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    • 11. 发明授权
    • Random access memory employing complementary transistor switch (CTS)
memory cells
    • 采用互补晶体管开关(CTS)存储单元的随机存取存储器
    • US4752913A
    • 1988-06-21
    • US857903
    • 1986-04-30
    • Yuen H. ChanJames R. Struk
    • Yuen H. ChanJames R. Struk
    • G11C11/413G11C11/411G11C11/415G11C11/416G11C11/417G11C7/00
    • G11C11/416G11C11/4113G11C11/417
    • Disclosed is an improved bit selection circuit for a RAM, in particular one employing CTS (complementary transistor switch) cells. The bit select circuitry includes interconnected first and second level matrix decoders, each memory column has a pair of bit lines, each pair of bit lines has connected thereto a bit select circuit, each of the bit select circuits being connected to an output of the second level decoder, a bit up-level clamp circuit connected to each of the bit select circuits of each pair of bit lines, each of the bit select circuits including a first circuit for increasing the speed of selection of the selected pair of lines, the bit up-level clamp circuit cooperating with the bit select circuit of the selected pair of bit lines for positively limiting the upper potential level of the selected pair of bit lines, and each of the bit select circuits including a second circuit for increasing the speed of deselection of the selected pair of bit lines.
    • 公开了一种用于RAM的改进位选择电路,特别是采用CTS(互补晶体管开关)单元的位选择电路。 位选择电路包括互连的第一和第二级矩阵解码器,每个存储器列具有一对位线,每对位线连接到位选择电路,每个位选择电路连接到第二级 电平解码器,连接到每对位线的每个位选择电路的位上电平钳位电路,每个位选择电路包括用于增加所选择的一对线的选择速度的第一电路,位 上位钳位电路与所选择的位线对的位选择电路协作,用于积极地限制所选择的位线对的上电位电平,并且每个位选择电路包括用于增加取消选择速度的第二电路 的所选位线对。
    • 12. 发明授权
    • Means for enhancing logic circuit performance
    • 提高逻辑电路性能的手段
    • US4529894A
    • 1985-07-16
    • US273706
    • 1981-06-15
    • Yuen H. ChanJames E. DickersonWalter S. KlaraTheodore W. KwapJoseph M. Mosley
    • Yuen H. ChanJames E. DickersonWalter S. KlaraTheodore W. KwapJoseph M. Mosley
    • H03K5/12H03K17/04H03K19/013H03K19/086H03K19/01H03K19/082
    • H03K19/0136
    • Disclosed is a means for enhancing logic circuit performance and more particularly, for enhancing the switching speeds of a variety of logic circuits. What is involved is the insertion of a so called "snap" or enhancement transistor connected to a common node defining an output of a basic logic circuit. In one example, the emitter of this "snap" transistor is connected to an output node in the circuit, which in conventional practice would be charged during an upgoing transition by a fixed RC time constant. In accordance with the present improvement, however, the "snap" transistor, due to charge stored therein, remains conducting--although the associated logic device is turned off. This current discharges as reverse base current and the output provides what appears to be an inductive voltage spike. The effect is that a temporary source of current is available to charge the common node. As a result, the transition time involved in going from one voltage level to another at the output node is substantially reduced.
    • 公开了用于增强逻辑电路性能的手段,更具体地说,用于增强各种逻辑电路的切换速度。 所涉及的是将所谓的“卡扣”或增强型晶体管插入连接到限定基本逻辑电路的输出的公共节点。 在一个示例中,该“捕捉”晶体管的发射极连接到电路中的输出节点,其在常规实践中将在上行转换期间被固定的RC时间常数充电。 然而,根据本发明的改进,由于存储在其中的电荷,“卡扣”晶体管保持导通,尽管关联的逻辑器件被关断。 该电流作为反向基极电流放电,并且输出提供看起来是感应电压尖峰。 效果是临时的电流源可用于对公共节点充电。 结果,显着减少了在输出节点从一个电压电平转到另一个电压电平的过渡时间。
    • 13. 发明授权
    • Programmable control clock circuit including scan mode
    • 可编程控制时钟电路包括扫描模式
    • US08299833B2
    • 2012-10-30
    • US12796970
    • 2010-06-09
    • Paul A. BunceYuen H. ChanJohn D. DavisRichard E. Serton
    • Paul A. BunceYuen H. ChanJohn D. DavisRichard E. Serton
    • H03K3/017
    • H03K5/156
    • A programmable clock control circuit includes a base block configured to control operation of the programmable clock control circuit and a chop block configured to control the width of an output clock signal of the programmable clock control circuit. The circuit also includes a pulse width variation block providing a pulse width variation output to the base block, the base block output being variable to provide at least three different output pulse widths. The circuit also includes a launch clock delay block coupled to delay the output of the base block and a scan clock delay block to delay the output pulse and a selector that causes either the scan clock delay block or the launch clock delay block to be active based on a value of a scan gate signal.
    • 可编程时钟控制电路包括被配置为控制可编程时钟控制电路的操作的基本块和被配置为控制可编程时钟控制电路的输出时钟信号的宽度的斩波块。 电路还包括提供脉冲宽度变化输出到基本块的脉冲宽度变化块,基本块输出是可变的以提供至少三个不同的输出脉冲宽度。 电路还包括发射时钟延迟块,其耦合以延迟基本块的输出和延迟输出脉冲的扫描时钟延迟块和使得扫描时钟延迟块或启动时钟延迟块基于有源的选择器 对扫描门信号的值。
    • 20. 发明授权
    • Ring oscillator row circuit for evaluating memory cell performance
    • 用于评估存储单元性能的环形振荡器行电路
    • US07483322B2
    • 2009-01-27
    • US11963794
    • 2007-12-22
    • Rajiv V. JoshiQiuyi YeYuen H. ChanAnirudh Devgan
    • Rajiv V. JoshiQiuyi YeYuen H. ChanAnirudh Devgan
    • G11C29/00
    • G11C29/50G11C29/50012
    • A ring oscillator row circuit for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A ring oscillator is implemented with a row of memory cells and has outputs connected to one or more bitlines along with other memory cells that are substantially identical to the ring oscillator cells. Logic may be included for providing a fully functional memory array, so that the cells other than the ring oscillator cells can be used for storage when the ring oscillator row wordlines are disabled. One or both power supply rails of individual cross-coupled inverter stages forming static memory cells used in the ring oscillator circuit may be isolated from each other in order to introduce a voltage asymmetry so that circuit asymmetry effects on delay can be evaluated.
    • 用于评估存储单元性能的环形振荡器行电路在实际的存储器电路环境中提供电路延迟和性能测量。 环形振荡器用一行存储器单元实现,并且具有连接到一个或多个位线以及与环形振荡器单元基本相同的其它存储器单元的输出。 可以包括用于提供完全功能的存储器阵列的逻辑,使得当环形振荡器行字线被禁用时,除了环形振荡器单元之外的单元可以用于存储。 形成环形振荡器电路中使用的静态存储单元的各个交叉耦合的逆变器级的一个或两个电源轨可以彼此隔离,以引入电压不对称,从而可以评估电路不对称对延迟的影响。