会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 96. 发明申请
    • Method of fabricating semiconductor memory device having plurality of storage node electrodes
    • 制造具有多个存储节点电极的半导体存储器件的方法
    • US20070082471A1
    • 2007-04-12
    • US11546420
    • 2006-10-12
    • Dae-hyuk KangJung-min OhChang-ki HongSang-jun ChoiWoo-gwan Shim
    • Dae-hyuk KangJung-min OhChang-ki HongSang-jun ChoiWoo-gwan Shim
    • H01L21/3205
    • H01L28/90H01L21/0334H01L21/31144H01L27/10852
    • In one aspect, a method of fabricating a semiconductor memory device is provided which includes forming a mold insulating film over first and second portions of a semiconductor substrate, where the mold insulating film includes a plurality of storage node electrode holes spaced apart over the first portion of the semiconductor substrate. The method further includes forming a plurality of storage node electrodes on inner surfaces of the storage node electrode holes, respectively, and forming a capping film which covers the storage node electrodes and a first portion of the mold insulating film located over the first portion of the semiconductor substrate, and which exposes a second portion of the mold insulating film located over the second portion of the semiconductor substrate. The method further includes selectively removing, including wet etching, the mold insulating film to expose a sidewall of at least one storage node electrode among the storage node electrodes covered by the capping film, and removing the capping film by dry etching to expose upper portions of the storage node electrodes.
    • 一方面,提供一种制造半导体存储器件的方法,其包括在半导体衬底的第一和第二部分上形成模绝缘膜,其中所述模绝缘膜包括在所述第一部分上分开的多个存储节点电极孔 的半导体衬底。 该方法还包括分别在存储节点电极孔的内表面上形成多个存储节点电极,并且形成覆盖存储节点电极的封盖膜和位于第一部分上的模具绝缘膜的第一部分 半导体衬底,并且暴露位于半导体衬底的第二部分上方的模具绝缘膜的第二部分。 该方法还包括选择性地去除包括湿式蚀刻的模具绝缘膜,以暴露由覆盖膜覆盖的存储节点电极中的至少一个存储节点电极的侧壁,以及通过干蚀刻去除封盖膜以暴露 存储节点电极。