It provides a robot speed control method of a semiconductor device testing apparatus and a semiconductor device testing apparatus. This semiconductor device testing apparatus is configured to have four receiving devices so that the insert is loaded into the test tray, and improve the structure and configuration of the pusher lid assembly of the test head corresponding thereto thereby increasing the amount per unit time of the device for testing. In addition, as the configuration that occurs when testing dibayiseuyi to cool by the self-heating in the conductivity type and the improved temperature control. On the other hand, it solves the various robots to transport the device to which the excessive fatigue to the robot so as to automatically adjust the speed depending on the time of the testing device is applied. In addition, a stacker, a user may tray supply unit and a user tray, without the separation of the shipping position of the parts in accordance with the test progress supplying effectively seat tray than the limited stacker space to be used by changing their use and shipment . In addition, by configuring the chamber to be separated from the main body portion it has an advantage of performing more easily check the inside of the main body.