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1. 发明授权

US07668037B2 Storage array including a local clock buffer with programmable timing 有权
标题翻译：存储阵列包括具有可编程时序的本地时钟缓冲器
公开(公告)号：US07668037B2
公开(公告)日：2010-02-23
申请号：US11935566
申请日：2007-11-06
申请人： Gary D. Carpenter , Fadi H. Gebara , Jerry C. Kao , Jente B Kuang , Kevin J. Nowka , Liang-Teck Pang
发明人： Gary D. Carpenter , Fadi H. Gebara , Jerry C. Kao , Jente B Kuang , Kevin J. Nowka , Liang-Teck Pang
IPC分类号： G11C8/00
CPC分类号： G11C7/22 , G11C7/12 , G11C7/222 , G11C29/02 , G11C29/023 , G11C29/14 , G11C29/50 , G11C29/50012
摘要： A storage array including a local clock buffer with programmable timing provides a mechanism for evaluating circuit timing internal to the storage array. The local clock buffer can independently adjust the pulse width of a local clock that controls the wordline and local bitline precharge pulses and the pulse width of a delayed clock that controls the global bitline precharge, evaluate and read data latching. The delay between the local clock and the delayed clock can also be adjusted. By varying the pulse widths of the local and delayed clock signal, along with the inter-clock delay, the timing margins of each cell in the array can be evaluated by reading and writing the cell with varying pulse width and clock delay. The resulting evaluation can be used to evaluate timing margin variation within a die, as well variation from die-to-die and under varying environments, e.g., voltage and temperature variation.
摘要翻译：包括具有可编程时序的本地时钟缓冲器的存储阵列提供了用于评估存储阵列内部的电路定时的机制。本地时钟缓冲器可以独立调节控制字线和本地位线预充电脉冲的本地时钟的脉冲宽度以及控制全局位线预充电，评估和读取数据锁存的延迟时钟的脉冲宽度。本地时钟和延迟时钟之间的延迟也可以调整。通过改变本地和延迟的时钟信号的脉冲宽度以及时钟间延迟，可以通过读取和写入具有变化的脉冲宽度和时钟延迟的单元来评估阵列中每个单元的定时裕度。所得到的评估可用于评估管芯内的时间裕度变化，以及在管芯到管芯之间以及在变化的环境（例如电压和温度变化）下的变化。

2. 发明申请

US20090116312A1 Storage Array Including a Local Clock Buffer with Programmable Timing 有权
标题翻译：包括具有可编程时序的本地时钟缓冲器的存储阵列
公开(公告)号：US20090116312A1
公开(公告)日：2009-05-07
申请号：US11935566
申请日：2007-11-06
申请人： Gary D. Carpenter , Fadi H. Gebara , Jerry C. Kao , Jente B. Kuang , Kevin J. Nowka , Liang-Teck Pang
发明人： Gary D. Carpenter , Fadi H. Gebara , Jerry C. Kao , Jente B. Kuang , Kevin J. Nowka , Liang-Teck Pang
IPC分类号： G11C7/00 , G11C8/00
CPC分类号： G11C7/22 , G11C7/12 , G11C7/222 , G11C29/02 , G11C29/023 , G11C29/14 , G11C29/50 , G11C29/50012
摘要： A storage array including a local clock buffer with programmable timing provides a mechanism for evaluating circuit timing internal to the storage array. The local clock buffer can independently adjust the pulse width of a local clock that controls the wordline and local bitline precharge pulses and the pulse width of a delayed clock that controls the global bitline precharge, evaulate and read data latching. The delay between the local clock and the delayed clock can also be adjusted. By varying the pulse widths of the local and delayed clock signal, along with the inter-clock delay, the timing margins of each cell in the array can be evaluated by reading and writing the cell with varying pulse width and clock delay. The resulting evaluation can be used to evaluate timing margin variation within a die, as well variation from die-to-die and under varying environments, e.g., voltage and temperature variation.
摘要翻译：包括具有可编程时序的本地时钟缓冲器的存储阵列提供了用于评估存储阵列内部的电路定时的机制。本地时钟缓冲器可以独立调节控制字线和本地位线预充电脉冲的本地时钟的脉冲宽度以及控制全局位线预充电，延迟和读取数据锁存的延迟时钟的脉冲宽度。本地时钟和延迟时钟之间的延迟也可以调整。通过改变本地和延迟的时钟信号的脉冲宽度以及时钟间延迟，可以通过读取和写入具有变化的脉冲宽度和时钟延迟的单元来评估阵列中每个单元的定时裕度。所得到的评估可用于评估管芯内的时间裕度变化，以及在管芯到管芯之间以及在变化的环境（例如电压和温度变化）下的变化。

