxième mode de réalisation, des nanofils (7) sont formés sur un substrat de croissance (5) qui est aussi le substrat de dispositif. L'élément organique (8) est associé aux nanofils (7) de façon à former une couche active (3). Un tel nanocomposite (3) photoactif permet la réalisation d'une cellule photovoltaïque.
摘要翻译：本发明涉及包含至少一对供体 - 受体半导体元件的光活性纳米复合材料（3），其中元件由掺杂有sp 3结构的纳米线（7）和以有机化合物形式体现的另一元素组成 8）。所述元件由器件的衬底（1）承载。还公开了一种制备方法，在第一实施方案中，在有机元素（8）中选择，制造和增溶生长的纳米线并通过涂覆在器件基底上沉积混合物。在第二实施例中，纳米线（7）形成在以器件衬底的形式体现的生长衬底（5）上。有机元素（8）以与活性层（3）形成的方式与纳米线（7）相关联。本发明的光活性纳米复合材料使得可以生产光伏电池。

17. 发明申请

WO2002061401A1 PROCEDE DE CARACTERISATION OU DE CONTROLE DE L'ELABORATION D'UN COMPOSANT EN COUCHES MINCES PAR METHODES OPTIQUES 审中-公开
标题翻译：使用光学方法表征或控制薄层组件的生产方法
公开(公告)号：WO2002061401A1
公开(公告)日：2002-08-08
申请号：PCT/FR2002/000380
申请日：2002-01-31
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.) , JOBIN YVON S.A. , HOFRICHTER, Alfred , DREVILLON, Bernard , KOUZNETSOV, Dmitri
发明人： HOFRICHTER, Alfred , DREVILLON, Bernard , KOUZNETSOV, Dmitri
IPC分类号： G01N21/21
CPC分类号： G01B11/0616 , G01N21/211
摘要： La présente invention concerne un procédé de caractérisation ou de contrôle de l'élaboration d'un composant en couches minces par méthodes optiques. On traite les signaux S1 et S2 ainsi acquis pour obtenir les paramètres x, e des couches déposées. L'empilement est représenté par le produit de deux matrices d'Abeles pour chaque direction de polarisation s (perpendiculaire au plan d'incidence) et p (parallèle au plan d'incidence) : une matrice Mos,p connue représentant le support, une matrice dMs,p représentant une couche mince transparente en cours de dépôt.L''inversion des variations des signaux mesurés dS1, dS2 permet d'obtenir l'épaisseur x et la constante diélectrique e de la couche mince par les opérations suivantes : développement de Taylor en fonction de la variation dx de l'épaisseur x de la couche mince des coefficients de la matrice dM, calcul des coefficients de la matrice Ms,p chacun sous la forme A(e±2) dx² + B(e±1) dx + C, en déduire la relation S1,2 = A1,2(e±2) dx² + B1,2(e±1) dx + C1,2 reliant les signaux S1 et S2 aux paramètres e et dx, éliminer dx, en déduire une fonction maître P(e±4) = 0, résoudre l'équation par une méthode appropriée, sélectionner les solutions de cette équation correspondant ô des valeurs physiquement plausibles, pour mesurer
摘要翻译：本发明涉及使用光学方法来表征或控制薄层成分的制造的方法。处理获取信号S1和S2以获得沉积层的参数x，ε。堆叠由每个偏振方向s（垂直于入射平面）和p（平行于入射平面）的两个Abeles矩阵的乘积表示：已知矩阵Mos，p表示支持和矩阵dMs，p表示薄的透明层被沉积。测量的信号变化dS1和dS2被反转以通过以下操作获得薄层的厚度x和介电常数ε：作为矩阵系数的薄层的厚度x的变化dx的函数的泰勒展开 DM; 矩阵Ms，p的系数各自以形式A（ε= +/- 2））dx2 + B（ε1+/- 1）dx + C计算，并且关系式S1,2 = A1，因此，推导出将信号S1和S2连接到参数ε和dx的2（ε<+/- 2>）dx2 + B1,2（epsilon <+/- 1>）dx + C1,2; dx被消除，从而推断出主函数P（ε<+/- 4>）= 0; 使用合适的方法来求解该方程，并且选择与所述方程式的解相对应的物理上似乎为了测量ε而使用获得的ε值来确定dx的值。

