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    • 11. 发明授权
    • Substrate processing method and semiconductor manufacturing apparatus
    • 基板加工方法和半导体制造装置
    • US07727780B2
    • 2010-06-01
    • US12010274
    • 2008-01-23
    • Masashi SugishitaMasaaki UenoAkira Hayashida
    • Masashi SugishitaMasaaki UenoAkira Hayashida
    • G01R31/26H01L21/66
    • H01L22/20H01L2924/0002Y10S438/905H01L2924/00
    • A semiconductor manufacturing apparatus and substrate processing method includes a step of acquiring a measurement value based on a first detecting and a second detecting section and determining a first difference of measurement values between the first detecting section and the second detecting section, comparing between a previously stored second difference between measurement values concerning the first detecting section and the second detecting section, calculating a correction value for a pressure in a cooling-gas passage provided between a process chamber and a heating device depending upon the first difference when the first difference is different from the second difference, and correcting the pressure value based on the pressure correction value, and a step of processing the substrate by flowing a cooling gas through the cooling-gas passage while heating the process chamber, and placing the heating device and the cooling device under a control section depending upon a pressure value corrected.
    • 半导体制造装置和基板处理方法包括以下步骤:基于第一检测和第二检测部分获取测量值,并确定第一检测部分和第二检测部分之间的测量值的第一差异, 与第一检测部分和第二检测部分相关的测量值之间的第二差异,当第一差异不同时,根据第一差异来计算设置在处理室和加热装置之间的冷却气体通道中的压力的​​校正值 第二差异,并且基于压力校正值校正压力值,以及通过在加热处理室的同时使冷却气体流过冷却气体通道来处理基板的步骤,并且将加热装置和冷却装置放置在 取决于压力的控制部分 价值更正。
    • 20. 发明授权
    • Heat treatment apparatus and method of manufacturing semiconductor device
    • 热处理装置及半导体装置的制造方法
    • US08734148B2
    • 2014-05-27
    • US13033974
    • 2011-02-24
    • Keishin YamazakiAkira HayashidaMasaaki UenoManabu IzumiKatsuaki Nogami
    • Keishin YamazakiAkira HayashidaMasaaki UenoManabu IzumiKatsuaki Nogami
    • F27D1/00
    • H01L21/67109
    • A heat treatment apparatus capable of achieving high-accuracy processing and high safety and a method of manufacturing a substrate are provided. The heat treatment apparatus 10 includes a reaction tube 42 for processing a substrate, a manifold 44 for supporting the reaction tube 42, a heater 46 installed around the reaction tube 42 to heat an inner part of the reaction tube 42, a surrounding member 500 installed to surround a side portion of the reaction tube 42 arranged in a lower portion than the heater 46; an exhaust device 301 for forcibly exhausting a gap 506 between the surrounding member 500 and the reaction tube 42; and a sealing member 150 installed in a contacting portion between the reaction tube 42 and the manifold 44. Here, an inlet hole 501 through which the exhaust device inhales an atmosphere outside the surrounding member 500 to the gap 506 is installed in the surrounding member 500.
    • 提供能够实现高精度加工和高安全性的热处理设备和制造基板的方法。 热处理装置10包括用于处理基板的反应管42,用于支撑反应管42的歧管44,安装在反应管42周围以加热反应管42的内部的加热器46,安装 围绕设置在比加热器46下部的反应管42的侧部; 用于强制地排出周围构件500与反应管42之间的间隙506的排气装置301; 以及安装在反应管42和歧管44之间的接触部分中的密封构件150.这里,排气装置将围绕构件500外部的气氛吸入间隙506的入口孔501安装在周围构件500中 。