3. 发明授权

US07760565B2 Wordline-to-bitline output timing ring oscillator circuit for evaluating storage array performance 失效
标题翻译：用于评估存储阵列性能的字线到位线输出定时环形振荡器电路
公开(公告)号：US07760565B2
公开(公告)日：2010-07-20
申请号：US11781994
申请日：2007-07-24
申请人： Jente B. Kuang , Jerry C. Kao , Hung C. Ngo , Kevin J. Nowka , Liang-Teck Pang , Jayakumaran Sivagnaname
发明人： Jente B. Kuang , Jerry C. Kao , Hung C. Ngo , Kevin J. Nowka , Liang-Teck Pang , Jayakumaran Sivagnaname
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C29/50 , G01R31/31937 , G11C29/50012 , G11C2029/1202 , G11C2029/1204
摘要： A wordline-to-bitline timing ring oscillator circuit for evaluating storage cell access time provides data on internal bitline access timing, and in particular the total wordline select-to-bitline read output timing. Columns of a storage array are connected in a ring, forming a ring oscillator. The bitline read circuit output of each column is connected to a wordline select input of a next column, with a net inversion around the ring, so that a ring oscillator is formed. The period of oscillation of the ring oscillator is determined by the total wordline select-to-bitline read circuit output timing for a first phase and the pre-charge interval time for the other phase, with the bitline read timing dominating. The circuit may be applied both to small-signal storage arrays, with the sense amplifier timing included within the ring oscillator period, or to large-signal storage arrays, with the read evaluate circuit timing included.
摘要翻译：用于评估存储单元访问时间的字线到位线定时环形振荡器电路提供关于内部位线访问定时的数据，特别是总字线选择到位线读出输出定时。存储阵列的列以环形连接，形成环形振荡器。每列的位线读取电路输出连接到下一列的字线选择输入，环绕环反转，从而形成环形振荡器。环形振荡器的振荡周期由第一相的总字线选择到位线读取电路输出定时和另一相的预充电间隔时间决定，而位线读取时序主导。该电路可以应用于小信号存储阵列，其中包括在环形振荡器周期内的读出放大器定时，或者包括读取评估电路时序的大信号存储阵列。

4. 发明申请

US20080122490A1 Circular Edge Detector 失效
标题翻译：圆形边缘检测器
公开(公告)号：US20080122490A1
公开(公告)日：2008-05-29
申请号：US11563888
申请日：2006-11-28
申请人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
发明人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
IPC分类号： H03K5/22
CPC分类号： H03K5/1534
摘要： A circular edge detector on an integrated circuit including a plurality of edge detector cells, each of the plurality of edge detector cells having an input select block operable to receive a data signal and a previous cell signal and to generate a present cell signal, and a state capture block operably connected to receive the present cell signal. The present cell signal of each of the plurality of edge detector cells is provided to a next of the plurality of edge detector cells as the previous cell signal for the next of the plurality of edge detector cells, and the present cell signal from a last edge detector cell is provided to a first edge detector cell as the previous cell signal for the first edge detector cell.
摘要翻译：在包括多个边缘检测器单元的集成电路上的圆形边缘检测器，所述多个边缘检测器单元中的每一个具有可操作以接收数据信号和先前信元信号并产生当前信元信号的输入选择块，以及状态捕捉块可操作地连接以接收当前信元信号。将多个边缘检测器单元中的每一个的当前单元信号提供给多个边缘检测器单元中的下一个，作为用于下一个边缘检测器单元的先前单元信号，并且来自最后边沿的当前单元信号检测器单元被提供给第一边缘检测器单元作为用于第一边缘检测器单元的先前单元信号。

5. 发明授权

US07759980B2 Circular edge detector for measuring timing of data signals 失效
标题翻译：用于测量数据信号定时的圆形边缘检测器
公开(公告)号：US07759980B2
公开(公告)日：2010-07-20
申请号：US11563888
申请日：2006-11-28
申请人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
发明人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
IPC分类号： H03K5/22
CPC分类号： H03K5/1534
摘要： A circular edge detector on an integrated circuit including a plurality of edge detector cells, each of the plurality of edge detector cells having an input select block operable to receive a data signal and a previous cell signal and to generate a present cell signal, and a state capture block operably connected to receive the present cell signal. The present cell signal of each of the plurality of edge detector cells is provided to a next of the plurality of edge detector cells as the previous cell signal for the next of the plurality of edge detector cells, and the present cell signal from a last edge detector cell is provided to a first edge detector cell as the previous cell signal for the first edge detector cell.
摘要翻译：在包括多个边缘检测器单元的集成电路上的圆形边缘检测器，所述多个边缘检测器单元中的每一个具有可操作以接收数据信号和先前信元信号并产生当前信元信号的输入选择块，以及状态捕捉块可操作地连接以接收当前信元信号。将多个边缘检测器单元中的每一个的当前单元信号提供给多个边缘检测器单元中的下一个，作为用于下一个边缘检测器单元的先前单元信号，并且来自最后边沿的当前单元信号检测器单元被提供给第一边缘检测器单元作为用于第一边缘检测器单元的先前单元信号。

