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1. 发明公开

EP2948778A1 MICROSCOPE À SONDE LOCALE MULTIMODE, MICROSCOPE RAMAN EXALTÉ PAR POINTE ET PROCÉDÉ DE RÉGULATION DE LA DISTANCE ENTRE LA SONDE LOCALE ET L'ÉCHANTILLON 审中-公开
标题翻译：用于控制之间的本地和探测器的探测器距离的地方多模式探头尖端INCREASED拉曼显微镜和法显微镜
公开(公告)号：EP2948778A1
公开(公告)日：2015-12-02
申请号：EP14703140.5
申请日：2014-01-13
申请人： Ecole Polytechnique , Centre National de la Recherche Scientifique (C.N.R.S.)
发明人： CHAIGNEAU, Marc , KARAR, Akli , DREVILLON, Bernard , OSSIKOVSKI, Razvigor
IPC分类号： G01Q10/04 , G01Q20/04 , G01Q30/02 , G01Q60/04 , G01Q60/16 , G01Q60/26 , G01N21/65
CPC分类号： G01Q10/00 , G01J3/06 , G01J3/44 , G01N21/658 , G01Q10/045 , G01Q20/04 , G01Q30/02 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/26
摘要： The present invention relates to a microscope having a multimode local probe comprising: a resonator (1); a first electrode (9) and a second electrode (8); an excitation source suitable for generating mechanical resonance in the resonator; a metal tip (4) attached to the resonator; means allowing relative movement between the local probe and a sample, which can move the end of the tip so that it is at a distance Z between 0 and 100 nm from the sample; and means for detecting at least one electrical signal representing shear forces on the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said second output electrode (9), and the microscopy apparatus comprises means for amplifying and filtering the signals relative to the shear forces and to the tunneling current in a single electronic circuit; and means for controlling the distance Z between the end of the tip and the surface of the sample.

2. 发明申请

WO2014114860A1 MICROSCOPE À SONDE LOCALE MULTIMODE, MICROSCOPE RAMAN EXALTÉ PAR POINTE ET PROCÉDÉ DE RÉGULATION DE LA DISTANCE ENTRE LA SONDE LOCALE ET L'ÉCHANTILLON 审中-公开
标题翻译：具有多模式本地探测器，提升拉曼显微镜的显微镜和用于控制本地探头与样品之间的距离的方法
公开(公告)号：WO2014114860A1
公开(公告)日：2014-07-31
申请号：PCT/FR2014/050058
申请日：2014-01-13
申请人： ECOLE POLYTECHNIQUE , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
发明人： CHAIGNEAU, Marc , KARAR, Akli , DREVILLON, Bernard , OSSIKOVSKI, Razvigor
IPC分类号： G01Q10/04 , G01Q20/04 , G01Q30/02 , G01Q60/04 , G01Q60/16 , G01Q60/26 , G01N21/65
CPC分类号： G01Q10/00 , G01J3/06 , G01J3/44 , G01N21/658 , G01Q10/045 , G01Q20/04 , G01Q30/02 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/26
摘要： La présente invention concerne un microscope à sonde locale multimode comportant un résonateur (1), une première électrode (9) et une seconde électrode (8), une source d'excitation adaptée pour générer une résonance mécanique dans le résonateur, une pointe (4) métallique fixée sur le résonateur, des moyens de déplacement relatif entre la sonde locale et un échantillon adaptés pour approcher l'extrémité de la pointe à une distance Z comprise entre 0 et 100 nm et des moyens de détection d'au moins un signal électrique représentatif des forces de friction aux bornes desdites électrodes (8, 9). Selon l'invention, ladite pointe métallique (4) est reliée électriquement à ladite deuxième électrode de sortie (9) et l'appareil de microscopie comporte des moyens d'amplification et de filtrage des signaux relatifs aux forces de frictions et au courant tunnel dans un seul et même circuit électronique, des moyens de régulation de la distance Z entre l'extrémité de la pointe et la surface de l'échantillon.
摘要翻译：本发明涉及具有多模局部探针的显微镜，其包括：谐振器（1）; 第一电极（9）和第二电极（8）; 适于在谐振器中产生机械谐振的激励源; 附接到谐振器的金属尖端（4）; 意味着允许局部探针和样品之间的相对移动，其可以移动尖端的端部，使得其距离样品处于距离Z在0和100nm之间; 以及用于检测表示所述电极（8,9）的端子上的剪切力的至少一个电信号的装置。根据本发明，所述金属尖端（4）电连接到所述第二输出电极（9），并且所述显微镜装置包括用于在单个电子电路中相对于剪切力和隧道电流放大和滤波信号的装置 ; 以及用于控制尖端的端部和样品表面之间的距离Z的装置。