18. 发明公开

EP1165855A1 PROCEDE DE TRAITEMENT DE SURFACE DES POLYMERES 有权
标题翻译：方法用于聚合物材料的表面处理
公开(公告)号：EP1165855A1
公开(公告)日：2002-01-02
申请号：EP00910915.8
申请日：2000-03-09
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
发明人： DREVILLON, Bernard , BULKINE, Pavel,Résidence d'Orsay , HOFRICHTER, Alfred, Franz
IPC分类号： C23C16/02 , C23C16/50
CPC分类号： C23C16/0272 , C23C16/511 , Y10T428/31507
摘要： The invention concerns a method for treating a surface for the protection and functionalisation of polymers (4) by gas plasma deposit in a confined chamber (10) of one or several silicon alloy layers (43). The silicon alloy is selected among silicon and its oxides, nitrides, oxynitrides; the deposit is performed at a temperature less than the degradation temperature of the polymer, and a physico-chemical surface pre-treatment by plasma is performed in the same chamber before the silicon alloy is deposited; the pre-treatment consisting in a surface treatment comprising etching a surface zone of the polymer and step which consists in depositing a polymeric carbon compound.

19. 发明授权

EP1086355B1 PROCEDE ELLIPSOMETRIQUE ET DISPOSITIF DE COMMANDE DE LA FABRICATION D'UN COMPOSANT EN COUCHE MINCE 有权
标题翻译：用于生产薄膜COMPONENT椭偏测控装置
公开(公告)号：EP1086355B1
公开(公告)日：2006-06-07
申请号：EP99923728.2
申请日：1999-06-11
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
发明人： DREVILLON, Bernard
IPC分类号： G01B11/06 , G01N21/21 , C30B25/16
CPC分类号： G01N21/211
摘要： The invention concerns a method for controlling the production of an object controlled by a gas panel, which consists in performing an ellipsometric measurement on the object represented by its Mueller matrix; controlling, by means of a gas panel, the manufacture on the basis of the ellipsometric measurement. The invention is characterised in that it consists in determining beforehand certain parameters of the Mueller matrix, for characterising the manufacture, and only said parameters are extracted from the ellipsometric measurement during manufacture, said parameters being two different parameters of the ellipsometric angles psi and DELTA and trigonometric functions thereof. The invention also concerns an installation for manufacturing an object controlled by a gas panel comprising an ellipsometre for producing a measurement on the object which is represented by its Mueller matrix.

20. 发明公开

EP1358467A1 PROCEDE DE CARACTERISATION OU DE CONTROLE DE L'ELABORATION D'UN COMPOSANT EN COUCHES MINCES PAR METHODES OPTIQUES 审中-公开
标题翻译：检定和制造薄膜 - 薄膜组分控制方法采用光学方法
公开(公告)号：EP1358467A1
公开(公告)日：2003-11-05
申请号：EP02701368.9
申请日：2002-01-31
申请人： Centre National de la Recherche Scientifique ( CNRS) , Jobin Yvon S.A.
发明人： HOFRICHTER, Alfred , DREVILLON, Bernard , KOUZNETSOV, Dmitri
IPC分类号： G01N21/21 , G01B11/06
CPC分类号： G01B11/0616 , G01N21/211
摘要： The invention relates to a method for characterising or controlling the production of a thin-layered component using optical methods. Acquired signals S1 and S2 are processed in order to obtain parameters x, ε of the deposited layers. The stacking is represented by the product of two Abeles matrices for each direction of polarisation s (perpendicular to the incidence plane) and p (parallel to the incidence plane): a known matrix Mos,p representing the support and matrix dMs,p representing a thin transparent layer being deposited. The signal variations measured, dS1 and dS2, are inverted to obtain thickness x and dielectric constant ε of the thin layer by means of the following operations: Taylor expansion as a function of variation dx of thickness x of the thin layer of the coefficients of matrix dM; the coefficients of matrix Ms,p are calculated each in the form A(ε±2) dx2 + B(ε±1) dx + C and the relation S¿1,2? = A1,2(ε?±2) dx2¿ + B¿1,2?(ε?±1¿) dx + C¿1,2? is thereby deduced which connects signals S1 and S2 to parameters ε and dx; dx is eliminated and a master function P(ε?±4¿) = 0 is thereby deduced; the equation is solved using a suitable method and the solutions to said equation are selected corresopnding to values that are physically plausible in order to measure ε and use the ε value obtained to determine dx.

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