6. 发明申请

US20100102854A1 CIRCULAR EDGE DETECTOR 失效
标题翻译：圆形边缘检测器
公开(公告)号：US20100102854A1
公开(公告)日：2010-04-29
申请号：US12621763
申请日：2009-11-19
申请人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
发明人： Jerry C. Kao , Jente B. Kuang , Alan J. Drake , Gary D. Carpenter , Fadi H. Gebara
IPC分类号： H03K5/22
CPC分类号： H03K5/1534
摘要： A circular edge detector on an integrated circuit including a plurality of edge detector cells, each of the plurality of edge detector cells having an input select block operable to receive a data signal and a previous cell signal and to generate a present cell signal, and a state capture block operably connected to receive the present cell signal. The present cell signal of each of the plurality of edge detector cells is provided to a next of the plurality of edge detector cells as the previous cell signal for the next of the plurality of edge detector cells, and the present cell signal from a last edge detector cell is provided to a first edge detector cell as the previous cell signal for the first edge detector cell.
摘要翻译：在包括多个边缘检测器单元的集成电路上的圆形边缘检测器，所述多个边缘检测器单元中的每一个具有可操作以接收数据信号和先前信元信号并产生当前信元信号的输入选择块，以及状态捕捉块可操作地连接以接收当前信元信号。将多个边缘检测器单元中的每一个的当前单元信号提供给多个边缘检测器单元中的下一个，作为用于下一个边缘检测器单元的先前单元信号，并且来自最后边沿的当前单元信号检测器单元被提供给第一边缘检测器单元作为用于第一边缘检测器单元的先前单元信号。

7. 发明申请

US20080130387A1 METHOD FOR EVALUATING MEMORY CELL PERFORMANCE 失效
标题翻译：评估记忆体性能的方法
公开(公告)号：US20080130387A1
公开(公告)日：2008-06-05
申请号：US11741187
申请日：2007-04-27
申请人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
发明人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
IPC分类号： G11C29/00
CPC分类号： G11C29/50 , G11C11/41 , G11C29/50012 , G11C2029/1204
摘要： A method for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A row in a memory array is enabled along with a set of drive devices that couple each bitline pair to the next in complement fashion to form a cascade of memory cells. The drive devices can be inverters and the inverters can be sized to simulate the bitline read pre-charge device and the write state-forcing device so that the cascade operates under the same loading/drive conditions as the operational with memory cell read/write circuits. The last and first bitline in the row can be cascaded, providing a ring oscillator or the delay of the cascade can be measured in response to a transition introduced at the head of the cascade. Weak read and/or weak write conditions can be measured by selective loading.
摘要翻译：用于评估存储器单元性能的方法在实际存储器电路环境中提供电路延迟和性能测量。存储器阵列中的行与一组驱动装置一起被启用，这些驱动装置将每个位线对以互补方式耦合到下一个位置以形成级联的存储器单元。驱动装置可以是逆变器，并且逆变器的大小可以模拟位线读取预充电装置和写入状态强制装置，使得级联在与存储单元读/写电路的操作相同的加载/驱动条件下操作。该行中的最后一个和第一个位线可以级联，提供环形振荡器，或者响应于在级联头部引入的转换，可以测量级联的延迟。弱写入条件和/或弱写入条件可以通过选择性加载来测量。

8. 发明授权

US07545690B2 Method for evaluating memory cell performance 失效
标题翻译：评估存储单元性能的方法
公开(公告)号：US07545690B2
公开(公告)日：2009-06-09
申请号：US11741187
申请日：2007-04-27
申请人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
发明人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
IPC分类号： G11C7/00 , G11C11/00
CPC分类号： G11C29/50 , G11C11/41 , G11C29/50012 , G11C2029/1204
摘要： A method for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A row in a memory array is enabled along with a set of drive devices that couple each bitline pair to the next in complement fashion to form a cascade of memory cells. The drive devices can be inverters and the inverters can be sized to simulate the bitline read pre-charge device and the write state-forcing device so that the cascade operates under the same loading/drive conditions as the operational with memory cell read/write circuits. The last and first bitline in the row can be cascaded, providing a ring oscillator or the delay of the cascade can be measured in response to a transition introduced at the head of the cascade. Weak read and/or weak write conditions can be measured by selective loading.
摘要翻译：用于评估存储器单元性能的方法在实际存储器电路环境中提供电路延迟和性能测量。存储器阵列中的行与一组驱动装置一起被启用，这些驱动装置将每个位线对以互补方式耦合到下一个位置以形成级联的存储器单元。驱动装置可以是逆变器，并且逆变器的大小可以模拟位线读取预充电装置和写入状态强制装置，使得级联在与存储单元读/写电路的操作相同的加载/驱动条件下操作。该行中的最后一个和第一个位线可以级联，提供环形振荡器，或者响应于在级联头部引入的转换，可以测量级联的延迟。弱写入条件和/或弱写入条件可以通过选择性加载来测量。