3. 发明申请

WO2007082937A1 POLARIMETRIC RAMAN SYSTEM AND METHOD FOR ANALYSING A SAMPLE 审中-公开
标题翻译：极化拉曼系统和分析样品的方法
公开(公告)号：WO2007082937A1
公开(公告)日：2007-07-26
申请号：PCT/EP2007/050547
申请日：2007-01-19
申请人： ECOLE POLYTECHNIQUE , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE , OSSIKOVSKI, Razvigor , DE MARTINO, Antonello , DREVILLON, Bernard
发明人： OSSIKOVSKI, Razvigor , DE MARTINO, Antonello , DREVILLON, Bernard
IPC分类号： G01N21/65 , G01N21/21 , G01J3/44
CPC分类号： G01J3/44 , G01J3/02 , G01J3/0224 , G01N21/21 , G01N21/65 , G01N21/658 , G01N2021/4792
摘要： The present invention concerns a Raman method and system for analysing a sample (4) comprising an excitation source (1) emitting an incident light beam (2), a sample holder (3), on which the sample (4) can be mounted, means for focusing the incident light beam (2) onto the sample surface (16) to generate a Raman scattered light having an intensity, means for collecting the Raman scattered light to form a Raman scattered light beam (5), a detection system (6) measuring intensity of the Raman scattered light beam (5) as a function of time. According to the invention, it comprises at least a polarization state generator (PSG) (7) able to generate four independent polarization states or a polarization state analyser (PSA) (8) able to analyse four independent polarization states in order to detect the intensity of the Raman scattered light beam (5) making it possible to calculate a partial or complete Mueller- Stokes matrix of the sample (4), the incident light beam (2) passing through said PSG (7) before being scattered by the sample (4) and the Raman scattered light beam (5) passing through said PSA (8) after being scattered by the sample (4).
摘要翻译：本发明涉及一种用于分析样品（4）的拉曼方法和系统，该样品（4）包括发射入射光束（2）的激发源（1），可以安装样品（4）的样品保持器（3）用于将入射光束（2）聚焦到样品表面（16）上以产生具有强度的拉曼散射光的装置，用于收集拉曼散射光以形成拉曼散射光束（5）的装置，检测系统（6））测量拉曼散射光束（5）的强度作为时间的函数。根据本发明，它包括至少能够产生四个独立极化状态的偏振状态发生器（PSG）（7）或能够分析四个独立极化状态的偏振状态分析器（PSA）（8），以便检测强度的拉曼散射光束（5），使得可以计算样品（4）的部分或完整的米勒 - 斯托克斯矩阵，入射光束（2）在被样品散射之前穿过所述PSG（7） 4）和被样品（4）散射之后穿过所述PSA（8）的拉曼散射光束（5）。

4. 发明公开

EP1974204A1 POLARIMETRIC RAMAN SYSTEM AND METHOD FOR ANALYSING A SAMPLE 审中-公开
标题翻译：偏振拉曼光谱仪和方法分析样品
公开(公告)号：EP1974204A1
公开(公告)日：2008-10-01
申请号：EP07704017.8
申请日：2007-01-19
申请人： ECOLE POLYTECHNIQUE , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
发明人： OSSIKOVSKI, Razvigor , DE MARTINO, Antonello , DREVILLON, Bernard
IPC分类号： G01N21/65 , G01N21/21 , G01J3/44
CPC分类号： G01J3/44 , G01J3/02 , G01J3/0224 , G01N21/21 , G01N21/65 , G01N21/658 , G01N2021/4792
摘要： The present invention concerns a Raman method and system for analysing a sample (4) comprising an excitation source (1) emitting an incident light beam (2), a sample holder (3), on which the sample (4) can be mounted, means for focusing the incident light beam (2) onto the sample surface (16) to generate a Raman scattered light having an intensity, means for collecting the Raman scattered light to form a Raman scattered light beam (5), a detection system (6) measuring intensity of the Raman scattered light beam (5) as a function of time. According to the invention, it comprises at least a polarization state generator (PSG) (7) able to generate four independent polarization states or a polarization state analyser (PSA) (8) able to analyse four independent polarization states in order to detect the intensity of the Raman scattered light beam (5) making it possible to calculate a partial or complete Mueller- Stokes matrix of the sample (4), the incident light beam (2) passing through said PSG (7) before being scattered by the sample (4) and the Raman scattered light beam (5) passing through said PSA (8) after being scattered by the sample (4).

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