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    • 1. 发明申请
    • MEMORY HAVING NEGATIVE VOLTAGE WRITE ASSIST CIRCUIT AND METHOD THEREFOR
    • 具有负电压写入辅助电路的存储器及其方法
    • WO2010088042A2
    • 2010-08-05
    • PCT/US2010020852
    • 2010-01-13
    • FREESCALE SEMICONDUCTOR INCKENKARE PRASHANT UCOOPER TROY L
    • KENKARE PRASHANT UCOOPER TROY L
    • G11C11/416G11C5/14G11C7/00G11C11/413
    • G11C11/419
    • A method of writing data to a selected column of a memory (10) includes selecting a first column. The data writing is initiated by applying a logic high to a first bit line (BL0) of the first column and a first potential to a second bit line (BLB0) of the first column that is lower than the logic high. The first potential is removed and a second potential is applied to the second bit line. The second potential is less than the first potential. The first potential may be ground (VSS), and the second potential may be a negative voltage (VNEG). Reducing the write voltage for the bit line that is receiving a logic low improves its ability to be written. By first bringing the logic low to the first potential, which may be ground, and then further reducing the applied voltage, the requirements on the source of the second potential are reduced.
    • 将数据写入存储器(10)的选定列的方法包括选择第一列。 通过对第一列的第一位线(BL0)施加逻辑高电平并将第一电位施加到低于逻辑高电平的第一列的第二位线(BLB0)来启动数据写入。 第一电位被去除并且第二电位被施加到第二位线。 第二个潜力小于第一个潜力。 第一电位可以接地(VSS),第二电位可以是负电压(VNEG)。 降低接收逻辑低电平的位线的写入电压提高了写入能力。 首先将逻辑低电位置于可能被理解的第一电位,然后进一步降低施加电压,降低对第二电位源的要求。
    • 2. 发明申请
    • CIRCUIT AND METHOD FOR OPTIMIZING MEMORY SENSE AMPLIFIER TIMING
    • 用于优化存储器感测放大器时序的电路和方法
    • WO2010027550A1
    • 2010-03-11
    • PCT/US2009/048774
    • 2009-06-26
    • FREESCALE SEMICONDUCTOR INC.BURNETT, James, D.HOEFLER, Alexander, B.
    • BURNETT, James, D.HOEFLER, Alexander, B.
    • G11C7/06G11C7/08G11C11/413G11C11/416
    • G11C29/02G11C7/04G11C7/08G11C7/14G11C7/22G11C11/41G11C29/023G11C29/026G11C29/028
    • A memory (10) has an array of memory cells (12, 16, 18), a word line driver (36), a sense amplifier (46), and a sense enable circuit (50). Each memory cell has a coupling transistor (20, 22) for coupling a storage portion (26, 28, 30, 32) to a bit line (BL). The coupling transistors have an average threshold voltage and a maximum threshold voltage. The word line driver (36) is coupled to the array and is for enabling a selected row of memory cells in the array. The sense amplifier (46) detects a state of a memory cell (12) in the selected row (WLB) in response to a sense enable signal. The sense enable circuit provides the sense enable signal at a time based on the maximum threshold voltage. This timing enables the sense amplifier (46) sufficiently late for low temperature operation while providing for faster operation at high temperature than would normally be achieved using just the average threshold voltage in providing timing of the sense enable signal.
    • 存储器(10)具有存储器单元阵列(12,16,18),字线驱动器(36),读出放大器(46)和感测使能电路(50)。 每个存储单元具有用于将存储部分(26,28,30,32)耦合到位线(BL)的耦合晶体管(20,22)。 耦合晶体管具有平均阈值电压和最大阈值电压。 字线驱动器(36)耦合到阵列,并且用于使能阵列中的选定行的存储器单元。 感测放大器(46)响应于感测使能信号来检测所选行(WLB)中的存储器单元(12)的状态。 感测使能电路基于最大阈值电压一次提供感测使能信号。 该定时使得读出放大器(46)能够在低温操作期间足够晚,同时在提供在提供感测使能信号的定时时通常仅通过平均阈值电压实现的在高温下的操作更快。