9. 发明授权

US07349271B2 Cascaded test circuit with inter-bitline drive devices for evaluating memory cell performance 有权
标题翻译：级联测试电路采用位线驱动器件，用于评估存储单元性能
公开(公告)号：US07349271B2
公开(公告)日：2008-03-25
申请号：US11250061
申请日：2005-10-13
申请人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
发明人： Jente B. Kuang , Jerry C. Kao , Hung Cai Ngo , Kevin J. Nowka
IPC分类号： G11C7/00 , G11C11/00
CPC分类号： G11C29/50 , G11C11/41 , G11C29/50012 , G11C2029/1204
摘要： A cascaded test circuit with inter-bitline drive devices for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A row in a memory array is enabled along with a set of drive devices that couple each bitline pair to the next in complement fashion to form a cascade of memory cells. The drive devices can be inverters and the inverters can be sized to simulate the bitline read pre-charge device and the write state-forcing device so that the cascade operates under the same loading/drive conditions as the operational with memory cell read/write circuits. The last and first bitline in the row can be cascaded, providing a ring oscillator or the delay of the cascade can be measured in response to a transition introduced at the head of the cascade. Weak read and/or weak write conditions can be measured by selective loading.
摘要翻译：具有用于评估存储器单元性能的位线驱动装置的级联测试电路在实际存储器电路环境中提供电路延迟和性能测量。存储器阵列中的行与一组驱动装置一起被启用，这些驱动装置将每个位线对以互补方式耦合到下一个位置以形成级联的存储器单元。驱动装置可以是逆变器，并且逆变器的大小可以模拟位线读取预充电装置和写入状态强制装置，使得级联在与存储单元读/写电路的操作相同的加载/驱动条件下操作。该行中的最后一个和第一个位线可以级联，提供环形振荡器，或者可以响应于级联头部引入的转换来测量级联的延迟。弱写入条件和/或弱写入条件可以通过选择性加载来测量。

10. 发明授权

US07268590B2 Method and apparatus for implementing subthreshold leakage reduction in LSDL 有权
标题翻译：在LSDL中实现亚阈值泄漏减少的方法和装置
公开(公告)号：US07268590B2
公开(公告)日：2007-09-11
申请号：US11304142
申请日：2005-12-15
申请人： Jerry C. Kao , Chung-Tao Li , Salvatore Nicholas Storino , Christophe Robert Tretz
发明人： Jerry C. Kao , Chung-Tao Li , Salvatore Nicholas Storino , Christophe Robert Tretz
IPC分类号： H03K19/096
CPC分类号： H03K19/0013
摘要： A method and apparatus are provided for implementing subthreshold leakage current reduction in limited switch dynamic logic (LSDL). A limited switch dynamic logic circuit includes a cross-coupled NAND and inverter logic. A dynamic node provides a first input to the NAND. A sleep signal provides a second input to the NAND. An output of the NAND provides an input to the inverter logic that inverts the NAND output and provides a complementary output. The NAND logic includes a series connected first sleep transistor receiving the sleep input. The first sleep transistor is turned OFF during the sleep mode. A second sleep transistor is connected between a voltage supply rail and the NAND output. The second sleep transistor is turned ON during the sleep mode to force high the NAND output and force low complementary output.
摘要翻译：提供了一种用于在限制开关动态逻辑（LSDL）中实现亚阈值泄漏电流降低的方法和装置。有限开关动态逻辑电路包括交叉耦合NAND和反相器逻辑。动态节点为NAND提供第一个输入。睡眠信号为NAND提供第二输入。 NAND的输出为反相器逻辑提供反相NAND输出并提供互补输出的输入。 NAND逻辑包括接收睡眠输入的串联连接的第一睡眠晶体管。在睡眠模式期间，第一睡眠晶体管被关闭。第二个睡眠晶体管连接在电源轨和NAND输出之间。在休眠模式期间，第二个睡眠晶体管导通，以强制NAND输出并强制低互补输出。

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