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    • 5. 发明申请
    • METHOD, APPARATUS AND DEVICE FOR DIGITAL TESTING AND DIAGNOSTICS OF PC BOARDS
    • 电脑板数字测试与诊断方法,装置及装置
    • WO1999031588A1
    • 1999-06-24
    • PCT/IL1997000407
    • 1997-12-14
    • E & M ENGINEERING (Y.G.R.) LTD.SCHRIFT, Reuben
    • E & M ENGINEERING (Y.G.R.) LTD.
    • G06F11/273
    • G01R31/31915G01R31/2803G01R31/3004G01R31/3185
    • A method, apparatus and device for detecting faulty buses and for diagnosing faulty devices, open pins and high impedance shorts on a faulty bus within circuit sections of a printed circuit board by digital means. A series of digital pulses is applied to one of the circuit sections within the board under test in diverse enabled-disabled states of the bus devices connected to the said circuit section. The current pulse drawn by the circuit section in each of said enabled-disabled states of the said devices is picked up and transformed into a voltage pulse by a current sensor means connected to the said circuit section while differentiation of the voltage pulse is performed by the said current sensor means whereby measuring integrity is enhanced. The resulting voltage pulse is amplified, integrated, clamped and shaped and the voltage pulses received from different circuit sections via different sensor means are multiplexed by an addressable multiplexer card or by an inventive circuit design comprising a wired/OR gate. The value of each of the voltage pulses at the measured strobe is compared with a predetermined threshold value for the respective enabled-disabled state of the bus devices connected to the circuit section.
    • 一种用于通过数字方式在印刷电路板的电路部分内的故障总线上检测故障总线和诊断故障装置,开路引脚和高阻抗短路的方法,装置和装置。 在连接到所述电路部分的总线装置的不同的使能禁止状态下,将一系列数字脉冲施加到被测试板内的一个电路部分。 由所述电路部分在所述装置的所述使能禁能状态中绘制的电流脉冲被连接到所述电路部分的电流传感器装置拾取并转换成电压脉冲,同时电压脉冲的微分由 所述电流传感器装置增强了测量完整性。 所产生的电压脉冲被放大,积分,钳位和成形,并且通过不同的传感器装置从不同电路部分接收的电压脉冲被可寻址复用器卡或通过包括有线/或门的本发明电路设计复用。 将测量的选通脉冲中的每个电压脉冲的值与连接到电路部分的总线装置的各自使能禁止状态的预定阈值进行比较。
    • 6. 发明申请
    • CIRCUIT BOARD TEST
    • 电路板测试
    • WO1998000724A1
    • 1998-01-08
    • PCT/SE1997001148
    • 1997-06-26
    • TELEFONAKTIEBOLAGET LM ERICSSON
    • TELEFONAKTIEBOLAGET LM ERICSSONHEDLUND, MikaelHÖGBERG, Hans
    • G01R31/28
    • G01R31/2803
    • A method and arrangement for testing circuit boards (60) by creating one or several reference patterns to be compared with a test pattern. The arrangement is provided with at least one measuring probe (50), which cooperates with the circuit board (60), for measuring at least one reference signal or test signal on a reference circuit board and a test circuit board (60) respectively. Further, the arrangement is provided with an analyzer (10, 30), which cooperates with the measuring probe (50), to pass on the reference signal or the test signal, whereby the analyzer (10, 30) first analyzes the reference signal or the test signal at one frequency and then transforms the reference signal or the test signal to a reference pattern and test pattern respectively. Furthermore, the arrangement is provided with at least one memory (20) which cooperates with said analyzer (10, 30) to register said reference pattern or test pattern. The memory (20) is provided with two or several reference patterns when testing a circuit board (60).
    • 一种用于通过创建要与测试图案进行比较的一个或多个参考图案来测试电路板(60)的方法和装置。 该装置设置有与电路板(60)配合的至少一个测量探针(50),用于分别测量参考电路板和测试电路板(60)上的至少一个参考信号或测试信号。 此外,该装置设置有与测量探针(50)协作的分析器(10,30),以通过参考信号或测试信号,由此分析器(10,30)首先分析参考信号或 测试信号,然后将参考信号或测试信号分别转换为参考模式和测试模式。 此外,该装置设置有与所述分析器(10,30)配合以记录所述参考图案或测试图案的至少一个存储器(20)。 当测试电路板(60)时,存储器(20)具有两个或几个参考图案。